Detail publikačního výsledku

Characterization of the native oxide on CdTe surfaces

SOBOLA, D.; KASPAR, P.; NEBOJSA, A.; HEMZAL, D.; GRMELA, L.; SMITH, S.

Originální název

Characterization of the native oxide on CdTe surfaces

Anglický název

Characterization of the native oxide on CdTe surfaces

Druh

Článek WoS

Originální abstrakt

This study focuses on the description of oxidation of CdTe monocrystal surfaces after selective chemical etching. Measurements of surface morphology of the oxides occurring in short time are valuable for deeper understanding of the material degradation and fabrication of reliable devices with enhanced performance. The samples with (1 1 1) orientation were selectively etched and cleaned of oxide. Exposure of the oxide-free surfaces of CdTe to air at normal atmospheric conditions over 24 hours leads to an appearance of characteristic surface features. The oxidized surfaces were investigated by scanning electron microscopy, scanning probe microscopy, Raman spectroscopy and ellipsometry. The results indicate clear differences in the oxidation of Cd-terminated and Te-terminated surfaces.

Anglický abstrakt

This study focuses on the description of oxidation of CdTe monocrystal surfaces after selective chemical etching. Measurements of surface morphology of the oxides occurring in short time are valuable for deeper understanding of the material degradation and fabrication of reliable devices with enhanced performance. The samples with (1 1 1) orientation were selectively etched and cleaned of oxide. Exposure of the oxide-free surfaces of CdTe to air at normal atmospheric conditions over 24 hours leads to an appearance of characteristic surface features. The oxidized surfaces were investigated by scanning electron microscopy, scanning probe microscopy, Raman spectroscopy and ellipsometry. The results indicate clear differences in the oxidation of Cd-terminated and Te-terminated surfaces.

Klíčová slova

selective etching; scanning probe microscopy; ellipsometry; Raman spectroscopy

Klíčová slova v angličtině

selective etching; scanning probe microscopy; ellipsometry; Raman spectroscopy

Autoři

SOBOLA, D.; KASPAR, P.; NEBOJSA, A.; HEMZAL, D.; GRMELA, L.; SMITH, S.

Rok RIV

2020

Vydáno

29.05.2019

Nakladatel

Sciendo

ISSN

2083-134X

Periodikum

MATERIALS SCIENCE-POLAND

Svazek

37

Číslo

2

Stát

Polská republika

Strany od

206

Strany do

211

Strany počet

6

URL

https://content.sciendo.com/view/journals/msp/ahead-of-print/article-10.2478-msp-2019-0030.xml

Plný text v Digitální knihovně

http://hdl.handle.net/11012/200897

BibTex

@article{BUT157133,
  author="Dinara {Sobola} and Pavel {Kaspar} and Alois {Nebojsa} and Dušan {Hemzal} and Lubomír {Grmela} and Steve J. {Smith}",
  title="Characterization of the native oxide on CdTe surfaces",
  journal="MATERIALS SCIENCE-POLAND",
  year="2019",
  volume="37",
  number="2",
  pages="206--211",
  doi="10.2478/msp-2019-0030",
  issn="2083-134X",
  url="https://content.sciendo.com/view/journals/msp/ahead-of-print/article-10.2478-msp-2019-0030.xml"
}

Dokumenty

Materials Science-Poland - Characterization of the native oxide on CdTe surfaces