Detail publikačního výsledku

Local near-field scanning optical microscopy and spectroscopy of nanostructures

TOMÁNEK, P., OTEVŘELOVÁ, D., GRMELA, L., BRÜSTLOVÁ, J., DOBIS, P.

Originální název

Local near-field scanning optical microscopy and spectroscopy of nanostructures

Anglický název

Local near-field scanning optical microscopy and spectroscopy of nanostructures

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

Visible and near infrared Scanning Near Field Optical Microscopy (SNOM) was used to characterize nanostructured semiconductor materials and structures. SNOM is a relatively new technique that combines the versatility of optical microscopy with the resolution of a scanning probe microscope. Light coupled into a tapered optical fiber is used for excitation. The fiber probe is scanned over the sample while being held ~10 nm above the surface. At this point, any number of high resolution (~100 nm) optical measurements can be made. In this work, the SNOM-induced photocurrent in GaAs devices was measured.

Anglický abstrakt

Visible and near infrared Scanning Near Field Optical Microscopy (SNOM) was used to characterize nanostructured semiconductor materials and structures. SNOM is a relatively new technique that combines the versatility of optical microscopy with the resolution of a scanning probe microscope. Light coupled into a tapered optical fiber is used for excitation. The fiber probe is scanned over the sample while being held ~10 nm above the surface. At this point, any number of high resolution (~100 nm) optical measurements can be made. In this work, the SNOM-induced photocurrent in GaAs devices was measured.

Klíčová slova

nanostructures, near-field spectroscopy, local optical properties, local photolumine-scence, locally induced photocurrent

Klíčová slova v angličtině

nanostructures, near-field spectroscopy, local optical properties, local photolumine-scence, locally induced photocurrent

Autoři

TOMÁNEK, P., OTEVŘELOVÁ, D., GRMELA, L., BRÜSTLOVÁ, J., DOBIS, P.

Vydáno

10.02.2005

Nakladatel

Brno University of Technology

Místo

Brno

ISBN

80-214-2793-0

Kniha

Nano´04

Strany od

188

Strany do

193

Strany počet

6

BibTex

@inproceedings{BUT17006,
  author="Pavel {Tománek} and Dana {Otevřelová} and Lubomír {Grmela} and Jitka {Brüstlová} and Pavel {Dobis}",
  title="Local near-field scanning optical microscopy and spectroscopy of nanostructures",
  booktitle="Nano´04",
  year="2005",
  pages="188--193",
  publisher="Brno University of Technology",
  address="Brno",
  isbn="80-214-2793-0"
}