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Detail publikačního výsledku
DOBIS, P., BRÜSTLOVÁ, J., GRMELA, L., TOMÁNEK, P.
Originální název
Electrooptical Characterization of ZnS:Mn Thin-film Electroluminescent Devices
Anglický název
Druh
Stať ve sborníku v databázi WoS či Scopus
Originální abstrakt
Electrical characterization methods for the analysis of alternating current thin-film electroluminescent (ACTFEL) devices are presented. Particular emphasis is devoted to characterization techniques because ACTFEL devices are electro-optic display devices whose performance is to a large extent determined by their electrical properties. Steady-state electrical characterization methods discussed in this paper include charge-voltage (Q-V), capacitance-voltage (CV), internal charge-phosphor field (Q-Fp), and maximum charge-maximum applied voltage (Qmax-Vmax) analysis. These electrical characterization methods are illustrated by reviewing relevant results obtained from the analysis of evaporated ZnS:Mn devices.
Anglický abstrakt
Klíčová slova
Electroluminescence, thin film, electrical characterization, ACTFEL, ZnS
Klíčová slova v angličtině
Autoři
Vydáno
09.09.2003
Nakladatel
Ing. Zdeněk Novotný, CSc.
Místo
Brno
ISBN
80-2142452-4
Kniha
The 10th EDS 2003 Electronic Devices and Systems Conference
Edice
Neuveden
Svazek
Strany od
287
Strany počet
4
BibTex
@inproceedings{BUT8243, author="Pavel {Dobis} and Jitka {Brüstlová} and Lubomír {Grmela} and Pavel {Tománek}", title="Electrooptical Characterization of ZnS:Mn Thin-film Electroluminescent Devices", booktitle="The 10th EDS 2003 Electronic Devices and Systems Conference", year="2003", series="Neuveden", volume="Neuveden", number="Neuveden", pages="4", publisher="Ing. Zdeněk Novotný, CSc.", address="Brno", isbn="80-2142452-4" }