Detail publikačního výsledku

Near-Field Induced Photocurrent Spectra: New Way of Non-destructive Testing of DQW-GRIN Laser Diodes Reliability

GRMELA, L., DOBIS, P., TOMÁNEK, P.

Originální název

Near-Field Induced Photocurrent Spectra: New Way of Non-destructive Testing of DQW-GRIN Laser Diodes Reliability

Anglický název

Near-Field Induced Photocurrent Spectra: New Way of Non-destructive Testing of DQW-GRIN Laser Diodes Reliability

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

We present the comparative study of spatially resolved near-field photocurrent (NPC) spectra for high power laser diode arrays with double quantum well before and after degradation due to the aging process. Subwavelength spatial resolution is established using a single mode fiber probe as an excitation source. The potential of the technique for analyzing microscopic aging processes in optoelectronic devices is demonstrated. The nondestructive quality of this method is a particularly attractive for in-situ analysis of the structures.

Anglický abstrakt

We present the comparative study of spatially resolved near-field photocurrent (NPC) spectra for high power laser diode arrays with double quantum well before and after degradation due to the aging process. Subwavelength spatial resolution is established using a single mode fiber probe as an excitation source. The potential of the technique for analyzing microscopic aging processes in optoelectronic devices is demonstrated. The nondestructive quality of this method is a particularly attractive for in-situ analysis of the structures.

Klíčová slova v angličtině

DQW-GRIN laser diode, degradation, aging process, optical near-field, photocurrent spectra.

Autoři

GRMELA, L., DOBIS, P., TOMÁNEK, P.

Vydáno

01.07.2002

Nakladatel

Ing. Zdeněk Novotný, CSc.

Místo

Brno

ISBN

80-238-9094-8

Kniha

Noise and Non-linearity Testing of Modern Electronic Components

Strany od

129

Strany počet

5

Plný text v Digitální knihovně

http://hdl.handle.net/

BibTex

@inproceedings{BUT5707,
  author="Lubomír {Grmela} and Pavel {Dobis} and Pavel {Tománek}",
  title="Near-Field Induced Photocurrent Spectra: New Way of Non-destructive Testing of DQW-GRIN Laser Diodes Reliability",
  booktitle="Noise and Non-linearity Testing of Modern Electronic Components",
  year="2002",
  pages="5",
  publisher="Ing. Zdeněk Novotný, CSc.",
  address="Brno",
  isbn="80-238-9094-8"
}