Fluctuations of ultrasonic transducer vibration measurement

Fluctuations of ultrasonic transducer vibration measurement

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Langevin type transducers are being used by reason of the high transmitting power capability for various purposes. The peak-to-peak value of the transducer mechanical oscillation is in order of tens of the nanometers (for the esonant frequency and two ring transducer). Transducer vibration parameters depend considerably on excitation voltage and frequency. Beyond the resonant frequency some parasitic resonance frequencies are produced. Precise measurement of vibration with nanometer accuracy in the range of the ultrasonic frequencies can be done with using optical interferometry. Results show high distortion of the transducer displacement waveforms and poor amplitude stability.

Langevin type transducers are being used by reason of the high transmitting power capability for various purposes. The peak-to-peak value of the transducer mechanical oscillation is in order of tens of the nanometers (for the esonant frequency and two ring transducer). Transducer vibration parameters depend considerably on excitation voltage and frequency. Beyond the resonant frequency some parasitic resonance frequencies are produced. Precise measurement of vibration with nanometer accuracy in the range of the ultrasonic frequencies can be done with using optical interferometry. Results show high distortion of the transducer displacement waveforms and poor amplitude stability.

vibrometer; light interference; interferometer; Langevin transducer;

vibrometer; light interference; interferometer; Langevin transducer;

ŠKARVADA, P.; TOMÁNEK, P.; GRMELA, L.; TOFEL, P.; ŠEVČÍK, M.; MACKŮ, R.

2014

28.06.2013

Montpellier

978-1-4799-0670-3

2013 22nd International Conference on Noise and Fluctuations (ICNF), IEEE Catalog Number CFP1392N-USB

Th-P-48-1

Th-P-48-4

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