Detail publikačního výsledku

Microstructural investigation of defects in photovoltaic cells by the electron beam-induced current method

PAPEŽ, N.; DALLAEV, R.; SOBOLA, D.; MACKŮ, R.; ŠKARVADA, P.

Originální název

Microstructural investigation of defects in photovoltaic cells by the electron beam-induced current method

Anglický název

Microstructural investigation of defects in photovoltaic cells by the electron beam-induced current method

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

This work aims to clarify the application of electron beam-induced current (EBIC) method for the morphological analysis and detection of local defects and impurities in semiconductor structures such as solar cells. One of the advantages of this method is to observe a leakage path and microplasma sites with nanometer resolution. This technique allows to precisely locate the affected area and determine the type of defect that cannot be commonly characterized with sufficient accuracy. Simultaneously, a focused ion beam could be used to determine junction by milling of the samples at the area of interest. The evaluation results of experimental measurement using these techniques on photovoltaic cells illustrates the applicability and importance of the EBIC method.

Anglický abstrakt

This work aims to clarify the application of electron beam-induced current (EBIC) method for the morphological analysis and detection of local defects and impurities in semiconductor structures such as solar cells. One of the advantages of this method is to observe a leakage path and microplasma sites with nanometer resolution. This technique allows to precisely locate the affected area and determine the type of defect that cannot be commonly characterized with sufficient accuracy. Simultaneously, a focused ion beam could be used to determine junction by milling of the samples at the area of interest. The evaluation results of experimental measurement using these techniques on photovoltaic cells illustrates the applicability and importance of the EBIC method.

Klíčová slova

ebic; structural analysis; solar cells; defects

Klíčová slova v angličtině

ebic; structural analysis; solar cells; defects

Autoři

PAPEŽ, N.; DALLAEV, R.; SOBOLA, D.; MACKŮ, R.; ŠKARVADA, P.

Rok RIV

2021

Vydáno

19.02.2020

Nakladatel

Elsevier

Kniha

Procedia Structural Integrity

ISSN

2452-3216

Periodikum

Procedia Structural Integrity

Svazek

23

Číslo

1

Stát

Nizozemsko

Strany od

595

Strany do

600

Strany počet

6

URL

https://www.sciencedirect.com/science/article/pii/S2452321620302183

Plný text v Digitální knihovně

http://hdl.handle.net/11012/193483

BibTex

@inproceedings{BUT161694,
  author="Nikola {Papež} and Rashid {Dallaev} and Dinara {Sobola} and Robert {Macků} and Pavel {Škarvada}",
  title="Microstructural investigation of defects in photovoltaic cells by the electron beam-induced current method",
  booktitle="Procedia Structural Integrity",
  year="2020",
  journal="Procedia Structural Integrity",
  volume="23",
  number="1",
  pages="595--600",
  publisher="Elsevier",
  doi="10.1016/j.prostr.2020.01.151",
  url="https://www.sciencedirect.com/science/article/pii/S2452321620302183"
}