Publikační výsledky

• 2025

  KASPAR, P.; ŠIŠKA VIRÁGOVÁ, E.; DALLAEV, R.; PAPEŽ, N.; MACKŮ, R.; GRMELA, L.; ŠIK, O.; SEDLÁK, P.; SOBOLA, D. Structural analysis of imperfections in contacts of graphene chemiresistors. 2025, vol. 704, no. 163501, 6 p. ISSN: 1873-5584.
  Detail

• 2020

  KASPAR, P.; SOBOLA, D.; ČÁSTKOVÁ, K.; KNÁPEK, A.; BURDA, D.; ORUDZHEV, F.; DALLAEV, R.; TOFEL, P.; TRČKA, T.; GRMELA, L.; HADAŠ, Z. Characterization of Polyvinylidene Fluoride (PVDF) Electrospun Fibers Doped by Carbon Flakes. Polymers, 2020, vol. 12, no. 12, p. 2766-1 (2766-15 p.)ISSN: 2073-4360.
  Detail

  MOUSA, M.; KNÁPEK, A.;GRMELA, L. Similarities and Differences between Two Researches in Field Electron Emission: A Way to Develop a More Powerful Electron Source. Jordan Journal of Physics, 2020, vol. 13, no. 2, p. 171-179. ISSN: 1994-7607.
  Detail

  MOUSA, M.; KNÁPEK, A.; GRMELA, L. Similarities and Differences between Two Researches in Field Emission of Electrons: A Way to Develop More Powerful Electron Source. 2020, vol. 13, no. 2, p. 171-179. ISSN: 1994-7615.
  Detail

  PAPEŽ, N.; GAJDOŠ, A.; DALLAEV, R.; SOBOLA, D.; SEDLÁK, P.; MOTÚZ, R.; NEBOJSA, A.; GRMELA, L. Performance analysis of GaAs based solar cells under gamma irradiation. APPLIED SURFACE SCIENCE, 2020, no. 510, p. 265-272. ISSN: 0169-4332.
  Detail

  PAPEŽ, N.; GAJDOŠ, A.; SOBOLA, D.; DALLAEV, R.; ŠKARVADA, P.; MACKŮ, R.; GRMELA, L. Effect of gamma radiation on properties and performance of GaAs based solar cells. APPLIED SURFACE SCIENCE, 2020, vol. 527, no. 146766, p. 135-146. ISSN: 0169-4332.
  Detail

• 2019

  DALLAEV, R.; STACH, S.; TALU, S.; SOBOLA, D.; MÉNDEZ-ALBORES, A.; TREJO, G.; GRMELA, L. Stereometric Analysis of Effects of Heat Stressing on Micromorphology of Si Single Crystals. Silicon, 2019, vol. 11, no. 1, p. 1-15. ISSN: 1876-990X.
  Detail

  KASPAR, P.; SOBOLA, D.; SEDLÁK, P.; HOLCMAN, V.; GRMELA, L. Analysis of Color Shift on Butterfly Wings by Fourier Transform of Images from Atomic Force Microscopy. 2019, no. 1, p. 1-7. ISSN: 1097-0029.
  Detail

  SOBOLA, D.; KASPAR, P.; NEBOJSA, A.; HEMZAL, D.; GRMELA, L.; SMITH, S. Characterization of the native oxide on CdTe surfaces. MATERIALS SCIENCE-POLAND, 2019, vol. 37, no. 2, p. 206-211. ISSN: 2083-134X.
  Detail

  KASPAR, P.; ŠKARVADA, P.; HOLCMAN, V.; GRMELA, L. Characterization of argon etched Ta2O5 thin films. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2019, vol. 125, no. 820, p. 1-7. ISSN: 0947-8396.
  Detail

  KASPAR, P.; SOBOLA, D.; DALLAEV, R.; RAMAZANOV, S.; NEBOJSA, A.; REZAEE, S.; GRMELA, L. Characterization of Fe2O3 thin film on highly oriented pyrolytic graphite by AFM, Ellipsometry and XPS. APPLIED SURFACE SCIENCE, 2019, vol. 493, no. 1, p. 673-678. ISSN: 0169-4332.
  Detail

• 2018

  PAPEŽ, N.; SOBOLA, D.; ŠKVARENINA, Ľ.; ŠKARVADA, P.; HEMZAL, D.; TOFEL, P.; GRMELA, L. Degradation analysis of GaAs solar cells at thermal stress. APPLIED SURFACE SCIENCE, 2018, no. 461, p. 212-220. ISSN: 0169-4332.
  Detail

  ŠIK, O.; BÁBOR, P.; POLČÁK, J.; BELAS, E.; MORAVEC, P.; GRMELA, L.; STANĚK, J. Low Energy Ion Scattering as a depth profiling tool for thin layers - Case of bromine Methanol etched CdTe. Vacuum, 2018, no. 152, p. 138-144. ISSN: 0042-207X.
  Detail

  ŠIK, O.; ŠKVARENINA, Ľ.; CAHA, O.; MORAVEC, P.; ŠKARVADA, P.; BELAS, E.; GRMELA, L. Determining the sub-surface damage of CdTe single crystals after lapping. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2018, vol. 29, no. 11, p. 9652-9662. ISSN: 0957-4522.
  Detail

• 2017

  SOBOLA, D.; TALU, S.; SOLAYMANI, S.; GRMELA, L. INFLUENCE OF SCANNING RATE ON QUALITY OF AFM IMAGE: STUDY OF SURFACE STATISTICAL METRICS. MICROSCOPY RESEARCH AND TECHNIQUE, 2017, vol. 80, no. 7, p. 1-11. ISSN: 1059-910X.
  Detail

  SOBOLA, D.; TALU, S.; SADOVSKÝ, P.; PAPEŽ, N.; GRMELA, L. Application of AFM Measurement and Fractal Analysis to Study the Surface of Natural Optical Structures. 2017, vol. 3, no. 15, p. 569-576. ISSN: 1804-3119.
  Detail

  PAPEŽ, N.; SOBOLA, D.; ŠKARVADA, P.; ŠKVARENINA, Ľ.; HEMZAL, D.; TOFEL, P.; GRMELA, L. Degradation analysis of GaAs solar cells at thermal stress. Progress in Applied Surface, Interface and Thin Film Science - Solar Renewable Energy News 2017. Bratislava: Comenius University, 2017. p. 105-105. ISBN: 978-80-223-4411-1.
  Detail

  KUPAROWITZ, M.; SEDLÁKOVÁ, V.; GRMELA, L. LEAKAGE CURRENT DEGRADATION DUE TO ION DRIFT AND DIFFUSION IN TANTALUM AND NIOBIUM OXIDE CAPACITORS. Metrology and Measurement Systems, 2017, vol. 24, no. 2, p. 255-264. ISSN: 0860-8229.
  Detail

• 2016

  KASPAR, P.; PROKOPYEVA, E.; TOMÁNEK, P.; GRMELA, L. Changes in Optical Properties of Biological Tissue: Experiment and Monte Carlo Simulation. In Proceedings of SPIE 20th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics. Proceedings of SPIE. Bellingham, USA: SPIE, 2016. no. 10142, p. 101420R1 (101420R6 p.)ISBN: 9781510607330. ISSN: 0277-786X.
  Detail

  JURČÍK, M.; GRMELA, L. Automated Electrochemical Etching Prototype for Cold Field Emission Cathodes. In Proceedings of the 22nd Conference STUDENT EEICT 2016. Brno: VUTIUM, 2016. p. 300-305. ISBN: 978-80-214-5350-0.
  Detail

  ŠIK, O.; BÁBOR, P.; ŠKARVADA, P.; POTOČEK, M.; TRČKA, T.; GRMELA, L.; BELAS, E. Investigation of the effect of argon ion beam on CdZnTe single crystals surface structural properties. SURFACE & COATINGS TECHNOLOGY, 2016, vol. 306, no. A, p. 75-81. ISSN: 0257-8972.
  Detail

  KASPAR, P.; PROKOPYEVA, E.; TOMÁNEK, P.; GRMELA, L. Angular absorption of light used for evaluation of structural damage to porcine meat caused by aging, drying and freezing. MEAT SCIENCE, 2016, no. 126, p. 22-28. ISSN: 0309-1740.
  Detail

  ŠKARVADA, P.; ŠKVARENINA, Ľ.; TOMÁNEK, P.; SOBOLA, D.; MACKŮ, R.; BRÜSTLOVÁ, J.; GRMELA, L.; SMITH, S. Multiscale experimental characterization of solar cell defects. In 20th Slovak - Czech - Polish Optical Conference On Wave and Quantum Aspects of Contemporary Optics. Proceedings of SPIE. SPIE Proceedings. Bellingham, USA: SPIE, 2016. no. 10142, p. 101420U1 (101420U7 p.)ISBN: 9781510607330. ISSN: 0277-786X.
  Detail

• 2015

  TOMÁNEK, P.; ŠKARVADA, P.; MACKŮ, R.; SOBOLA, D.; BRÜSTLOVÁ, J.; GRMELA, L. Microscale localization and detection of defects in crystalline silicon solar cells. DGaO-PROCEEDINGS, 2015, vol. 2015, no. 2015, p. 1-2. ISSN: 1614-8436.
  Detail

  DALLAEVA, D.; TOMÁNEK, P.; ŠKARVADA, P.; GRMELA, L. Realization of microscale detection and localization of low light emitting spots in monocrystalline silicon solar cells. Proceedings of SPIE, 2015, vol. 9450, no. 9450, p. 94501O-1 (94501O-7 p.)ISSN: 0277-786X.
  Detail

  DALLAEVA, D.; RAMAZANOV, S.; PROKOPYEVA, E.; TOMÁNEK, P.; GRMELA, L. Local topography of optoelectronic substrates prepared by dry plasma etching process. Proceedings of SPIE, 2015, vol. 9442, no. 9442, p. 9442081-9442086. ISSN: 0277-786X.
  Detail

  DALLAEVA, D.; TOMANEK, P.; PROKOPYEVA, E.; KASPAR, P.; GRMELA, L.; SKARVADA, P. AFM imaging of natural optical structures. Proceedings of SPIE, 2015, vol. 9442, no. 9442, p. 944209-1 (944209-8 p.)ISSN: 0277-786X.
  Detail

  ŠKARVADA, P.; MACKŮ, R.; DALLAEVA, D.; SEDLÁK, P.; GRMELA, L.; TOMÁNEK, P. SEM and AFM imaging of solar cells defects. Proceedings of SPIE, 2015, vol. 9450, no. 9450, p. 1-6. ISSN: 0277-786X.
  Detail

  JURČÍK, M.; GRMELA, L. TUNGSTEN WIRE SURFACE CLEANING USING ELECTROPOLISHING PROCESS. In Proceedings of the 21st Competition Conference STUDENT EEICT 2015. Brno: VUTIUM, 2015. p. 516-520. ISBN: 978-80-214-5148-3.
  Detail

  PROKOPYEVA, E.; KASPAR, P.; TOMÁNEK, P.; GRMELA, L. Optical properties of metal nanoparticles used in biosensors. Proceedings of SPIE, 2015, vol. 9442, no. 944217, p. 944217-1 (944217-7 p.)ISSN: 0277-786X.
  Detail

  KUBERSKÝ, P.; SEDLÁK, P.; HAMÁČEK, A.; NEŠPŮREK, S.; KUPAROWITZ, T.; ŠIKULA, J.; MAJZNER, J.; SEDLÁKOVÁ, V.; GRMELA, L.; SYROVÝ, T. Quantitative fluctuation-enhanced sensing in amperometric NO2 sensors. CHEMICAL PHYSICS, 2015, vol. 456, no. 1, p. 111-117. ISSN: 0301-0104.
  Detail

  ŠKARVADA, P.; ŠKVARENINA, Ľ.; SOBOLA, D.; MACKŮ, R.; TOMÁNEK, P.; GRMELA, L. Multiscale characterization of solar cells. In Progress in Applied Surface, Interface and Thin-film Science 2015. Bratislava, Slovensko: Comenius University, 2015. p. 148-151. ISBN: 978-80-223-3975-9.
  Detail

  KASPAR, P.; PROKOPYEVA, E.; TOMÁNEK, P.; GRMELA, L. Optical scattering in muscle tissue and its utilisation. Proceedings of SPIE, 2015, vol. 9442, no. 9442, p. 94420I1 (94420I7 p.)ISSN: 0277-786X.
  Detail

  STACH, S.; DALLAEVA, D.; TALU, S.; KASPAR, P.; TOMÁNEK, P.; GIOVANZANA, S.; GRMELA, L. Morphological features in aluminum nitride epilayers prepared by magnetron sputtering. MATERIALS SCIENCE-POLAND, 2015, vol. 33, no. 1, p. 175-184. ISSN: 0137-1339.
  Detail

• 2014

  DALLAEVA, D.; PROKOPYEVA, E.; TOMÁNEK, P.; GRMELA, L.; RAMAZANOV, S. Interferometry and Atomic force microscopy of substrates for optoelectronics proceeded by dry plasma etching. In 2014 International Symposium on Optomechatronic Technologies (ISOT 2014). Proceedings. The Computer Security Foundations Workshop III. Los Alamitos, CA, USA: IEEE Computer Society Press, 2014. no. 1, p. 283-287. ISBN: 978-1-4799-6666-0. ISSN: 1063-6900.
  Detail

  ŠKARVADA, P.; TOMÁNEK, P.; KOKTAVÝ, P.; MACKŮ, R.; ŠICNER, J.; VONDRA, M.; DALLAEVA, D.; SMITH, S.; GRMELA, L. A variety of microstructural defects in crystalline silicon solar cells. APPLIED SURFACE SCIENCE, 2014, vol. 312, no. 312, p. 50-56. ISSN: 0169-4332.
  Detail

  DALLAEVA, D.; TALU, S.; STACH, S.; ŠKARVADA, P.; TOMÁNEK, P.; GRMELA, L. AFM imaging and fractal analysis of surface roughness of AlN epilayers on sapphire substrates. APPLIED SURFACE SCIENCE, 2014, vol. 312, no. 312, p. 81-86. ISSN: 0169-4332.
  Detail

• 2013

  SITA, Z.; SEDLÁKOVÁ, V.; MAJZNER, J.; SEDLÁK, P.; ŠIKULA, J.; GRMELA, L. Analysis of noise and non-linearity of I-V characteristics of positive temperature coefficient chip thermistors. Metrology and Measurement Systems, 2013, vol. XX, no. 4, p. 635-644. ISSN: 0860-8229.
  Detail

  ANDREEV, A.; ŠIK, O.; GRMELA, L.; ŠIKULA, J. Ageing of Cadmium Telluride Radiation Detectors and its Diagnostics with Low Frequency Noise. Metrology and Measurement Systems, 2013, vol. 2013, no. 3, p. 385-394. ISSN: 0860-8229.
  Detail

  DALLAEVA, D.; TALU, S.; STACH, S.; ŠKARVADA, P.; TOMÁNEK, P.; TALU, M.; GRMELA, L. AFM imaging and fractaí analysis of surface roughness of AlN epilayers deposited on saphire substrate. In Proceedings of 8th Solid State Surfaces and Interfaces. Bratislava: Comenius University, 2013. p. 33-34. ISBN: 978-80-223-3501-0.
  Detail

  ŠIK, O.; TRČKA, T.; GRMELA, L.; VONDRA, M. Effect of High Operating Temperature on Electrcal Quantities of CdTe Radiation Detectors. International Journal of Advancements in Electronics and Electrical Engineering, 2013, roč. 3, č. 1, s. 60-63. ISSN: 2319-7498.
  Detail

  ŠKARVADA, P.; TOMÁNEK, P.; GRMELA, L.; DALLAEVA, D. Lokální optoelektronická diagnostika mikroskopických vad v solárním křemíkovém článku. Jemná mechanika a optika, 2013, roč. 2013, č. 3, s. 81-84. ISSN: 0447-6441.
  Detail

  ŠIK, O.; GRMELA, L.; ELHADIDY, H.; DĚDIČ, V.; ŠIKULA, J.; GRMELA, P.; FRANC, J.; ŠKARVADA, P.; HOLCMAN, V. Study of Electric Field Distribution and Low Frequency Noise of CdZnTe Radiation Detectors. Journal of Instrumentation, 2013, vol. 6, no. 23, p. 1-6. ISSN: 1748-0221.
  Detail

  ŠIK, O.; GRMELA, L. Photoconductivity of CdTe Semiconductor Radiation Detectors. International Journal of Computer Science and Electronics Engineering, 2013, vol. 1, no. 5, p. 31-34. ISSN: 2320-401X.
  Detail

  ŠIK, O.; TRČKA, T.; GRMELA, L.; VONDRA, M. "Effect of High Operating Temperature on Electrical Quantities of CdTe Radiation Detectors. In Proc. of the Second Intl. Conf. on Advances in Electronic Devices and Circuits. 1. Kuala Lumpur, Malaisie: Institute of Research Engineers and Doctors, 2013. s. 60-63. ISBN: 978-981-07-6261-2.
  Detail

  KNÁPEK, A.; GRMELA, L. Technologie výroby studenoemisních katod na bázi wolframu s tenkou povrchovou vrstvou epoxidu. 2013, roč. 2013, č. 107, s. 545-549. ISSN: 1213-7103.
  Detail

  ŠKARVADA, P.; KOKTAVÝ, P.; SMITH, S.; MACKŮ, R.; ŠICNER, J.; VONDRA, M.; DALLAEVA, D.; TOMÁNEK, P.; GRMELA, L. Microstructure defects in silicon solar cells. In Proceedings of 8th Solid state surfaces and intefaces. 1. Bratislava: Comenius University Bratislava, 2013. p. 168-169. ISBN: 978-80-223-3501-0.
  Detail

  GRMELA, L.; ŠIK, O. Metal-Semiconductor Junction Role in CdTe Detectors. Acta Electrotechnica et Informatica, 2013, vol. 13, no. 1, p. 22-25. ISSN: 1335-8243.
  Detail

  ŠIK, O.; GRMELA, L.; ŠIKULA, J. Contacts charge transport and additional noise properties of semiconductor CdTe sensors. In Proceedings of the 2012 IEEE International Conference on Electron Devices and Solid State Circuit (EDSSC). Bangkok, Thailand: IEEE Thailand Section, 2013. s. 1-4. ISBN: 978-1-4673-5694-7.
  Detail

  ŠIK, O.; ŠKARVADA, P.; GRMELA, L.; ELHADIDY, H.; VONDRA, M.; ŠIKULA, J.; FRANC, J. Contact Quality Analysis and Noise Sources Determination of CdZnTe-Based High Energy Photon Detectors. Physica Scripta, 2013, roč. 85, č. 03, s. 1-5. ISSN: 0031-8949.
  Detail

  SERGEEV, E.; KNÁPEK, A.; GRMELA, L.; ŠIKULA, J. Noise Diagnostic Method of Experimental Cold Field-Emission Cathodes. 2013 22nd International Conference on Noise and Fluctuations (ICNF), IEEE Catalog Number CFP1392N-USB. Montpellier: 2013. p. Th-P-9 (Th-P-9 p.)ISBN: 978-1-4799-0670-3.
  Detail

  PROKOPYEVA, E.; TOMÁNEK, P.; KOCOVÁ, L.; PALAI-DANY, T.; BALÍK, Z.; ŠKARVADA, P.; GRMELA, L. Comparison of optical and electrical investigations of meat ageing. Proceedings of SPIE, 2013, vol. 8774, no. 8774, p. 84471L1 (84471L8 p.)ISSN: 0277-786X.
  Detail

  TOMÁNEK, P.; ŠKARVADA, P.; DALLAEVA, D.; GRMELA, L.; MACKŮ, R.; SMITH, S. Cold field emission electrode as a local probe of proximal microscopes-Investigation of defects in monocrystalline silicon solar cells. World Journal of Engineering, 2013, vol. 10, no. 2, p. 119-124. ISSN: 1708-5284.
  Detail

  ŠKARVADA, P.; MACKŮ, R.; DALLAEVA, D.; PROKOPYEVA, E.; TOMÁNEK, P.; GRMELA, L.; SMITH, S. Optical and electrical detection and localization of solar cell defects on microscale. Proceedings of SPIE, 2013, vol. 8825, no. 8825, p. 8825071-88255077. ISSN: 0277-786X.
  Detail

  ŠKARVADA, P.; TOMÁNEK, P.; GRMELA, L.; TOFEL, P.; ŠEVČÍK, M.; MACKŮ, R. Fluctuations of ultrasonic transducer vibration measurement. In 2013 22nd International Conference on Noise and Fluctuations (ICNF), IEEE Catalog Number CFP1392N-USB. Montpellier: 2013. p. Th-P-48-1 (Th-P-48-4 p.)ISBN: 978-1-4799-0670-3.
  Detail

  PAVELKA, J.; ŠIKULA, J.; TACANO, M.; CHVÁTAL, M.; DALLAEVA, D.; GRMELA, L. Noise sources in interface between mono-crystalline and amorphous semiconductors. In Proceedings of 8th solid state surfaces and interfaces. Bratislava: Comenius University, 2013. p. 128-129. ISBN: 978-80-223-3501-0.
  Detail

  KNÁPEK, A.; SERGEEV, E.; GRMELA, L. Electrical Characterization of Cold Field-Emission Cathodes based on Fowler-Nordheim Analysis. In Electronic Devices and Systems - IMAPS CS International Conference 2013. Brno: Vysoké učení technické v Brně, 2013. p. 104-108. ISBN: 978-80-214-4754-7.
  Detail

• 2012

  GRMELA, L.; ŠKARVADA, P.; TOMÁNEK, P.; MACKŮ, R.; SMITH, S. Local investigation of thermal dependence of light emission from reverse-biased monocrystalline silicon solar cells. SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2012, vol. 96, no. 1, p. 108-111. ISSN: 0927-0248.
  Detail

  SERGEEV, E.; KNÁPEK, A.; MIKMEKOVÁ, Š.; GRMELA, L.; KLAMPÁR, M. Material Characterization of the Epoxy-Coated Cold-Field-Emission Cathodes. In Proceedings of the Scientific Conference Physics of Materials 2012. první. Košice, Slovensko: 2012. p. 109-112. ISBN: 978-80-553-1175-3.
  Detail

  GRMELA, L. Nedestruktivní spektroskopické metody testování optoelektronických součástek a materiálů. Vědecké spisy Vysokého učení technického v Brně Edice Habilitační a inaugurační spisy, 2012, roč. 2012, č. 401, s. 1-35. ISSN: 1213-418X.
  Detail

  ANDREEV, A.; ŠIK, O.; GRMELA, L. Optimization of signal-to-noise ratio in CdTe radiation detectors. In ICNF2011: 2011 21st International Conference on Noise and Fluctuations. 1. Rio de Janeiro, Brazil: IEEE, 2012. p. 1-3. ISBN: 978-1-4577-0191-7.
  Detail

  GRMELA, L.; ŠIK, O.; ŠIKULA, J. Noise Contact Study of CdTe Radiation Detectors. In Proceedings of the Scientific Conference Physics of Materials 2012. první. Košice, Slovensko: 2012. p. 99-104. ISBN: 978-80-553-1175-3.
  Detail

  ŠIK, O.; GRMELA, L.; ANDREEV, A.; ŠIKULA, J.; BELAS, E. Influence of CdTe material ageing on relaxation time and noise. Book of abstracts. Taipei: Academia Sinica, 2012. p. 1 (1 s.).
  Detail

  ŠIK, O.; GRMELA, L.; ELHADIDY, H.; ŠIKULA, J.; FRANC, J. CONTACT QUALITY ANALYSIS AND NOISE SOURCES DETERMINATION OF CDTE BASED DETECTORS DETERMINATION OF CDTE BASED DETECTORS. The 3rd International Conference on the Physics of Optical Materials and Devices BOOK OF ABSTRACTS. 1. Belgrade: Agencija FORMAT, 2012. p. 120-120. ISBN: 978-86-7306-116-0.
  Detail

  KNÁPEK, A.; GRMELA, L.; ŠIKULA, J.; ŠIK, O. Cold field-emission cathode noise analysis. Metrology and Measurement Systems, 2012, vol. 2012, no. 2, p. 417-422. ISSN: 0860-8229.
  Detail

  GRMELA, L.; HRUŠKA, P. Simulation of electrostatic field near the surface of very thin tungsten microcathode. In Mathematical Methods in Electromagnetic Theory. Kharkiv, Ukraine: 2012. p. 353-356. ISBN: 978-1-4673-4479-1.
  Detail

  SERGEEV, E.; KNÁPEK, A.; GRMELA, L. Ultrasharp Field-Emission Cathodes with Epoxy Coating. In New Trends in Physics, NTF 2012, Proceedings of the conference. první. Brno: 2012. p. 161-165. ISBN: 978-80-214-4594-9.
  Detail

  TOMÁNEK, P.; ŠKARVADA, P.; GRMELA, L.; DALLAEVA, D. Optoelectronic diagnostics of defects in solar cell structures. In Optica and Measurement 2012. Prague: Institute of plasma Physics, 2012. p. 137-140. ISBN: 978-80-87026-02-1.
  Detail

  GRMELA, L.; HRUŠKA, P. Simulation of quantum dot in electrostatic fields. In Mathematical Methods in Electromagnetic Theory. Kharkiv, Ukraine: 2012. p. 193-196. ISBN: 978-1-4673-4479-1.
  Detail

  TOMÁNEK, P.; ŠKARVADA, P.; GRMELA, L.; MACKŮ, R.; SMITH, S. Local investigation of defects in monocrystalline silicon solar cells. Conference Record of the IEEE Photovoltaic Specialists Conference, 2012, vol. 2012, no. 1, p. 1686-1690. ISSN: 0160-8371.
  Detail

• 2011

  ŠIK, O.; GRMELA, L. Charge transport properties and low frequency noise of Cadmium-Telluride based radiation detectors. In Proceedings of 5th Annual International Travelling Conference for Young Researchers and PhD Students. Prešov: Harmony Apeiron, 2011. p. 179-184. ISBN: 978-80-89347-05-6.
  Detail

  ŠKARVADA, P.; TOMÁNEK, P.; GRMELA, L. Local measurement of solar cell emission characteristics. Proceedings of SPIE, 2011, vol. 8036, no. 8306, p. 1H1 (1H6 p.)ISSN: 0277-786X.
  Detail

  HRUŠKA, P.; GRMELA, L. Simulování chování kvantové tečky v elektrostatickém poli. Jemná mechanika a optika, 2011, roč. 56, č. 7-8, s. 216-219. ISSN: 0447-6441.
  Detail

  ANDREEV, A.; ŠIK, O.; GRMELA, L. Transport characteristics of CdTe radiation detectors. In 34nd International Spring Seminar on Electronics Technology. 1. Košice, Slovakia: Prof. Alena Pietriková, 2011. p. 1-3. ISBN: 978-80-553-0646-9.
  Detail

  KNÁPEK, A.; GRMELA, L.; ŠIKULA, J. Noise Characterization of Cold Emission Cathodes with Epoxy Coating. In Proceedings of 5th Annual Internation Travelling Conference for Young Researchers and PhD Students. Prešov: Harmony Apeiron, 2011. p. 521-526. ISBN: 978-80-89347-05-6.
  Detail

  ABUBAKER, H.; TOMÁNEK, P.; GRMELA, L. Measurement of dynamic variations of polarized light in processed meat due to aging. Proceedings of SPIE, 2011, vol. 8073, no. 8073, p. 807331-807336. ISSN: 0277-786X.
  Detail

  ŠKARVADA, P.; GRMELA, L.; TOMÁNEK, P. Advanced Local Quality Assessment of Monocrystalline Silicon Solar Cell Efficiency. Key Engineering Materials (print), 2011, vol. 465, no. 1, p. 239-242. ISSN: 1013-9826.
  Detail

  TOFEL, P.; ŠIKULA, J.; GRMELA, L.; SEDLÁK, P.; MAJZNER, J. Diagnostic of billet surface. In 9 th International Conference NDT 2011. Brno: 2011. p. 1-6. ISBN: 978-80-7204-774-1.
  Detail

  KNÁPEK, A.; GRMELA, L.; ŠIKULA, J.; HOLCMAN, V.; DELONG, A. Noise of Cold Emission Cathode. In ICNF2011: 2011 21st International Conference on Noise and Fluctuations. 1. Toronto, Kanada: IEEE, 2011. p. 84-87. ISBN: 978-1-4577-0191-7.
  Detail

  KNÁPEK, A.; GRMELA, L. Stability Analysis of Cold-Emission Cathodes with Epoxy Coating. ElectroScope - http://www.electroscope.zcu.cz, 2011, vol. 2011, no. 2, p. 1-5. ISSN: 1802-4564.
  Detail

  ŠKARVADA, P.; TOMÁNEK, P.; GRMELA, L. Influence of laser cutting on p-n junction behavior of solar cell. VDI Berichte, 2011, vol. 2156, no. 2156, p. 291-296. ISSN: 0083-5560.
  Detail

  GRMELA, L.; ŠKARVADA, P.; MACKŮ, R.; TOMÁNEK, P. Near-field Detection and Localization of Defects in Monocrystalline Silicon Solar Cell. Inventi Rapid: Energy & Power, 2011, vol. 2011, no. 2, p. 1-4. ISSN: 2229-7774.
  Detail

  ELHADIDY, H.; ŠIKULA, J.; ŠIK, O.; GRMELA, L.; ZAJAČEK, J. Low Frequency Noise and Ions Diffusion in the CdTe Bulk Single Crystals. In 21st International Conference on Noise and Fluctuations. Kanada: IEEE, 2011. p. 1-4. ISBN: 978-1-4577-0191-7.
  Detail

• 2010

  HRUŠKA, P.; GRMELA, L. Silicon-silicon dioxide nanostructure in electrostatic field. Acta Electrotechnica et Informatica, 2010, vol. 10, no. 3, p. 22-25. ISSN: 1335-8243.
  Detail

  ANDREEV, A.; ŠIK, O.; GRMELA, L. Noise spectroscopy of high resistance CdTe detectors. In 33rd International Spring Seminar on Electronics Technology. Warsaw: Piotr Firek, 2010. p. 63-64. ISBN: 978-83-7207-874-2.
  Detail

  ŠKARVADA, P.; TOMÁNEK, P.; GRMELA, L.; SMITH, S. Microscale localization of low light emitting spots in reversed-biased silicon solar cells. SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2010, vol. 94, no. 12, p. 2358-2361. ISSN: 0927-0248.
  Detail

  ANDREEV, A.; GRMELA, L.; MORAVEC, P.; BOSMAN, G.; ŠIKULA, J. Investigation of excess 1/f noise in CdTe single crystals. SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2010, vol. 2010(25), no. 5, p. 1-7. ISSN: 0268-1242.
  Detail

  TOMÁNEK, P.; MIKLÁŠ, J.; ABUBAKER, H.; GRMELA, L. Optical sensing of polarization states changes in meat due to the ageing. AIP conference proceedings, 2010, vol. 1288, no. 1, p. 127-131. ISSN: 0094-243X.
  Detail

  HOLCMAN, V.; GRMELA, L.; LIEDERMANN, K. New Mixing Rules for Composite Polymer Materials. IEEJ Transactions on Electrical and Electronic Engineering, 2010, vol. 5, no. 4, p. 381-385. ISSN: 1931-4973.
  Detail

  TOMÁNEK, P.; ŠKARVADA, P.; GRMELA, L. Local optical and electric characteristics of solar cells. In Ninth International Conference on Correlation Optics. Proceedings of SPIE. Bellingham, USA: SPIE, 2010. no. 7388, p. 73880L1 (73880L9 p.)ISBN: 978-0-8194-7671-5. ISSN: 0277-786X.
  Detail

  KNÁPEK, A.; KRČÁL, O.; GRMELA, L. Schottky Nano-Tip Cathodes Fabrication and Diagnostics. ElectroScope - http://www.electroscope.zcu.cz, 2010, roč. 2010, č. 1, s. 1-4. ISSN: 1802-4564.
  Detail

  KNÁPEK, A.; GRMELA, L. Fabrication and noise diagnostics of the Schottky and cold emission cathodes covered by thick tungsten oxide layer. In IMAPS CS International Conference 2010 - Proceedings. Brno: Brno University of Technology, 2010. s. 156-160. ISBN: 978-80-214-4138-5.
  Detail

  TOMÁNEK, P.; ŠKARVADA, P.; MACKŮ, R.; GRMELA, L. Detection and localization of defects in monocrystalline silicon solar cell. Advances in Optical Technologies, 2010, vol. 2010, no. 805325, p. 8053251-8053255. ISSN: 1687-6393.
  Detail

  ŠKARVADA, P.; TOMÁNEK, P.; GRMELA, L. Advanced Local Quality Assessment of Monocrystalline Silicon Solar Cell Efficiency. Materials structure and micromechanics of fracture. Brno: Vutium, 2010. p. 160-160. ISBN: 978-80-214-4112-5.
  Detail

• 2009

  HRUŠKA, P.; GRMELA, L. Behaviour of silicon nanostructure in electric field. In Proceedings of Physics of Materials 09, V. Lisý, D. Olčák (Eds). Košice, SK: Faculty of Electrical Engineering and Informatics, Technical University of Košice, 2009. p. 34-37. ISBN: 978-80-8086-122-3.
  Detail

  GRMELA, L.; TOMÁNEK, P. Ústav fyziky Fakulty elektrotechniky a komunikačních technologií Vysokého učení technického v Brně. Jemná mechanika a optika, 2009, roč. 54, č. 10, s. 271-272. ISSN: 0447-6441.
  Detail

  ANDREEV, A.; GRMELA, L.; ŠIKULA, J.; CHVÁTAL, M.; RAŠKA, M. Bulk Resistance Decay in CdTe. In IEEE EUROCON 2009. St. Petersburg, Russia: Institute of Electrical and Electronics Engineers, St. Petersburg, 2009. p. 1181-1185. ISBN: 978-1-4244-3861-7.
  Detail

  KNÁPEK, A.; GRMELA, L. Fabrication and Noise Diagnostics of Schottky Nanotip Cathodes. Book of Abstracts, IMA 2009 Conference, Athens, October 2009. National and Kapodistrian University of Athens, 2009. p. 53-53.
  Detail

  HRUŠKA, P.; GRMELA, L. EMISSION OF QD IN ELECTROSTATIC FIELDS. In International Conference Technical Computing Prague 2009T - The MathWorks, Inc. & HUMUSOFT s.r.o. & Ústav počítačové a řídicí techniky VŠCHT v Praze. Praha: The MathWorks, Inc. & HUMUSOFT s.r.o. & Ústav počítačové a řídicí techniky VŠCHT v Praze, 2009. p. 39-44. ISBN: 978-80-7080-733-0.
  Detail

  ANDREEV, A.; GRMELA, L.; RAŠKA, M.; ŠIKULA, J. Experimental Analysis of Noise in CdTe Radiation Detectors. AIP conference proceedings, 2009, vol. 1129, no. 1, p. 313-317. ISSN: 0094-243X.
  Detail

  TOMÁNEK, P.; MIKLÁŠ, J.; BAJGAR, A.; GRMELA, L.; DOBIS, P.; BRÜSTLOVÁ, J. Sensor of back-scattered light polarization in body cells. In Optical sensors 2009, Francesco Baldini, Jiri Homola, Robert A. Lieberman (Eds)., SPIE Proceedings, vol. 7356. Proceedings of SPIE. Bellingham, USA: SPIE, 2009. p. 7356281-7356289. ISSN: 0277-786X.
  Detail

  TOMÁNEK, P.; GRMELA, L.; BRÜSTLOVÁ, J.; DOBIS, P.; ABUBAKER, H. Measurement of diffused light polarization due to multiple backscattering in body cells. In 8th IMEKO TC 2 Symposium on Photonics in Measurements 2008. Proceedings. New York: Curran Associated, Inc., 2009. p. 152-157. ISBN: 978-1-61567-041-3.
  Detail

• 2008

  ŠKARVADA, P.; GRMELA, L.; ABUETWIRAT, I.; TOMÁNEK, P. Nanooptics of locally induced photocurrent in Si solar cells. In Photonics Prague 2008. Prague: Zeithamlová Milena, Ing. - Agentura Action M, 2008. p. 96-97. ISBN: 978-80-86742-25-0.
  Detail

  GRMELA, L.; TOMÁNEK, P. Nové trendy v mikroelektronických systémech a nanotechnologiích (Workshop) 5. Moderní diagnostika materiálů a součástek, Mikrosyn 2007. Nové trendy v mikroelektronických systémech a nanotechnologií MSM 0021630503 - 2007. Mikrosyn. Brno: FEKT VUT, 2008. s. 1-104. ISBN: 978-80-7355-080-6.
  Detail

  GRMELA, L.; TOMÁNEK, P.; ŠKARVADA, P. Near-field study of hot spot photoluminescence decay in ZnS:Mn nanoparticles. In Materials Structure and Micromechanics of Fracture V. 567-568. Zurich, Switzerland: ttp Trans Tech Publications, 2008. p. 421-424. ISBN: 978-0-87849-469-9.
  Detail

  HOLCMAN, V.; LIEDERMANN, K.; GRMELA, L.; RAŠKA, M. NEW MIXED RULES ON COMPOSITE MATERIALS. In Proceedings of 2008 International Symposium on Electrical Insulating Materials. IEEJ Transactions on Electrical and Electronic Engineering. 1. Japonsko, Yokkaichi: Proceedings of 2008 International Symposium on Electrical Insulating, 2008. p. 71-74. ISBN: 978-4-88686-006-4. ISSN: 1931-4973.
  Detail

  ŠKARVADA, P.; GRMELA, L.; ABUETWIRAT, I.; TOMÁNEK, P. Nanooptics of locally induced photocurrent in monocrystalline Si solar cells. In Photonics, Devices and Systems - Proceedings of SPIE vol.7138. Proceedings of SPIE. Bellingham, USA: SPIE, 2008. no. 7138, p. 2901-2906. ISBN: 978-0-8194-7379-0. ISSN: 0277-786X.
  Detail

  TOMÁNEK, P.; GRMELA, L. Optics of nanoobjects. In Proceedings SPIE -Eighth International Conference on Correlation Optics. Proceedings of SPIE. 7008. Bellinhgham, USA: SPIE, 2008. no. 7008, p. 70081F01 (70081F11 p.)ISBN: 978-0-8194-7218-2. ISSN: 0277-786X.
  Detail

  GRMELA, L.; MACKŮ, R.; TOMÁNEK, P. Near-field measurement of ZnS:Mn nanocrystal and bulk thin-film electroluminescent devices. JOURNAL OF MICROSCOPY, 2008, vol. 229, no. 2, p. 275-280. ISSN: 0022-2720.
  Detail

  TOMÁNEK, P.; GRMELA, L.; BRÜSTLOVÁ, J.; DOBIS, P. Measurement of diffused light polarization due to multiple scattering in body cells. In 18th IMEKO TC 2 SYMPOSIUM on Photonics in Measurements. Prague: Zeithamlová Milena, Ing. - Agentura Action M, 2008. p. 95-99. ISBN: 978-80-86742-24-3.
  Detail

• 2007

  ANDREEV, A.; GRMELA, L. Investigation of 1/f Noise of p-type CdTe Detectors. In 30th International Spring Seminar on Electronics Technology 2007. MEDIAMIRA. Cluj-Napoca, Romania: Dan Pitica, 2007. p. 88-89. ISBN: 978-973-713-174-4.
  Detail

  HRUŠKA, P.; GRMELA, L. The LambertW function and semiconductor diode I-U curve. In EDS 07 IMAPS CS International Conference Proceedings. Brno: Ing. Zdeněk Novotný, CSc. Brno, Ondráčkova 105, 2007. p. 126-128. ISBN: 978-80-214-3470-7.
  Detail

  TOMÁNEK, P.; GRMELA, L. Nanotechnology interactive course for Electrical Engineering undergraduate students. In Nano´06. Brno: ČSNMT Praha, 2007. p. 101-104. ISBN: 80-214-3331-0.
  Detail

  GRMELA, L.; ZAJAČEK, J. The Sub-Band Decomposition of Fluctuated Signal for the Estimation of Power Spectra. In Conference Proceeeding Book. J.U Urena, J.U.Dominguez. New York: IEEE Spain, 2007. p. 327-332. ISBN: 1-4244-0829-6.
  Detail

  GRMELA, L.; TOMÁNEK, P. Near-field investigation of ZnS:Mn nanocrystal phosphors in thin-film electroluminescent device. In Nano´06. Brno: ČSNMT Praha, 2007. p. 307-310. ISBN: 80-214-3331-0.
  Detail

  HAVRÁNEK, J.; ŠIKULA, J.; PAVELKA, J.; GRMELA, L. RTS noise - carrier capture and emission event duration. In New trends in Physics. VUT. Brno: VUT Brno, 2007. p. 31-34. ISBN: 978-80-7355-078-3.
  Detail

  ANDREEV, A.; GRMELA, L.; ŠIKULA, J.; RAŠKA, M. Investigation of 1/f Noise Sources in CdTe Radiation Detectiors. In New Trends in Physics. Pavel Dobis, Jitka Brustlova. Brno, Czech Republic: Ing. Zdenek Novotny CSc, 2007. p. 15-18. ISBN: 978-80-7355-078-3.
  Detail

  HRUŠKA, P.; GRMELA, L.; KOKTAVÝ, P. Fine structure of electron traps. In New Trends in Physics. Brno: Z. Novotný, 2007. p. 47-50. ISBN: 978-80-7355-078-3.
  Detail

  GRMELA, L.; TOMÁNEK, P. Near-field study of hot luminescence centers in ZnS:Mn nanocrystals. Brno: VUTIUM Brno, 2007. p. 158-158.
  Detail

  ANDREEV, A.; ZAJAČEK, J.; ŠIKULA, J.; GRMELA, L.; HOLCMAN, V. The Effect of Contacts Metal - Semiconductor on Low Frequency Noise. In 6th International Conference of PhD Students. 1. Miskolc, Hungary: Jozsef Vesza, 2007. p. 173-178. ISBN: 978-963-661-779-0.
  Detail

  GRMELA, L.; TOMÁNEK, P.; ŠKARVADA, P. Near-field study of hot spot photoluminescence decay in ZnS:Mn nanoparticles. Materials Science Forum, 2007, vol. 2007, no. 567, p. 241-244. ISSN: 0255-5476.
  Detail

  TOMÁNEK, P.; GRMELA, L.; ŠKARVADA, P. Optical fiber Bragg grating used in the sensing of surface plasmon resonance. In Optomechatronic Sensors and Instrumentation III, Proceedings of SPIE, Vol. 6716. Proceedings of SPIE. Bellingham, USA: SPIE, 2007. no. 6715, p. 215-223. ISBN: 978-0-8194-6864-2. ISSN: 0277-786X.
  Detail

  ANDREEV, A.; GRMELA, L.; ŠIKULA, J.; ZAJAČEK, J. Analysis of the CdTe Hole Concentration and the Hole Mobility. In 30th International Spring Seminar on Electronics Technology 2007. MEDIAMIRA. Cluj-Napoca, Romania: Dan Pitica, 2007. p. 86-87. ISBN: 978-973-713-174-4.
  Detail

  GRMELA, L.; ANDREEV, A.; ŠIKULA, J.; ZAJAČEK, J.; MORAVEC, P. Noise Sources in the CdTe radiation detectors. In Noise and Fluctuation - 19-th International Conference on Noise and Fluctuations - ICNF 2007. M.Tacano, Y.Yamamoto, M.Nakao. Melville, USA: American Institute of Physics, 2007. p. 302-305. ISBN: 978-0-7354-0432-8.
  Detail

  GRMELA, L.; DOBIS, P.; BRÜSTLOVÁ, J.; TOMÁNEK, P. Optoelectronic noise and photocurrent measurement on GaAs/AlGaAs laser diode with single quantum well. International Journal of Optomechatronics, 2007, vol. 1, no. 1, p. 73-80. ISSN: 1559-9612.
  Detail

  ANDREEV, A.; GRMELA, L. Fermi Level Position in the Cadmium Telluride Detrector. In 30th International Spring Seminar on Electronics Technology 2007. MEDIAMIRA. Cluj-Napoca, Romania: Dan Pitica, 2007. p. 84-85. ISBN: 978-973-713-174-4.
  Detail

  KOKTAVÝ, B.; KOKTAVÝ, P.; GRMELA, L. Study of crack behaviour during mechanical stressing of composite materials. In New trends in physics. -. Brno: Z. Novotný, Ing., CSc., 2007. p. 65-68. ISBN: 978-80-7355-078-3.
  Detail

  HAVRÁNEK, J.; PAVELKA, J.; ŠIKULA, J.; GRMELA, L. Temperature dependence of RTS noise - trap activation energy. In New trends in physics. Brno: VUT, 2007. p. 35-38. ISBN: 978-80-7355-078-3.
  Detail

  ANDREEV, A.; ZAJAČEK, J.; GRMELA, L.; HOLCMAN, V. Low Frequency Noise Measuring in Semiconductor Devices. In 6th International Conference of PhD Students. Dr. Laszlo Lehoczky. Miskolc, Hungary: Dr. Laszlo Lehoczky, 2007. p. 179-184. ISBN: 978-963-661-783-7.
  Detail

• 2006

  GRMELA, L.; KALA, J.; TOMÁNEK, P. Local photoluminescence in InAs/GaAs heterostructures with quantum dots and artificial molecules. Proceedings of SPIE, 2006, vol. 6180, no. 6180, p. 517-522. ISSN: 0277-786X.
  Detail

  SEDLÁK, P.; MAJZNER, J.; GRMELA, L.; HASSE, L. Noise Spectral Density Computation Based on Finite Element Model of Piezoceramic Sensor. In Proceedings of the 30th International Conference of IMAPS Poland Chapter. Krakow: IMAPS Poland Chapter, 2006. 4 p. ISBN: 83-917701-3-3.
  Detail

  GRMELA, L.; TOMÁNEK, P. Near-field investigation of ZnS:Mn nanocrystal phosphors in thin-film electroluminescent device. Brno: Vutium Brno, 2006. p. 84-84.
  Detail

  HRUŠKA, P.; CHOBOLA, Z.; GRMELA, L. Diode I-U curve fitting with Lambert W function. In Proc. 25th Internationa Conference on Microelectronics. Niš: Serbia nad Montenegro IEEE Section, 2006. p. 501-504. ISBN: 1-4244-0116-X.
  Detail

  TOMÁNEK, P.; GRMELA, L. Near-field optical measurement and sensing in Nanophotonics. In Proc. of the Symposium on Photonics Technology for the 7th Framework Programme. Wroclaw, Poland: Wroclaw University of Technology, 2006. p. 51-54. ISBN: 83-7085-970-4.
  Detail

  HRUŠKA, P.; GRMELA, L.; CHOBOLA, Z. Diagnostika slunečních článků s podporou MATLABu. In Nové trendy v mikroelektronických systémech a nanotechnologiích. Brno: ing. Zdeněk Novotný, CSc., Ondráčkova 105 Brno, 2006. 4 s. ISBN: 80-7355-062-8.
  Detail

  GRMELA, L.; KALA, J.; TOMÁNEK, P. Near-field measurement of ZnS:Mn thin-film electroluminescent devices. In Near-field optics, Nanophotonics and Related Techniques. Lausanne, Switzerland: EPFL Lausanne, 2006. p. 326-328.
  Detail

  ZAJAČEK, J.; GRMELA, L. Digitální analýza širokopásmového šumu v polovodičových strukturách. In Elektrotechnika a informatika 2006. Plzeň: Západočeská Univerzita v Plzni, 2006. 4 s. ISBN: 80-7043-473-2.
  Detail

  TOMÁNEK, P.; GRMELA, L. Local detection of surface plasmon resonance for sensing applications. In ODF'06. Nara, Japonsko: Optical Society of Japan, 2006. p. 245-246.
  Detail

  GRMELA, L.; KALA, J.; TOMÁNEK, P. Local Optical Nanometrology of Artificial Molecules. In EOS Topical Meeting on Nanophotonics, Metamaterials and optical microcavity. Tome 3. Hannover: European Optical Society, 2006. p. 124-126. ISBN: 3-00-019-533-4.
  Detail

  TOMÁNEK, P.; GRMELA, L. Nové trendy v mikroelektronických systémech a nanotechnologiích (Workshop) 5. Moderní diagnostika materiálů a součástek. Nové trendy v mikroelektronických systémech a nanotechnologiích (Workshop) 5. Moderní diagnostika materiálů a součástek. Mikrosyn. Brno: FEKT VUT Brno, 2006. s. 1-157. ISBN: 80-7355-062-8.
  Detail

  TOMÁNEK, P.; GRMELA, L. Near-field optical measurement and sensing in Nanophotonics. Wroclaw, Poland: Wroclaw University of Technology, 2006. 1 p.
  Detail

• 2005

  HRUŠKA, P.; GRMELA, L.; KOKTAVÝ, P. Teaching Physics with Matlab. In 4th International Conference on Physics Teaching in Engineering Education PTEE 2006. Brno: European Physical Society, 2005. 4 p. ISBN: 80-903063-6-5.
  Detail

  HRUŠKA, P.; CHOBOLA, Z.; GRMELA, L. CF toolbox in solar cell diagnostics. In Technical Computing Prague 2005. Praha: 2005. 6 p. ISBN: 80-7080-577-3.
  Detail

  GRMELA, L.; KALA, J.; TOMÁNEK, P. Near-field local detection of energy transport in metal thin film plasmon waveguides. In NANO'05. Brno: Brno University of Technology, Faculty of Mechanical Engineering, 2005. p. 219-224. ISBN: 80-214-3085-0.
  Detail

  GRMELA, L., ŠIKULA, J., ZAJAČEK, J., DOBIS, P., MORAVEC, P. Transport and Noise Characteristics of CdTe Sensors. In Electronic Devices and Systems. Brno: Ing. Zdeněk Novotný, CSc., Brno, Ondráčkova 105, 2005. 6 s. ISBN: 80-214-2990-9.
  Detail

  GRMELA, L.; KALA, J.; TOMÁNEK, P. Optical near-field investigations on GaAs/AlxGa1-XAs quantum dots. In Photonics Prague 2005. Prague: Zeithamlová Milena, Ing. - Agentura Action M, 2005. p. 163-164. ISBN: 80-86742-08-3.
  Detail

  HRUŠKA, P.; GRMELA, L.; KOKTAVÝ, P. MAPLE in General Physics E-learning. In New Trends in Physics. Brno: Ing.Zdeněk Novotný,CSc., 2005. p. 316-319. ISBN: 80-7355-024-5.
  Detail

  SEDLÁKOVÁ, V.; ŠIKULA, J.; GRMELA, L.; HÖSCHEL, P.; SITA, Z.; HASHIGUCHI, S.; TACANO, M. Noise and Carge Storage in Nb2O5 Thin Films. In Noise and Fluctuations. United States of America: American Institute of Physics, 2005. 4 p. ISBN: 0-7354-0267-1.
  Detail

  GRMELA, L.; TOMÁNEK, P. Local detection of electromagnetic energy transport below the diffraction limit in metal nanoparticle plasmon waveguides. Brno: Vysoké učení technické v Brně, Fakulta strojního inženýrství, 2005. p. 32-32.
  Detail

  GRMELA, L.; ŠIKULA, J.; ZAJAČEK, J.; MORAVEC, P. Low Frequency Noise of the CdTe Crystals. In Noise and Fluctuations. Melville, USA: American Institute of Physics, 2005. p. 175-178. ISBN: 0-7354-0267-1.
  Detail

  TOMÁNEK, P.; GRMELA, L. Local optical phenomena in InAs/GaAs heterostructures with quantum dots and artificial molecules. JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2005, vol. 47, no. 96, p. S162 (S165 p.)ISSN: 0374-4884.
  Detail

  TOMÁNEK, P., OTEVŘELOVÁ, D., GRMELA, L., BRÜSTLOVÁ, J., DOBIS, P. Local near-field scanning optical microscopy and spectroscopy of nanostructures. In Nano´04. Brno: Brno University of Technology, 2005. p. 188-193. ISBN: 80-214-2793-0.
  Detail

  TOMÁNEK, P.; DOBIS, P.; BENEŠOVÁ, M.; GRMELA, L. Near-field study of carrier dynamics in InAs/GaAs quantum dots grown on InGaAs layers. Materials Science Forum, 2005, vol. 482, no. 1, p. 151-155. ISSN: 0255-5476.
  Detail

  HRUŠKA, P.; GRMELA, L.; KOKTAVÝ, P. Teaching Physics with Matlab. European physical society, 2005. 1 p.
  Detail

• 2004

  TOMÁNEK, P., GRMELA, L. Near field photocurrent spectroscopy of crystalline GaAs solar cells. CO-MAt-TECH 2004. Proceedings of the Abstracts. Trnava: Vydavatelstvo STU Bratislava, 2004. 1 p. ISBN: 80-227-2121-5.
  Detail

  HRUŠKA, P., GRMELA, L., KOKTAVÝ, P. MAPLE in General Physics e-Grading. In New Trends in Physics. Brno: Ing. Zdeněk Novotný, CSc., 2004. 4 p. ISBN: 80-7355-024-5.
  Detail

  ŠIKULA, J., HLÁVKA, J., SEDLÁKOVÁ, V., GRMELA, L. Conductivity mechanisms and breakdown of NbO capacitors. In 24th Capacitor and Resistor Technology Symposium. Capacitor and Resistor Technology. U.S.A.: ECA, 2004. no. 24, 6 p. ISSN: 0887-7491.
  Detail

  TOMÁNEK, P., BENEŠOVÁ, M., DOBIS, P., BRÜSTLOVÁ, J., GRMELA, L. Local photoluminescence measurement of semiconductor InGaAs quantum dot excited states. Photonics Europe. SPIE, Europe, 2004. 1 p.
  Detail

  TOMÁNEK, P., GRMELA, L. Local optical phenomena in InAs/GaAs heterostructures with doped quantum dots and artificial molecules (Seoul, Korea). The 8th International Conference on Near-field Nano Optics and Related Techniques (NFO-8). Seoul, Korea: Seoul National University, 2004. 1 p.
  Detail

  TOMÁNEK, P., OTEVŘELOVÁ, D., GRMELA, L., BRÜSTLOVÁ, J., DOBIS, P. Near-field local optical spectrosccopy of nanostructured semiconductors. Nano ´ 04. Brno: VUTIUM Brno, 2004. 1 p. ISBN: 80-214-2672-1.
  Detail

  TOMÁNEK, P.; GRMELA, L. Near field photocurrent spectroscopy of crystalline GaAs solar cells. In CO-MAT-TECH 2004, Proceeding of 12. International Scientific Conference. Trnava: Vydavatelstvo STU Bratislava, 2004. p. 1365-1370. ISBN: 80-227-2117-4.
  Detail

  OTEVŘELOVÁ, D.; TOMÁNEK, P.; GRMELA, L. Local characterization of optical waveguide structure using Scanning near-field optical microscopy. In Applied physics on condensed matter APCOM – 2004. Bratislava: Slovak Technical University in Bratislava, 2004. p. 183-186. ISBN: 80-227-2073-9.
  Detail

  GRMELA, L.; DOBIS, P.; MAJZNER, J.; KALA, J.; ZAJAČEK, J. Automatic Noise Spectral Density Measuring Set-up. In New Trends in Physics. Brno: Ing. Zdeněk Novotný, CSc., 2004. p. 32-35. ISBN: 80-7355-024-5.
  Detail

  ZAJAČEK, J., ŠIKULA, J., GRMELA, L. CONTACT AND SHEET RESISTANCE OF SOLAR CELLS. In Non-destructive testing. Brno: Institute of Physic, FAST, BUT, 2004. no. 1, 5 p. ISBN: 80-7204-371-4.
  Detail

  TOMÁNEK, P., DOBIS, P., BENEŠOVÁ, M., GRMELA, L. Near-field optical measurement of carrier recombination in InAs/GaAs quantum dots. Material structure & micromechanics of fracture. Brno: Vutium, Brno, 2004. 1 p. ISBN: 80-214-26732-X.
  Detail

• 2003

  ŠIKULA, J., HLÁVKA, J., SEDLÁKOVÁ, V., GRMELA, L., HOSCHL, P., ZEDNÍČEK, T. Conductivity mechanisms, breakdown and noise characteristics of niobium oxide capacitors. In CARTS - EUROPE 2003 Proceedings. United Kingdom: Electronic Components Institute Internationale Ltd., 2003. 5 p. ISBN: 0887-7491.
  Detail

  SEDLÁKOVÁ, V., MELKES, F., GRMELA, L., DOBIS, P., ŠIKULA, J., TACANO, M., ROČAK, D., BELAVIČ, D. The effect of silver diffusion from contact electrode into thick film resistors. In CARTS - EUROPE 2003 Proceedings. United Kingdom: Electronic Components Institute Internationale Ltd., 2003. 4 p. ISBN: 0887-7491.
  Detail

  TOMÁNEK, P.; BENEŠOVÁ, M.; DOBIS, P.; OTEVŘELOVÁ, D.; GRMELA, L.; KAWATA, S. Near-field optical diagnostics of carrier dynamics in semiconductor with superresolution. Physics of low-dimensional structures, 2003, vol. 2003, no. 3/4, p. 131-137. ISSN: 0204-3467.
  Detail

  TOMÁNEK, P., BENEŠOVÁ, M., DOBIS, P., OTEVŘELOVÁ, D., GRMELA, L., KAWATA, S. Near-field optical imaging of carrier dynamics in silicon with superresolution. In Scanning Probe Microscopy - 2003. Nizhniy Novgorod, Russia: Institute for Physics of microstructures RAS, 2003. p. 63-65.
  Detail

  BENEŠOVÁ, M., TOMÁNEK, P., OTEVŘELOVÁ, D., DOBIS, P., GRMELA, L. Near field scanning optical microscopy as an imaging tool for carrier process in silicon. In Advanced engineering design. Praha: Process Engineering Publisher, 2003. p. F1.3 (F1.7 p.)ISBN: 80-86059-35-9.
  Detail

  OTEVŘELOVÁ, D.; GRMELA, L.; TOMÁNEK, P.; BRÜSTLOVÁ, J. Photoluminescence scanning near-field optical microscopy in GaAlAs/GaAs quantum wells. Proceedings of SPIE, 2003, vol. 5036, no. 5036, p. 640-644. ISSN: 0277-786X.
  Detail

  TOMÁNEK, P., DOBIS, P., GRMELA, L. 1/f Noise in InAs/GaAs Quantum Dots and InGaAs/GaAs/InGaP Quantum Well LEDs and in quantum well laser diodes. In CO-MAT-TECH 2003, 11th International scientific conference. Bratislava: MtF STU Trnava, 2003. 4 p. ISBN: 80-277-1949-8.
  Detail

  ŠIKULA, J.; VRBA, R.; GRMELA, L.; ZEDNÍČEK, T.; SITA, Z. Breakdown characteristics and low frequency noise of niobium based capacitors. Capacitor and Resistor Technology, 2003, vol. 2003, no. 4, 7 p. ISSN: 0887-7491.
  Detail

  TOMÁNEK, P., BENEŠOVÁ, M., OTEVŘELOVÁ, D., GRMELA, L., DOBIS, P. Local optical imaging of electronic characteristics in semiconductors. In Noise and fluctuation ICNF 2003. Brno: 2003. 4 p. ISBN: 80-239-1005-1.
  Detail

  DOBIS, P., BRÜSTLOVÁ, J., GRMELA, L., TOMÁNEK, P. Electrooptical Characterization of ZnS:Mn Thin-film Electroluminescent Devices. In The 10th EDS 2003 Electronic Devices and Systems Conference. Neuveden. Brno: Ing. Zdeněk Novotný, CSc., 2003. 4 p. ISBN: 80-2142452-4.
  Detail

  MAJZNER, J., TOMÁNEK, P., GRMELA, L., BENEŠOVÁ, M. Critical role of near-field optics in the characterization of electro-optical devices. In Radioelektronika 2003 Conference proceedings. Brno: MJ Servis Ltd., 2003. 4 p. ISBN: 80-214-2388-8.
  Detail

  GRMELA, L., TOMÁNEK, P., KOKTAVÝ, P., PAVELKA, J., ŠIKULA, J. Noise Spectroscopy of Thick Film Electroluminescent Lamps. In Noise and Non-linearity Testing of Modern Electronic Components. Brno: CNRL, 2003. 1 p. ISBN: 80-238-9094-8.
  Detail

  ŠIKULA, J., SEDLÁKOVÁ, V., GRMELA, L., VRBA, R., MELKES, F., ROCAK, D., BELAVIC, D., TACANO, M., HASHIGUCHI, S. Current density distribution, noise and non-linearity of thick film resistors. In 23rd Capacitor and Resistor Technology Symposium. Capacitor and Resistor Technology. U.S.A.: 2003. no. 4, 5 p. ISSN: 0887-7491.
  Detail

• 2002

  GRMELA, L., BRÜSTLOVÁ, J., OTEVŘELOVÁ, D., TOMÁNEK, P., BENEŠOVÁ, M. Local photoluminescence scanning measurement on A3-B5 quantum dots. In Optics in computing - St. Petersburg. St. Petersburg, Russia: St. Petersburg Institute of fine Mechanics and Optics, 2002. 2 p.
  Detail

  ŠIKULA, J.; HLÁVKA, J.; PAVELKA, J.; SEDLÁKOVÁ, V.; GRMELA, L.; TACANO, M.; HASHIGUCHI, S. Low Frequency Noise of Tantalum Capacitors. Active and Passive Electronic Components, 2002, vol. 25, no. 2, 7 p. ISSN: 0882-7516.
  Detail

  TOMÁNEK, P., BENEŠOVÁ, M., DOBIS, P., OTEVŘELOVÁ, D., GRMELA, L. Spectral measurements of semiconductor structures using optical near-field approach. In Joint COST-Action workgroup meeting on individual and assembled nanoparticles and quantum dots. Leuven, Belgie: KU Leuven, COST 523, 2002. 1 p.
  Detail

  MAJZNER, J., GRMELA, L., KOKTAVÝ, P., ŠIKULA, J. Analogue model of human middle ear. In Electronic devices and systems 02 - Proceedings. Brno: Zdeněk Novotný, 2002. 5 p. ISBN: 80-214-2180-0.
  Detail

  GRMELA, L., TOMÁNEK, P., KOKTAVÝ, P., PAVELKA, J., ŠIKULA, J. Noise spectroscopy of thick film. In Noise and Non-linearity Testing of Modern Electronic Componets. Brno: Ing.Zdeněk Novotný, CSc., 2002. 2 p. ISBN: 80-2389094-8.
  Detail

  GRMELA, L., KOKTAVÝ, P., LIEDERMANN, K., ŠIKULA, J., PAVELKA, J., TOMÁNEK, P. Non Destructive Testing of Thinck Film Electroluminiscent Lamps. In 8-th ECNDT, Barcelona. Madrid: European Federation for Non-Destructive Testing, 2002. 2 p. ISBN: 84-699-8573-6.
  Detail

  GRMELA, L., MAJZNER, J., PAVELKA, J., ŠIKULA, J. Automatic noise spectral density measuring set-up. In Electronic devices and systems 02 - proceedings. Brno: Zdeněk Novotný, 2002. 7 p. ISBN: 80-214-2180-0.
  Detail

  OTEVŘELOVÁ, D., GRMELA, L., TOMÁNEK, P., UHDEOVÁ, N. Photoluminiscence scanning near-field optical microscopy in GaAlAs/GaAs quantum wells. In Photonics Prague 2002. Praha: Techmarket, 2002. 1 p. ISBN: 80-86114-46-5.
  Detail

  GRMELA, L., DOBIS, P., KOKTAVÝ, P., PAVELKA, J. Noise Tester for Electronic Components. In Noise and Non-linearity Testing of Modern Electronic Components - NNT. Brno: Ing.Zdeněk Novotný, CSc., 2002. 6 p. ISBN: 80-238-9094-8.
  Detail

  PAVELKA, J., ŠIKULA, J., GRMELA, L., TACANO, M., HASHIGUCHI, S. Noise and Self-Healing of Tantalum Capacitors. Capacitor and Resistor Technology, 2002, vol. 2002, no. 4/2002, 5 p. ISSN: 0887-7491.
  Detail

  GRMELA, L., DOBIS, P., TOMÁNEK, P. Near-Field Induced Photocurrent Spectra: New Way of Non-destructive Testing of DQW-GRIN Laser Diodes Reliability. In Noise and Non-linearity Testing of Modern Electronic Components. Brno: Ing. Zdeněk Novotný, CSc., 2002. 5 p. ISBN: 80-238-9094-8.
  Detail

  UHDEOVÁ, N., GRMELA, L., TOMÁNEK, P. Support of the self-work of Students in Physics. In Proceedings of the PTEE 2002 conference. Leuven, Belgium: Katoliket Universitet Leuven, 2002. 4 p. ISBN: 90-5682-359-0.
  Detail

  ŠIKULA, J., PAVELKA, J., GRMELA, L., DOBIS, P., ZEDNÍČEK, T. Charge Carriers Transport and Noise of Niobium Capacitors. In CARTS-EUROPE 2002 Proceedings, 16th European Passive Components Conference. Swindon, England: Electronic Components Institute Internationale Ltd., 2002. 5 p.
  Detail

  UHDEOVÁ, N., GRMELA, L. The role of education technology in the new teaching concept of the General course of Physics at FEEC TU BRNO. In 10 rokov technológie vzdelávania. Nitra: SlovDidac, 2002. 6 p. ISBN: 80-967746-6-2.
  Detail

  GRMELA, L. Experimentální metody nedestruktivního testování elektronických součástek a materiálů. Vědecké spisy Vysokého učení technického v Brně Edice Habilitační a inaugurační spisy, 2002, roč. 2002, č. sv. 90, 35 s. ISSN: 1213-418X.
  Detail

  SEDLÁKOVÁ, V., PAVELKA, J., GRMELA, L., ŠIKULA, J., ROČAK, D., HROVAT, M., BELAVIČ, D. NOISE AND NON-LINEARITY OF THICK-FILM RESISTORS. In Proceedings of European Microelectronics packaging & interconection Symposium. Krakow, Poland: IMAPS - Poland Chapter, 2002. 4 p. ISBN: 83-904462-8-6.
  Detail

  GRMELA, L., MAJZNER, J., PAVELKA, J. Automatic noise spectral density measuring set-up. In Electronic Devices and Systems 2002. Brno: VUT v Brně, 2002. 7 p. ISBN: 80-214-2180-0.
  Detail

  GRMELA, L., PAVELKA, J., HLÁVKA, J., SEDLÁK, S. Non-linearity testing of electrical contacts. In Noise and Non-linearity Testing of Modern Electronic Components. Brno: Ing.Zdeněk Novotný, CSc., 2002. 2 p. ISBN: 80-238-9094-8.
  Detail

• 2001

  GRMELA, L. Near field optical beam induced current measurements on heterostructures. 2001.
  Detail

  TOMÁNEK, P., GRMELA, L., UHDEOVÁ, N., DOBIS, P., BRÜSTLOVÁ, J. Optoelectronics and optical fiber sensors in engineering education. In CO-MAT-TECH 2001. sv.2. Bratislava: STU Bratislava, 2001. 5 p. ISBN: 80-227-1591-3.
  Detail

  TOMÁNEK, P., BENEŠOVÁ, M., DOBIS, P., GRMELA, L., BRÜSTLOVÁ, J., OTEVŘELOVÁ, D., LÉTAL, P. Near field photoluminescence and photoreflectance measurements of semiconductor structures. In Nanomaterials: Fundamentals and applications. Limerick: MSSI, 2001. 1 p.
  Detail

  GRMELA, L., TOMÁNEK, P., KOKTAVÝ, P., PAVELKA, J., ŠIKULA, J. Noise spectroscopy of thick film electroluminescent lamp. In Electronics Devices and System. Brno: Vysoké učení technické v Brně, 2001. 1 p. ISBN: 80-214-1960-1.
  Detail

  LÉTAL, P., TOMÁNEK, P., GRMELA, L. Near field optical beam induced current measurements on heterostructures. In Nové trendy ve fyzice (New trends in Physics). sv.2. Brno: Vysoké učení technické v Brně, 2001. 7 p. ISBN: 80-214-1992-X.
  Detail

  ŠIKULA, J., PAVELKA, J., HLÁVKA, J., SEDLÁKOVÁ, V., GRMELA, L., TACANO, M., HASHIGUCHI, S. The Tantalum Capacitor as a MIS Structure in Reverse Mode. In Proceedings of 21st Capacitor and Resistor technology Symposium CARTS US 2001. Huntsville, Alabama, USA: Components Technology Institute, Inc., 2001. 4 p. ISBN: 0887-7491.
  Detail

  BENEŠOVÁ, M., TOMÁNEK, P., DOBIS, P., GRMELA, L. A simplified local surface photoreflectance measurement. In Proceedings of Materials structure and micromechanics fracture. Brno: VUTIUM, 2001. 6 p. ISBN: 80-214-1892-3.
  Detail

  GRMELA, L., LÉTAL, P., TOMÁNEK, P. Near-field photocurrent spectra in DQW-GRIN laser diodes. In Electronic Devices and Systems, EDS'Y2K. Brno: VUT v Brně, 2001. 4 p. ISBN: 80-214-1780-1.
  Detail

  PAVELKA, J., ŠIKULA, J., SEDLÁKOVÁ, V., GRMELA, L., TACANO, M., HASHIGUCHI, S. Low Frequency Noise of Thin Ta2O5 Amorphous Films. In Proceedings of the 16th International Conference Noise in Physical Systems and 1/f Fluctuations ICNF 2001. Gainesville, Florida, USA: World Scientific, 2001. 4 p. ISBN: 981-02-4677-3.
  Detail

  GRMELA, L., PAVELKA, J. Automatic apparatus for noise spectral density measurement. In Electronic Devices and System - Noise and Non-Linearity Testing of Modern Electronics Components. Brno: Vysoké učení technické v Brně, 2001. 1 p. ISBN: 80-214-1960-1.
  Detail

  GRMELA, L., PAVELKA, J., HLÁVKA, J. Relay contacts quality screening by non-linearity tester. In Electronic Devices and Systems. Brno: VUT v Brně, 2001. 1 p. ISBN: 80-214-1960-1.
  Detail

  GRMELA, L. Multiple multipole method for detection of evanescent field. In Radioelektronika 98. 2. Brno: VUT Brno, 2001. 4 p. ISBN: 80-214-098.
  Detail

  OTEVŘELOVÁ, D., GRMELA, L. Digital imaging and image resolution in scanning probe microscopy. In CO-MAT-TECH 2001. Trnava: STU Bratislava, 2001. 6 p. ISBN: 80-224-1591-3.
  Detail

  ŠIKULA, J., HLÁVKA, J., PAVELKA, J., SEDLÁKOVÁ, V., GRMELA, L., TACANO, M., HASHIGUCHI, S. Low Frequency Noise of Tantalum Capacitors. In Proceedings of CARTS-Euro 2001. Kodaň, Dánsko: Electronic Components Institute Internationale Ltd., 2001. 4 p.
  Detail

  LÉTAL, P., GRMELA, L., TOMÁNEK, P. Studium lokálních charakteristik fotoproudu v blízkém poli. Československý časopis pro fyziku, 2001, roč. 51, č. 1, 3 s. ISSN: 0009-0700.
  Detail

  TOMÁNEK, P., OTEVŘELOVÁ, D., GRMELA, L., DOBIS, P. Near-field optical microscopy diagnostics. In From quantum optics to photonics. Warszaw: Faculty of Physics, Warszaw University, 2001. 1 p. ISBN: 83-913171-4-5.
  Detail

  TOMÁNEK, P., GRMELA, L., OTEVŘELOVÁ, D., DOBIS, P., BRÜSTLOVÁ, J. Projekt "Fyzikální základy optoelektroniky". In Nové trendy ve fyzice. sv.2. Brno: Vysoké učení technické v Brně, Fakulta elektrotechniky a informatiky, 2001. s. 536-539. ISBN: 80-214-1992-X.
  Detail

• 2000

  LÉTAL, P., TOMÁNEK, P., GRMELA, L. Near-field photocurrent spectroscopy: superresolving method for inspection of semiconductor interfaces. In 8th CO-MAT-TECH 2000. Trnava: 2000. 6 p. ISBN: 80-227-1413-5.
  Detail

  GRMELA, L., TOMÁNEK, P. Optoelektronická zařízení: základní charakteristiky a automatizace měření. In Experiments and measurement in engineering physics education. Brno: Technical University of Brno, 2000. 4 s. ISBN: 80-214-122.
  Detail

  GRMELA, L.; LÉTAL, P. Near-field photocurrent spectroscopy: superresolving method for inspection of semiconductor interfaces. In CO-MAT-TECH 2000, 8. Medzinárodná vedecká konferencia, vol.4. Bratislava: Slovenská technická univerzita v Bratislave, 2000. p. 141-146. ISBN: 80-227-1413-5.
  Detail

• 1999

  GRMELA, L., VAŠINA, P. Tester spolehlivosti luminiscenčních diod. In Electronic devices and systems. 2. Brno: Technical University of Brno, 1999. 4 s.
  Detail

  TOMÁNEK, P., BENEŠOVÁ, M., LÉTAL, P., GRMELA, L., DOBIS, P., BRÜSTLOVÁ, J. Lokální spektroskopie a lokální fluorescence dielektrických a polovodičových povrchů. In Transfer+99. Brno: Vysoké učení technické v Brně, 1999. s. H91 (H92 s.)ISBN: 80-214-134.
  Detail

• 1998

  LÉTAL, P.; BRÜSTLOVÁ, J.; DOBIS, P.; GRMELA, L.; TOMÁNEK, P. Lokální spektroskopie pomocí řádkovacího optického mikroskopu pracujícího v blízkém poli. Inženýrská mechanika - Engineering Mechanics, 1998, roč. 5, č. 3, s. 215-217. ISSN: 1210-2717.
  Detail

  TOMÁNEK, P.; BRÜSTLOVÁ, J.; DOBIS, P.; GRMELA, L. Hybrid STM/r-SNOM with novel probe. ULTRAMICROSCOPY, 1998, vol. 71, no. 1-4, p. 199-203. ISSN: 0304-3991.
  Detail

  LÉTAL, P., TOMÁNEK, P., DOBIS, P., GRMELA, L., BRÜSTLOVÁ, J. Locally resolved topography and spectroscopy of semiconductors (with lateral resolution better than 250 nm). In Electronic devices and systems (EDS´98). Brno: Technical University of Brno, 1998. 4 p. ISBN: 80-214-119.
  Detail

  GRMELA, L., TOMÁNEK, P. Analýza degradace a spolehlivosti LED. In Applied Optics and Optoelectronics. London: Institute of Physics, 1998. 2 s.
  Detail

  LÉTAL, P., TOMÁNEK, P., DOBIS, P., GRMELA, L., BRÜSTLOVÁ, J. Chybí název. In Material structure and micromechanics of fracture (MSMF-2). Brno: Technical University of Brno, 1998. 2 s. ISBN: 80-214-118.
  Detail

  LÉTAL, P., TOMÁNEK, P., DOBIS, P., BRÜSTLOVÁ, J., GRMELA, L. Local spectroscopy by scanning near-field optical microscopy. Inženýrská mechanika - Engineering Mechanics, 1998, vol. 5, no. 3, 4 p. ISSN: 1210-2717.
  Detail

  LÉTAL, P., BRÜSTLOVÁ, J., TOMÁNEK, P., DOBIS, P., GRMELA, L. Locally resolved topography and spectroscopy of semiconductors (with lateral resolution better than of 250 nm). In Proc. of 5th Int.Conf. Electronic devices and systems 1998. Brno: 1998. 4 p. ISBN: 80-214-1198-8.
  Detail

  LÉTAL, P., BRÜSTLOVÁ, J., DOBIS, P., GRMELA, L., TOMÁNEK, P. Near-field and far-field spectroscopy of semiconductors. 2nd Int.Coll, MSMF-2. Brno: 1998. 2 p. ISBN: 80-214-1181-3.
  Detail

• 1997

  TOMÁNEK, P.; GRMELA, L.; BRÜSTLOVÁ, J.; DOBIS, P. Tunnel noise spectroscopy by reflection SNOM and STM. Proceedings of SPIE, 1997, vol. 3098, no. 1, 1 p. ISSN: 0277-786X.
  Detail

  GRMELA, L., TOMÁNEK, P. Spolehlivost zařízení s jedním vstupem. In 5th Co-MAT-TECH 97. Bratislava: STU Bratislava, 1997. 6 s. ISBN: 80-227-097.
  Detail

  TOMÁNEK, P., GRMELA, L. Subwavelength lithography with reflection near field optical microscopy. In 5th CO-MAT-TECH 97. Bratislava: STU Bratislava, 1997. 6 p. ISBN: 80-227-097.
  Detail

  TOMÁNEK, P., DOBIS, P., GRMELA, L., BRÜSTLOVÁ, J. Vizualizace latentních obrazů pomocí optiky v blízkém poli. In Workshop 97. 3. Praha: CTU Publ.house Prague, 1997. 2 s.
  Detail

• 1995

  TOMÁNEK, P., DOBIS, P., GRMELA, L. Characterization of surface corrugation by near-field techniques. EOS Annual Meeting, 1995, vol. 2A, no. 2A, p. 101-102. ISSN: 1022-0151.
  Detail

  TOMÁNEK, P., DOBIS, P., GRMELA, L. Superrozlišující vlastnosti optických sysémů v blízkém poli. In Mezinárodní konference VŠB: Aplikovaná fyzika. 11. Ostrava: VŠB Ostrava, 1995. 6 s.
  Detail

  TOMÁNEK, P., BRÜSTLOVÁ, J., DOBIS, P., GRMELA, L., UHDEOVÁ, N. STM/SNOM setup. In 1995.
  Detail

  TOMÁNEK, P., BRÜSTLOVÁ, J., DOBIS, P., GRMELA, L., UHDEOVÁ, N. Twinned STM/SNOM setup. EOS Topical Meeting, 1995, vol. 8, 1 p. ISSN: 1167-5357.
  Detail

  TOMÁNEK, P., GRMELA, L., BRÜSTLOVÁ, J. Versatile near-field and far-field optical microscope. EOS Annual Meeting, 1995, roč. 2A, č. 2A, 1 s. ISSN: 1022-0151.
  Detail

• 1994

  TOMÁNEK, P., GRMELA, L. Signal-to noise ration in scanning tunneling reflection optical microscopy. In Fluctuation phenomena in physical systems. Vilnius, Liuthania: Vilnius University Press, 1994. 5 p. ISBN: 9986-19-078-9.
  Detail

  TOMÁNEK, P., GRMELA, L. Signal-to-noise ratio in scanning tunneling optical microscopy using multimode fibre as probe. In Applied Optics and Optoelectronics. London: Institute of Physics, 1994. 2 p.
  Detail

• 1993

  TOMÁNEK, P., GRMELA, L. Odstup signál/šum v řádkovací odrazné optické tunelové mikroskopii. In Fluctuation phenomena in physical systems. Vilnius: Vilnius University Press, 1993. p. 345-349. ISBN: 9986-1907.
  Detail

  TOMÁNEK, P.; GRMELA, L. Modal noise in multimode optical probes. In Near field optics 2. Raleigh: State University of North Carolina, 1993. p. 72-72.
  Detail

*) Citace se generují jednou za 24 hodin.