Multiscale experimental characterization of solar cell defects

Multiscale experimental characterization of solar cell defects

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The search for alternative sources of renewable energy, including novel photovoltaics structures, is one of the principal tasks of 21th century development. In the field of photovoltaics three generations of solar cells of different structures going from monocrystalline silicon through thin-films to hybrid and organic cells, moreover using nanostructure features are used and studied. Due to the diversity of these structures, their complex study requires the multiscale interpretations bridging time and length scales from macroscale to the atomistic, but also multispectral investigation under different working temperatures. The multiscale study is generally applied to theoretical aspects, but more and more applied to experimental characterization. We investigate multiscale aspects of electrical, optical and material properties of solar cells under illumination and in dark conditions when an external bias is applied. We present the results of a research of the micron and sub-micron defects in a crystalline solar cell structure utilizing scanning probe microscopy and electric noise measurement.

The search for alternative sources of renewable energy, including novel photovoltaics structures, is one of the principal tasks of 21th century development. In the field of photovoltaics three generations of solar cells of different structures going from monocrystalline silicon through thin-films to hybrid and organic cells, moreover using nanostructure features are used and studied. Due to the diversity of these structures, their complex study requires the multiscale interpretations bridging time and length scales from macroscale to the atomistic, but also multispectral investigation under different working temperatures. The multiscale study is generally applied to theoretical aspects, but more and more applied to experimental characterization. We investigate multiscale aspects of electrical, optical and material properties of solar cells under illumination and in dark conditions when an external bias is applied. We present the results of a research of the micron and sub-micron defects in a crystalline solar cell structure utilizing scanning probe microscopy and electric noise measurement.

solar cell, defect, noise, multiscale, detection, localization

solar cell, defect, noise, multiscale, detection, localization

ŠKARVADA, P.; ŠKVARENINA, Ľ.; TOMÁNEK, P.; SOBOLA, D.; MACKŮ, R.; BRÜSTLOVÁ, J.; GRMELA, L.; SMITH, S.

2017

24.12.2016

SPIE

Bellingham, USA

9781510607330

20th Slovak - Czech - Polish Optical Conference On Wave and Quantum Aspects of Contemporary Optics

SPIE Proceedings

0277-786X

Proceedings of SPIE

10142

10142

Spojené státy americké

101420U1

101420U7

7