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2025
KASPAR, P.; ŠIŠKA VIRÁGOVÁ, E.; DALLAEV, R.; PAPEŽ, N.; MACKŮ, R.; GRMELA, L.; ŠIK, O.; SEDLÁK, P.; SOBOLA, D. Structural analysis of imperfections in contacts of graphene chemiresistors. APPLIED SURFACE SCIENCE, 2025, vol. 704, no. 163501, 6 p. ISSN: 1873-5584.Detail
2024
STAROŇ, P.; MACKŮ, R.; SEDLÁK, P.; PAPEŽ, N.; RAMAZANOV, S.; ORUDZHEV, F.; AL-ANBER, M.; SOBOLA, D. Noise Characterization of Graphene Sensors. In International Vacuum Nanoelectronics Conference. NEW YORK: IEEE, 2024. p. 1-2. ISBN: 979-8-3503-7976-1.Detail
STAROŇ, P.; MACKŮ, R.; SEDLÁK, P.; PAPEŽ, N.; ORUDZHEV, F.; AL-ANBER, M.; SOBOLA, D. Contact Interface of Graphene Sensors. In International Vacuum Nanoelectronics Conference. NEW YORK: IEEE, 2024. p. 1-2. ISBN: 979-8-3503-7976-1.Detail
2022
PISARENKO, T.; PAPEŽ, N.; SOBOLA, D.; ŢĂLU, Ş.; ČÁSTKOVÁ, K.; ŠKARVADA, P.; MACKŮ, R.; ŠČASNOVIČ, E.; KAŠTYL, J. Comprehensive characterization of PVDF nanofibers at macro- and nanolevel. Polymers, 2022, vol. 14, no. 3, p. 593-610. ISSN: 2073-4360.Detail
BAROŇ, I.; KOKTAVÝ, P.; MELICHAR, R.; MACKŮ, R.; TRČKA, T.; MATT, R.; JOSEF, S.; BALEK, J.; LUKAŠ, P.; DIENDORFER, G.; ŠKARVADA, P. Differentiating between artificial and natural sources of electromagnetic radiation at a seismogenic fault. ENGINEERING GEOLOGY, 2022, vol. 311, no. 11, p. 1-10. ISSN: 0013-7952.Detail
2021
RAMAZANOV, S.; ŢĂLU, Ş.; SOBOLA, D.; ORUDZHEV, F.; RAMAZANOV, G.; SELIMOV, D.; KASPAR, P.; MACKŮ, R.; NAZAROV, A. Crack resistance of bismuth ferrite films obtained on a flexible substrate. In E3S Web Conf. Volume 295, 2021 International Scientific Forum on Sustainable Development and Innovation (WFSDI 2021). E3S Web of Conferences. EDP Sciences, 2021. no. 1, p. 1-8. ISSN: 2267-1242.Detail
ČERNOHORSKÝ, P.; PISARENKO, T.; PAPEŽ, N.; SOBOLA, D.; ŢĂLU, Ş.; ČÁSTKOVÁ, K.; KAŠTYL, J.; MACKŮ, R.; ŠKARVADA, P.; SEDLÁK, P. Structure Tuning and Electrical Properties of Mixed PVDF and Nylon Nanofibers. Materials, 2021, vol. 14, no. 20, p. 1-20. ISSN: 1996-1944.Detail
2020
SEDLÁK, P.; KUBERSKÝ, P.; GAJDOŠ, A.; MAJZNER, J.; SEDLÁKOVÁ, V.; MACKŮ, R.; HOLCMAN, V. Effect of the Different Crystallinity of Ionic Liquid Based Solid Polymer Electrolyte on the Performance of Amperometric Gas Sensor. Engineering Proceedings, 2020, vol. 2, no. 1, p. 1-5. ISSN: 2673-4591.Detail
SEDLÁK, P.; GAJDOŠ, A.; MACKŮ, R.; MAJZNER, J.; HOLCMAN, V.; SEDLÁKOVÁ, V.; KUBERSKÝ, P. The effect of thermal treatment on ac/dc conductivity and current fluctuations of PVDF/NMP/[EMIM][TFSI] solid polymer electrolyte. Scientific Reports, 2020, vol. 10, no. 1, p. 1-12. ISSN: 2045-2322.Detail
PAPEŽ, N.; DALLAEV, R.; SOBOLA, D.; MACKŮ, R.; ŠKARVADA, P. Microstructural investigation of defects in photovoltaic cells by the electron beam-induced current method. In Procedia Structural Integrity. Procedia Structural Integrity. Elsevier, 2020. no. 1, p. 595-600. ISSN: 2452-3216.Detail
PAPEŽ, N.; GAJDOŠ, A.; SOBOLA, D.; DALLAEV, R.; ŠKARVADA, P.; MACKŮ, R.; GRMELA, L. Effect of gamma radiation on properties and performance of GaAs based solar cells. APPLIED SURFACE SCIENCE, 2020, vol. 527, no. 146766, p. 135-146. ISSN: 0169-4332.Detail
2018
ŠKVARENINA, Ľ.; MACKŮ, R. Noise and optical spectroscopy of single junction silicon solar cell. Metrology and Measurement Systems, 2018, vol. 25, no. 2, p. 303-316. ISSN: 0860-8229.Detail
BAI, Y.; TOFEL, P.; HADAŠ, Z.; SMILEK, J.; LOŠÁK, P.; ŠKARVADA, P.; MACKŮ, R. Investigation of a cantilever structured piezoelectric energy harvester used for wearable devices with random vibration input. MECHANICAL SYSTEMS AND SIGNAL PROCESSING, 2018, vol. 106, no. 106, p. 303-318. ISSN: 0888-3270.Detail
RUBEŠ, O.; TOFEL, P.; MACKŮ, R.; ŠKARVADA, P.; KŠICA, F.; HADAŠ, Z. Piezoelectric Micro-fiber Composite Structure for Sensing and Energy Harvesting Applications. In Proceedings of the 2018 18th International Conference on Mechatronics – Mechatronika (ME). 1. Brno: Brno University of Technolgy, 2018, 2018. p. 344-349. ISBN: 978-80-214-5543-6.Detail
GAJDOŠ, A.; ŠKARVADA, P.; MACKŮ, R.; PAPEŽ, N.; ŠKVARENINA, Ľ.; SOBOLA, D. Isolation and optoelectronic characterization of Si solar cells microstructure defects. Journal of Physics: Conference Series, 2018, vol. 1124, no. 4, p. 1-6. ISSN: 1742-6596.Detail
PAPEŽ, N.; SOBOLA, D.; GAJDOŠ, A.; ŠKVARENINA, Ľ.; MACKŮ, R.; ELIÁŠ, M.; NEBOJSA, A.; MOTÚZ, R. Surface morphology after reactive ion etching of silicon and gallium arsenide based solar cells. Journal of Physics: Conference Series, 2018, vol. 1124, no. 4, p. 165-171. ISSN: 1742-6596.Detail
2017
ŠKARVADA, P.; MACKŮ, R.; ŠKVARENINA, Ľ. Investigation of Defects at Cu(In,Ga)Se2 Flexible Solar Cells on Macroscopic and Microscopic Level and their Influence on Solar Cell Performance. Solid State Phenomena, 2017, vol. 258, no. 1, p. 469-473. ISSN: 1662-9779.Detail
ŠKVARENINA, Ľ.; MACKŮ, R. Application of electrical measurements to investigation of solar cell microstructure defects. Solid State Phenomena, 2017, vol. 258, no. 8, p. 473-476. ISSN: 1662-9779.Detail
ŠKVARENINA, Ľ.; MACKŮ, R.; ŠKARVADA, P.; GAJDOŠ, A.; ŠIKULA, J. Noise fluctuation changes related to edge deletion of thin-film Cu(In,Ga)Se2 solar cells. In 2017 International Conference on Noise and Fluctuations (ICNF). Proceedings of a meeting held 20-23 June 2017, Vilnius, Lithuania: Institute of Electrical and Electronics Engineers ( IEEE ), 2017. p. 1-4. ISBN: 978-1-5090-2761-3.Detail
GAJDOŠ, A.; ŠKVARENINA, Ľ.; ŠKARVADA, P.; MACKŮ, R. Microscale localization and isolation of light emitting imperfections in monocrystalline silicon solar cells. In Photonics, Devices, and Systems VII. Proceedings of SPIE. Bellingham, Washington 98227-0010 USA: SPIE, 2017. p. 1-6. ISBN: 9781510617025. ISSN: 0277-786X.Detail
TRČKA, T.; MACKŮ, R.; KOKTAVÝ, P.; ŠKARVADA, P.; BAROŇ, I.; STEMBERK, J. Field Measurement of Natural Electromagnetic Emissions near the Active Tectonic and Mass-Movement Fractures in Caves. Solid State Phenomena, 2017, vol. 258, no. 1, p. 460-464. ISSN: 1662-9779.Detail
ŠKVARENINA, Ľ.; GAJDOŠ, A.; MACKŮ, R.; ŠKARVADA, P. Detection of microstructural defects in chalcopyrite Cu(In,Ga)Se2 solar cells by spectrally-filtered electroluminescence. In Photonics, Devices, and Systems VII. Proceedings of SPIE. Bellingham, Washington 98227-0010 USA: SPIE, 2017. p. 1-7. ISBN: 9781510617025. ISSN: 0277-786X.Detail
GAJDOŠ, A.; ŠKVARENINA, Ľ.; PAPEŽ, N.; ŠKARVADA, P.; MACKŮ, R. Advanced methods for localization and isolation of surface defects in monocrystalline silicon solar cells. Progress in Applied Surface, Interface and Thin Film Science - Solar Renewable Energy News 2017. Bratislava: Comenius University, 2017. p. 42-42. ISBN: 978-80-223-4411-1.Detail
ČAIROVIĆ, D.; ZLÁMAL, M.; ŠTĚPÁNEK, P.; TRČKA, T.; ŠKARVADA, P.; MACKŮ, R. DETERMINATION OF SURFACE ROUGHNESS PARAMETERS BY OPTICAL PROFILOMETRY AND SAND PATCH TEST. Solid State Phenomena, 2017, no. 259, p. 15-20. ISSN: 1012-0394.Detail
2016
ŠKARVADA, P.; ŠKVARENINA, Ľ.; TOMÁNEK, P.; SOBOLA, D.; MACKŮ, R.; BRÜSTLOVÁ, J.; GRMELA, L.; SMITH, S. Multiscale experimental characterization of solar cell defects. In 20th Slovak - Czech - Polish Optical Conference On Wave and Quantum Aspects of Contemporary Optics. Proceedings of SPIE. SPIE Proceedings. Bellingham, USA: SPIE, 2016. no. 10142, p. 101420U1 (101420U7 p.)ISBN: 9781510607330. ISSN: 0277-786X.Detail
ČAIROVIĆ, D.; ZLÁMAL, M.; ŠTĚPÁNEK, P.; TRČKA, T.; ŠKARVADA, P.; MACKŮ, R. DETERMINATION OF SURFACE ROUGHNESS PARAMETERS BY OPTICAL PROFILOMETRY AND SAND PATCH TEST. In 23. Betonářské dny (2016) Sborník. Litomyšl: 2016. p. 1-6. ISBN: 978-80-906097-6-1.Detail
2015
TOMÁNEK, P.; ŠKARVADA, P.; MACKŮ, R.; SOBOLA, D.; BRÜSTLOVÁ, J.; GRMELA, L. Microscale localization and detection of defects in crystalline silicon solar cells. DGaO-PROCEEDINGS, 2015, vol. 2015, no. 2015, p. 1-2. ISSN: 1614-8436.Detail
SEDLÁK, P.; KUBERSKÝ, P.; MAJZNER, J.; NEŠPŮREK, S.; ŠIKULA, J.; MACKŮ, R.; ŠKARVADA, P.; SEDLÁKOVÁ, V.; HAMÁČEK, A. Investigation of adsorption-desorption phenomenon by using current fluctuations of amperometric NO2 gas sensor. In Noise and Fluctuations (ICNF). IEEE, 2015. p. 1-4. ISBN: 978-1-4673-8335-6.Detail
MACKŮ, R.; KOKTAVÝ, P.; TRČKA, T. Anatomy of Excess Noise Sources and Electromagnetic Emission During Loading of Fibre Reinforced Composites. In Proceedings of the 4th International Conference of Engineering Against Failure. 2015. p. 511-518. ISBN: 978-960-88104-5-7.Detail
ŠKARVADA, P.; ŠKVARENINA, Ľ.; SOBOLA, D.; MACKŮ, R.; TOMÁNEK, P.; GRMELA, L. Multiscale characterization of solar cells. In Progress in Applied Surface, Interface and Thin-film Science 2015. Bratislava, Slovensko: Comenius University, 2015. p. 148-151. ISBN: 978-80-223-3975-9.Detail
ŠKARVADA, P.; MACKŮ, R.; DALLAEVA, D.; SEDLÁK, P.; GRMELA, L.; TOMÁNEK, P. SEM and AFM imaging of solar cells defects. Proceedings of SPIE, 2015, vol. 9450, no. 9450, p. 1-6. ISSN: 0277-786X.Detail
MACKŮ, R.; KOKTAVÝ, P.; SEDLÁK, P.; SMULKO, J.; TRAWKA, M. Analytical fluctuation enhanced sensing by resistive gas sensors. SENSORS AND ACTUATORS B-CHEMICAL, 2015, vol. 2015, no. 213, p. 390-396. ISSN: 0925-4005.Detail
2014
MACKŮ, R.; ŠICNER, J.; KOKTAVÝ, P.; TRČKA, T. Fracture related electromagnetic emission measurement and excess noise analysis of reinforced composites. Procedia Materials Science, 2014, vol. 2014, no. 3, p. 116-121. ISSN: 2211-8128.Detail
MACKŮ, R.; ŠICNER, J.; HOLCMAN, V.; KOKTAVÝ, P. Mechanical Induced Defects and Fractures in the Silicon Solar Cell Structure. Key Engineering Materials (print), 2014, vol. 592-593, no. 1, p. 533-536. ISSN: 1013-9826.Detail
ŠKARVADA, P.; TOMÁNEK, P.; KOKTAVÝ, P.; MACKŮ, R.; ŠICNER, J.; VONDRA, M.; DALLAEVA, D.; SMITH, S.; GRMELA, L. A variety of microstructural defects in crystalline silicon solar cells. APPLIED SURFACE SCIENCE, 2014, vol. 312, no. 312, p. 50-56. ISSN: 0169-4332.Detail
TRČKA, T.; LÁNÍK, J.; MACKŮ, R. Comparing the Properties of Polypropylene Fibers Contained in Ordinary and Lightweight Concrete Using Three-Point Bending Tests with Stress Concentrator and Acoustic Emission Method. Key Engineering Materials (print), 2014, roč. 592-593, č. 1, s. 537-540. ISSN: 1013-9826.Detail
ŠICNER, J.; ŠKARVADA, P.; MACKŮ, R.; KOKTAVÝ, P. Study of the Influence of Structural Defects on Properties of Silicon Solar Cells. Key Engineering Materials (print), 2014, vol. 592-593, no. 1, p. 449-452. ISSN: 1013-9826.Detail
MACKŮ, R.; TRČKA, T.; HOLCMAN, V.; KOKTAVÝ, P. Experimental Studies of Excess Noise Sources in Concrete Based Materials as a Limiting Factor for Electromagnetic Emission Measurement. Key Engineering Materials (print), 2014, vol. 592-593, no. 1, p. 529-532. ISSN: 1013-9826.Detail
2013
MACKŮ, R.; KOKTAVÝ, P.; TRČKA, T.; ŠICNER, J.; HOLCMAN, V.; SADOVSKÝ, P. Analysis of excess noise sources in concrete composite materials and impact on electromagnetic emission measurement. In 2013 22nd International Conference on Noise and Fluctuations (ICNF), IEEE Catalog Number CFP1392N-USB. Montpellier: 2013. p. Th-P-12-1 (Th-P-12-4 p.)ISBN: 978-1-4799-0670-3.Detail
ŠKARVADA, P.; KOKTAVÝ, P.; SMITH, S.; MACKŮ, R.; ŠICNER, J.; VONDRA, M.; DALLAEVA, D.; TOMÁNEK, P.; GRMELA, L. Microstructure defects in silicon solar cells. In Proceedings of 8th Solid state surfaces and intefaces. 1. Bratislava: Comenius University Bratislava, 2013. p. 168-169. ISBN: 978-80-223-3501-0.Detail
ŠICNER, J.; MACKŮ, R.; KOKTAVÝ, P.; HOLCMAN, V. Noise and Local Diagnostics of Laser Notches on Silicon Solar Cells. In 2013 22nd International Conference on Noise and Fluctuations (ICNF), IEEE Catalog Number CFP1392N-USB. Montpellier: 2013. p. 1-4. ISBN: 978-1-4799-0670-3.Detail
MACKŮ, R.; KOKTAVÝ, P.; ŠICNER, J.; HOLCMAN, V. Mechanical Induced Defects and Fractures in the Silicon Solar Cell Structure. Brno: VUTIUM, 2013. p. 216-216. ISBN: 978-80-214-4739-4.Detail
ŠKARVADA, P.; MACKŮ, R.; DALLAEVA, D.; PROKOPYEVA, E.; TOMÁNEK, P.; GRMELA, L.; SMITH, S. Optical and electrical detection and localization of solar cell defects on microscale. Proceedings of SPIE, 2013, vol. 8825, no. 8825, p. 8825071-88255077. ISSN: 0277-786X.Detail
ŠKARVADA, P.; TOMÁNEK, P.; GRMELA, L.; TOFEL, P.; ŠEVČÍK, M.; MACKŮ, R. Fluctuations of ultrasonic transducer vibration measurement. In 2013 22nd International Conference on Noise and Fluctuations (ICNF), IEEE Catalog Number CFP1392N-USB. Montpellier: 2013. p. Th-P-48-1 (Th-P-48-4 p.)ISBN: 978-1-4799-0670-3.Detail
TOMÁNEK, P.; ŠKARVADA, P.; DALLAEVA, D.; GRMELA, L.; MACKŮ, R.; SMITH, S. Cold field emission electrode as a local probe of proximal microscopes-Investigation of defects in monocrystalline silicon solar cells. World Journal of Engineering, 2013, vol. 10, no. 2, p. 119-124. ISSN: 1708-5284.Detail
MACKŮ, R.; KOKTAVÝ, P.; TRČKA, T.; HOLCMAN, V. Experimental Studies of Excess Noise Sources in Concrete Based Materials as a Limiting Factor for Electromagnetic Emission Measurement. Brno: VUTIUM, 2013. p. 215-215. ISBN: 978-80-214-4739-4.Detail
2012
MACKŮ, R.; ŠICNER, J.; DALLAEVA, D. An Experimentally Based Characterization of Solar Cell Structure Defects by Means of Noise and Optical Activities Analysis. In Fracture Mechanics for Durability, Reliability and Safety. Kazaň: Research Center for power engineering progblems of the russian academy of sciences, 2012. p. 499-506. ISBN: 978-5-905576-18-8.Detail
MACKŮ, R. Analýza fluktuačních procesů v solárních článcích. Brno: VUT v Brně, 2012. 173 s.Detail
MACKŮ, R.; ŠICNER, J.; KOKTAVÝ, P. ELECTRIC MODEL OF REVERSE-BIASED SILICON SOLAR CELLS. In New Trends in Physics. 1. Brno: Litera Brno, 2012. p. 65-68. ISBN: 978-80-214-4594-9.Detail
MACKŮ, R.; KOKTAVÝ, P. MĚŘENÍ KVANTOVÉ ÚČINNOSTI PRO NEDESTRUKTIVNÍ DIAGNOSTIKU n+p SOLÁRNÍCH ČLÁNKŮ. Slaboproudý obzor, 2012, roč. 70, č. 2, s. 6-10. ISSN: 0037-668X.Detail
ŠICNER, J.; MACKŮ, R.; KOKTAVÝ, P. MICRO - SIZED LOCAL DEFECTS ON THE EDGE OF SILICON SOLAR CELLS AND THEIR OPTICAL AND THERMAL CHARACTERISTICS. In New trends in physics Proceedings of the conference. Brno: Litera, 2012. p. 73-76. ISBN: 978-80-214-4594-9.Detail
BOGATYREVA, N.; MACKŮ, R. Non-destructive Characterization of Micro-sized Defects in the Solar Cell Structure. In Fracture mechanics for Durability, Reliability and Safety. Kazaň: 2012. p. 564-571. ISBN: 978-5-905576-18-8.Detail
TOMÁNEK, P.; ŠKARVADA, P.; GRMELA, L.; MACKŮ, R.; SMITH, S. Local investigation of defects in monocrystalline silicon solar cells. Conference Record of the IEEE Photovoltaic Specialists Conference, 2012, vol. 2012, no. 1, p. 1686-1690. ISSN: 0160-8371.Detail
MACKŮ, R.; KOKTAVÝ, P.; ŠICNER, J. Investigation of solar cell performance studied by local breakdowns and related noise. In Electronic Devices ans Systems 2012. 1. Brno: VUT v Brně, 2012. p. 267-272. ISBN: 978-80-214-4539-0.Detail
ŠICNER, J.; KOKTAVÝ, P.; MACKŮ, R. MICRO-SIZED LOCAL DEFECTS ON THE EDGES OF SILICON SOLAR CELLS. In Electronic Devices and Systems IMAPS CS International Conference 2012. 1. Brno: LITERA, 2012. p. 95-100. ISBN: 978-80-214-4539-0.Detail
MACKŮ, R.; ŠICNER, J.; KOKTAVÝ, P. INVESTIGATION OF SOLAR CELL PERFORMANCE STUDIED BY LOCAL BREAKDOWNS AND RELATED NOISE. In Electronic Devices and Systems EDS 2012. 1. Brno: Litera Brno, 2012. p. 267-272. ISBN: 978-80-214-4594-9.Detail
GRMELA, L.; ŠKARVADA, P.; TOMÁNEK, P.; MACKŮ, R.; SMITH, S. Local investigation of thermal dependence of light emission from reverse-biased monocrystalline silicon solar cells. SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2012, vol. 96, no. 1, p. 108-111. ISSN: 0927-0248.Detail
MACKŮ, R.; KOKTAVÝ, P.; ŠICNER, J. COMPREHENSIVE STUDY OF SOLAR CELL STRUCTURE DEFECTS BY MEANS OF NOISE AND LIGHT EMISSION ANALYSIS. Advances in Electrical and Electronic Engineering, 2012, vol. 10, no. 2, p. 6-11. ISSN: 1804-3119.Detail
2011
GRMELA, L.; ŠKARVADA, P.; MACKŮ, R.; TOMÁNEK, P. Near-field Detection and Localization of Defects in Monocrystalline Silicon Solar Cell. Inventi Rapid: Energy & Power, 2011, vol. 2011, no. 2, p. 1-4. ISSN: 2229-7774.Detail
KOKTAVÝ, P.; MACKŮ, R. Noise and Optical Activities of Local Defects in Solar Cells pn Junctions. In ICNF2011: 2011 21st International Conference on Noise and Fluctuations. 1. Toronto, Kanada: IEEE, 2011. p. 409-412. ISBN: 978-1-4577-0191-7.Detail
PARAČKA, P.; KOKTAVÝ, P.; MACKŮ, R. PN junction defects detection in solar cells using noise diagnostics. Key Engineering Materials (print), 2011, vol. 465, no. 1, p. 359-362. ISSN: 1013-9826.Detail
MACKŮ, R.; KOKTAVÝ, P. Impact of Local Defects on Photon Emission, Electric Current Fluctuation and Reliability of Silicon Solar Cells Studied by Electro-Optical Methods. ElectroScope - http://www.electroscope.zcu.cz, 2011, vol. 2011, no. 2, p. 38-43. ISSN: 1802-4564.Detail
MACKŮ, R.; KOKTAVÝ, P.; ŠKARVADA, P. Non-destructive Characterization of Micro-sized Defects in the Solar Cell Structure. Key Engineering Materials (print), 2011, vol. 465, no. 1, p. 314-317. ISSN: 1013-9826.Detail
MACKŮ, R.; TOMÁNEK, P.; KOKTAVÝ, P. Investigation of the photon emission from the p-n junction of silicon solar cells studied by electro-optical methods. Proceedings of SPIE, 2011, vol. 8036, no. 8306, p. 1I1 (1I6 p.)ISSN: 0277-786X.Detail
MACKŮ, R. Analysis of photon emision from silicon solar cells and correlation with microplasma noise. In proceedings of the 17th conference student eeict 2011 vol. 3. Brno: Novpress, 2011. p. 417-421. ISBN: 978-80-214-4273-3.Detail
2010
MACKŮ, R.; KOKTAVÝ, P. Analysis of fluctuation processes in forward-biased solar cells using noise spectroscopy. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2010, vol. 207, no. 10, p. 2387-2394. ISSN: 1862-6319.Detail
TOMÁNEK, P.; ŠKARVADA, P.; MACKŮ, R.; GRMELA, L. Detection and localization of defects in monocrystalline silicon solar cell. Advances in Optical Technologies, 2010, vol. 2010, no. 805325, p. 8053251-8053255. ISSN: 1687-6393.Detail
MACKŮ, R. Semi-numerical simulation of silicon solar cells junction geometry using C-U profiling techniques. In proceedings of the 16th conference student eeict 2010 vol. 5. Brno: Novpress, 2010. p. 217-221. ISBN: 978-80-214-4080-7.Detail
ŠKARVADA, P.; TOMANEK, P.; MACKŮ, R. Characterization of Si Solar Cells Imperfections in the Near-Field. In 25th European Photovoltaic Solar Energy Conference (id 18618). Valencia: WIP - Renewable Energies, 2010. p. 351-354. ISBN: 3-936338-26-4.Detail
MACKŮ, R.; KOKTAVÝ, P.; ŠKARVADA, P. Innovative electric model of n+p silicon solar cells. In Proceedings of 24rd European Photovoltaic Solar Energy Conference. WIP-Renewable Energies, 2010. p. 439-443. ISBN: 3-936338-24-8.Detail
ŠKARVADA, P.; TOMÁNEK, P.; KOKTAVÝ, P.; MACKŮ, R. Light emission from silicon solar cells as characterization technique. In 2010 9th International Conference on Environment and Electrical Engineering. Wroclaw: Reprotechnika Wroclaw, 2010. p. 97-100. ISBN: 978-1-4244-5371-9.Detail
MACKŮ, R.; KOKTAVÝ, P. Excess Reverse Current Modeling of Single Junction Si Solar Cells and Transistor n+pn+ Structure Effect. In 2010 9th International Conference on Environment end Electrical engineerong. Wroclaw: Reprotechnika Wroclaw, 2010. p. 18-21. ISBN: 978-1-4244-5374-0.Detail
MACKŮ, R.; KOKTAVÝ, P. On the determination of silicon solar cell properties based on capacitance characteristics measurement. In Electronic Devices and Systems, IMAPS CS International Conference 2010. 1. Brno: Novpress, 2010. p. 202-208. ISBN: 978-80-214-4138-5.Detail
MACKŮ, R.; KOKTAVÝ, P.; ŠKARVADA, P. Non-destructive Characterization of Micro-sized Defects in the Solar Cell Structure. Materials Structure & Micromechanics of Fracture - Abstract Booklet. 1. Brno: Vutium, 2010. p. 169-169. ISBN: 978-80-214-4112-5.Detail
MACKŮ, R.; KOKTAVÝ, P. Improved electrical characterization of silicon solar cells based on noise spectroscopy in forward direction. In Proceedings of 24rd European Photovoltaic Solar Energy Conference. WIP-Renewable Energies, 2010. p. 484-488. ISBN: 3-936338-24-8.Detail
2009
ŠKARVADA, P.; MACKŮ, R.; KOKTAVÝ, P.; RAŠKA, M. Noise of Reverse Biased Solar Cells. In Noise and Fluctuations ICNF2009. AIP conference proceedings. U.S.A.: American Institute of Physics, 2009. no. 1, p. 391-394. ISBN: 978-0-7354-0665-0. ISSN: 0094-243X.Detail
MACKŮ, R.; KOKTAVÝ, P. Určení koncentračních profilů v solárních článcích. In Sborník příspěvků konference KRÁLÍKY 2009. Brno: FEKT VUT v Brně, 2009. s. 168-171. ISBN: 978-80-214-3938-2.Detail
SADOVSKÝ, P.; MACKŮ, R. Human Sleep EEG Stochastic Artefact Analysis. AIP conference proceedings, 2009, vol. 1129, no. 1, p. 549-552. ISSN: 0094-243X.Detail
ŠKARVADA, P.; TOMÁNEK, P.; MACKŮ, R. Near-field photoelectric measurement of Si solar cells. In 24th European Photovoltaic Solar Energy Conference Proceedings. Hamburg, Germany: 2009. p. 480-483. ISBN: 3-936338-25-6.Detail
MACKŮ, R. Extended electrical and thermal properties of single junction silicon solar cells. In Proceedings of the 15th conference Student EEICT 2009. Brno: VUT v Brně, 2009. p. 208-212. ISBN: 978-80-214-3869-9.Detail
MACKŮ, R.; KOKTAVÝ, P. Využití měření CU charakteristik pro určení geometrie a polohy pn přechodů křemíkových solárních článků. Jemná mechanika a optika, 2009, roč. 2009, č. 10, s. 291-293. ISSN: 0447-6441.Detail
MACKŮ, R.; KOKTAVÝ, P.; ŠKARVADA, P.; RAŠKA, M.; SADOVSKÝ, P. Diagnostics of Forward Biased Silicon Solar Cells Using Noise Spectroscopy. In Noise and Fluctuations, ICNF 2009. AIP conference proceedings. U.S.A.: American Institute of Physics, 2009. no. 1, p. 145-148. ISBN: 978-0-7354-0665-0. ISSN: 0094-243X.Detail
2008
MACKŮ, R.; ŠKARVADA, P.; KOKTAVÝ, P. On the determination of silicon solar cell properties via capacitance characteristics. In Proceedings of 23rd European Photovoltaic Solar Energy Conference. Valencia, Spain: WIP-Renewable Energies, 2008. p. 364-369. ISBN: 3-936338-24-8.Detail
MACKŮ, R.; KOKTAVÝ, P. Stanovení transportních a elektrických charakteristik solárních článků. Slaboproudý obzor, 2008, roč. 64, č. 3-4, s. 14-18. ISSN: 0037-668X.Detail
MACKŮ, R. Diagnostics of solar cells in spectral domain. In Proceedings of the 14th conference Student EEICT 2008. Brno: VUT v Brně, 2008. p. 366-369. ISBN: 978-80-214-3617-6.Detail
KOKTAVÝ, P.; MACKŮ, R.; PARAČKA, P.; KRČÁL, O. Microplasma noise as a tool for PN junctions diagnostics. WSEAS Transactions on Electronics, 2008, vol. 4, no. 9, p. 186-191. ISSN: 1109-9445.Detail
MACKŮ, R.; KOKTAVÝ, P. Study of solar cells defects via noise measurement. In Reliability and Life-time Prediction Conference Proceedings. Hungary, Budapest: Mesterprint Printinghouse Ltd., 2008. p. 96-100. ISBN: 978-963-06-4915-5.Detail
MACKŮ, R.; KOKTAVÝ, P.; ŠKARVADA, P. Study of solar cells I-V chracteristics behaviour in wide range of temperature. In Electronic Devices and Systems EDS08. Brno: Brno University of Technology, 2008. p. 120-125. ISBN: 978-80-214-3717-3.Detail
MACKŮ, R.; KOKTAVÝ, P.; ŠKARVADA, P. Advanced non-destructive diagnostics of monocrystalline silicon solar cells. WSEAS Transactions on Electronics, 2008, vol. 4, no. 9, p. 192-197. ISSN: 1109-9445.Detail
ŠKARVADA, P.; TOMÁNEK, P.; MACKŮ, R. Study of local properties of silicon solar cells. In Proceeding of 23rd European Photovoltaic Solar Energy Conference. Valencia Spain: WIP - Renewable Energies, 2008. p. 1644-1647. ISBN: 3-936338-24-8.Detail
GRMELA, L.; MACKŮ, R.; TOMÁNEK, P. Near-field measurement of ZnS:Mn nanocrystal and bulk thin-film electroluminescent devices. JOURNAL OF MICROSCOPY, 2008, vol. 229, no. 2, p. 275-280. ISSN: 0022-2720.Detail
MACKŮ, R.; KOKTAVÝ, P.; ŠKARVADA, P. Charakterizace lokálních defektů solárních článků. In Non-destructive testing in engineering practice. -. Brno: Brno University of Technology, 2008. s. 74-77. ISBN: 978-80-7204-610-2.Detail
MACKŮ, R.; KOKTAVÝ, P.; ŠKARVADA, P. Nedestruktivní testování křemíkových solárních článků založené na šumové spektroskopii. In Sborník příspěvků ze 3. České fotovoltaické konference. Rožnov pod Radhoštěm: Czech RE Agency, 2008. s. 123-127. ISBN: 978-80-254-3528-1.Detail
ŠKARVADA, P.; TOMÁNEK, P.; MACKŮ, R. Elektrická odezva solárních článků v mikroskopickém měřítku. In Sborník příspěvků ze 3. České fotovoltaické konerence. Rožnov pod Radhoštěm: Czech RE Agency, 2008. s. 132-136. ISBN: 978-80-254-3528-1.Detail
2007
MACKŮ, R.; KOKTAVÝ, P.; ŠKARVADA, P. Metodika měření šumu solárních článků. In Elektronika a informatika 2007. -. Plzeň: Západočeská univerzita v Plzni, 2007. s. 45-48. ISBN: 978-80-7043-572-4.Detail
KOKTAVÝ, P.; KOKTAVÝ, B.; MACKŮ, R.; SADOVSKÝ, P. Noise diagnostics of local defects in solar cells. In Proc. of EDS IMAPS CS 2007. Brno: IMAPS CS, 2007. p. 409-413. ISBN: 978-80-214-3470-7.Detail
ŠKARVADA, P.; MACKŮ, R. SNOM fotoluminiscence a topografické měření kvantových teček InAs/GaAs. In Elektrotechnika a informatika 2007. Plzeň: Západočeská universita, 2007. s. 105-108. ISBN: 978-80-7043-572-4.Detail
MACKŮ, R.; KOKTAVÝ, P. Device for statistical characteristics of microplasma noise measurment. In New trends in physics. -. Brno: Z. Novotný, Ing., CSc., 2007. p. 90-93. ISBN: 978-80-7355-078-3.Detail
ŠKARVADA, P.; TOMÁNEK, P.; MACKŮ, R. Skenování materiálů lokální optickou sondou v blízkém poli. In 5th Workshop NDT 2007. Non-destructive testing in engineering practice. Brno: Brno University of Technology, 2007. s. 150-154. ISBN: 978-80-7204-549-5.Detail
MACKŮ, R.; KOKTAVÝ, P.; ŠKARVADA, P. Šum mikroplazmatu solárních článků. In 5th Workshop NDT 2007, Non-destructive testing in engineering practise. Brno: Brno University of Technology, 2007. s. 71-75. ISBN: 978-80-7204-549-5.Detail
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