Přístupnostní navigace
E-přihláška
Vyhledávání Vyhledat Zavřít
Detail publikačního výsledku
SEDLÁKOVÁ, V., MELKES, F., GRMELA, L., DOBIS, P., ŠIKULA, J., TACANO, M., ROČAK, D., BELAVIČ, D.
Originální název
The effect of silver diffusion from contact electrode into thick film resistors
Anglický název
Druh
Stať ve sborníku v databázi WoS či Scopus
Originální abstrakt
We investigate the effect of silver diffusion and migration from contact electrode into thick film resistive layer and its influence on resistor stability. Silver diffusion results to the resistive layer conductivity increase in the vicinity of contact. This leads to effective shortening of thick film resistor length and lowering of the electric field intensity near the contact. The noise spectroscopy and third harmonic measurements were used to investigate this effect. Numerical model of current density and electric field distribution was performed to estimate the influence of silver diffusion and migration.
Anglický abstrakt
Klíčová slova v angličtině
Noise, Non-linearity, Thick film
Autoři
Vydáno
01.01.2003
Nakladatel
Electronic Components Institute Internationale Ltd.
Místo
United Kingdom
ISBN
0887-7491
Kniha
CARTS - EUROPE 2003 Proceedings
Strany od
201
Strany počet
4
BibTex
@inproceedings{BUT9064, author="Vlasta {Sedláková} and František {Melkes} and Lubomír {Grmela} and Pavel {Dobis} and Josef {Šikula} and Munecazu {Tacano} and Dubravka {Ročak} and Darko {Belavič}", title="The effect of silver diffusion from contact electrode into thick film resistors", booktitle="CARTS - EUROPE 2003 Proceedings", year="2003", pages="4", publisher="Electronic Components Institute Internationale Ltd.", address="United Kingdom", isbn="0887-7491" }