Detail publikačního výsledku

Microscale localization and detection of defects in crystalline silicon solar cells

TOMÁNEK, P.; ŠKARVADA, P.; MACKŮ, R.; SOBOLA, D.; BRÜSTLOVÁ, J.; GRMELA, L.

Originální název

Microscale localization and detection of defects in crystalline silicon solar cells

Anglický název

Microscale localization and detection of defects in crystalline silicon solar cells

Druh

Článek recenzovaný mimo WoS a Scopus

Originální abstrakt

Silicon remains the only material that is well-researched in both bulk and thin-film configurations. Monocrystalline silicon solar cells are the photovoltaic devices with highest efficiency, but they content a variety of tiny local defects decreasing the efficiency. So the novel method containing electric and optical measurement is presented.

Anglický abstrakt

Silicon remains the only material that is well-researched in both bulk and thin-film configurations. Monocrystalline silicon solar cells are the photovoltaic devices with highest efficiency, but they content a variety of tiny local defects decreasing the efficiency. So the novel method containing electric and optical measurement is presented.

Klíčová slova

defect, silicon, solar cell, localization, detection

Klíčová slova v angličtině

defect, silicon, solar cell, localization, detection

Autoři

TOMÁNEK, P.; ŠKARVADA, P.; MACKŮ, R.; SOBOLA, D.; BRÜSTLOVÁ, J.; GRMELA, L.

Rok RIV

2016

Vydáno

17.08.2015

Nakladatel

DGaO

Místo

Erlangen, Německo

ISSN

1614-8436

Periodikum

DGaO-PROCEEDINGS

Svazek

2015

Číslo

2015

Stát

Spolková republika Německo

Strany od

1

Strany do

2

Strany počet

2

URL

http://www.dgao-proceedings.de

BibTex

@article{BUT116796,
  author="Pavel {Tománek} and Pavel {Škarvada} and Robert {Macků} and Dinara {Sobola} and Jitka {Brüstlová} and Lubomír {Grmela}",
  title="Microscale localization and detection of defects in crystalline silicon solar cells",
  journal="DGaO-PROCEEDINGS",
  year="2015",
  volume="2015",
  number="2015",
  pages="1--2",
  issn="1614-8436",
  url="http://www.dgao-proceedings.de"
}