Detail publikačního výsledku

Critical role of near-field optics in the characterization of electro-optical devices

MAJZNER, J., TOMÁNEK, P., GRMELA, L., BENEŠOVÁ, M.

Originální název

Critical role of near-field optics in the characterization of electro-optical devices

Anglický název

Critical role of near-field optics in the characterization of electro-optical devices

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

In applications as diverse as waveguide and quantum-dot analysis, the local NSOM technique offers resolution beyond that possible with conventional confocal microscopy. The NSOM data of the active region of the waveguide are presented.

Anglický abstrakt

In applications as diverse as waveguide and quantum-dot analysis, the local NSOM technique offers resolution beyond that possible with conventional confocal microscopy. The NSOM data of the active region of the waveguide are presented.

Klíčová slova

near-field, electro-optical devices

Klíčová slova v angličtině

near-field, electro-optical devices

Autoři

MAJZNER, J., TOMÁNEK, P., GRMELA, L., BENEŠOVÁ, M.

Vydáno

01.01.2003

Nakladatel

MJ Servis Ltd.

Místo

Brno

ISBN

80-214-2388-8

Kniha

Radioelektronika 2003 Conference proceedings

Svazek

1

Strany od

280

Strany počet

4

Plný text v Digitální knihovně

http://hdl.handle.net/

BibTex

@inproceedings{BUT9179,
  author="Jiří {Majzner} and Pavel {Tománek} and Lubomír {Grmela} and Markéta {Benešová}",
  title="Critical role of near-field optics in the characterization of electro-optical devices",
  booktitle="Radioelektronika 2003 Conference proceedings",
  year="2003",
  volume="1",
  number="1",
  pages="4",
  publisher="MJ Servis Ltd.",
  address="Brno",
  isbn="80-214-2388-8"
}