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Detail publikačního výsledku
ŠICNER, J.; MACKŮ, R.; KOKTAVÝ, P.
Originální název
MICRO - SIZED LOCAL DEFECTS ON THE EDGE OF SILICON SOLAR CELLS AND THEIR OPTICAL AND THERMAL CHARACTERISTICS
Anglický název
Druh
Stať ve sborníku v databázi WoS či Scopus
Originální abstrakt
This article deals with local defects (fractures) on edges of silicon solar cells. We observed a particular type of structural defects by an electron microscope. These defects can be regarded as surface texturization breaks. Specimens including this type of local defects have been put under investigation. We study weak radiation generated from reverse-biased defect active area by means of a photomultiplier and a scientific CCD camera. This approach proves to be useful to measure micro-scale surface imperfections and fractures. We also focused on thermal degradation in stressed regions. To this aim we used an infrared camera and it turns out that temperature degradation could affect larger regions compared to micro-scale defects.
Anglický abstrakt
Klíčová slova
solar cell, local defect, fractured surface, CCD camera
Klíčová slova v angličtině
Autoři
Rok RIV
2013
Vydáno
11.10.2012
Nakladatel
Litera
Místo
Brno
ISBN
978-80-214-4594-9
Kniha
New trends in physics Proceedings of the conference
Strany od
73
Strany do
76
Strany počet
4
BibTex
@inproceedings{BUT95958, author="Jiří {Šicner} and Robert {Macků} and Pavel {Koktavý}", title="MICRO - SIZED LOCAL DEFECTS ON THE EDGE OF SILICON SOLAR CELLS AND THEIR OPTICAL AND THERMAL CHARACTERISTICS", booktitle="New trends in physics Proceedings of the conference", year="2012", number="1", pages="73--76", publisher="Litera", address="Brno", isbn="978-80-214-4594-9" }