Detail publikačního výsledku

Characterization of Fe2O3 thin film on highly oriented pyrolytic graphite by AFM, Ellipsometry and XPS

KASPAR, P.; SOBOLA, D.; DALLAEV, R.; RAMAZANOV, S.; NEBOJSA, A.; REZAEE, S.; GRMELA, L.

Originální název

Characterization of Fe2O3 thin film on highly oriented pyrolytic graphite by AFM, Ellipsometry and XPS

Anglický název

Characterization of Fe2O3 thin film on highly oriented pyrolytic graphite by AFM, Ellipsometry and XPS

Druh

Článek WoS

Originální abstrakt

Graphite finds use in a large amount of nanoscale applications, including as a substrate for thin film and nanomaterial deposition. With its excellent properties for usage in nanoscale and given the regularity of structure of highly oriented pyrolytic graphite (HOPG), the possibility of use to acquire more precise and detailed results is high. To this end the basic topographical and structural properties of HOPG and thin Fe2O3 have been explored. Methods used were atomic force microscopy, ellipsometry and x-ray photoelectron spectroscopy. Documentation of the results allows for further examination of HOPG usage possibilities, uncoated or coated with Fe2O3 thin film, as well as a substrate for carbon fiber or nanotube growth in future projects.

Anglický abstrakt

Graphite finds use in a large amount of nanoscale applications, including as a substrate for thin film and nanomaterial deposition. With its excellent properties for usage in nanoscale and given the regularity of structure of highly oriented pyrolytic graphite (HOPG), the possibility of use to acquire more precise and detailed results is high. To this end the basic topographical and structural properties of HOPG and thin Fe2O3 have been explored. Methods used were atomic force microscopy, ellipsometry and x-ray photoelectron spectroscopy. Documentation of the results allows for further examination of HOPG usage possibilities, uncoated or coated with Fe2O3 thin film, as well as a substrate for carbon fiber or nanotube growth in future projects.

Klíčová slova

Graphite Fe2O3 Ellipsometry XPS AFM

Klíčová slova v angličtině

Graphite Fe2O3 Ellipsometry XPS AFM

Autoři

KASPAR, P.; SOBOLA, D.; DALLAEV, R.; RAMAZANOV, S.; NEBOJSA, A.; REZAEE, S.; GRMELA, L.

Rok RIV

2020

Vydáno

01.11.2019

Nakladatel

Elsevier

ISSN

0169-4332

Periodikum

APPLIED SURFACE SCIENCE

Svazek

493

Číslo

1

Stát

Nizozemsko

Strany od

673

Strany do

678

Strany počet

6

URL

https://www.sciencedirect.com/science/article/pii/S016943321932094X

BibTex

@article{BUT157664,
  author="Pavel {Kaspar} and Dinara {Sobola} and Rashid {Dallaev} and Shihgasan {Ramazanov} and Alois {Nebojsa} and Sahare {Rezaee} and Lubomír {Grmela}",
  title="Characterization of Fe2O3 thin film on highly oriented pyrolytic graphite by AFM, Ellipsometry and XPS",
  journal="APPLIED SURFACE SCIENCE",
  year="2019",
  volume="493",
  number="1",
  pages="673--678",
  doi="10.1016/j.apsusc.2019.07.058",
  issn="0169-4332",
  url="https://www.sciencedirect.com/science/article/pii/S016943321932094X"
}

Dokumenty

157664_Characterization