Detail publikačního výsledku

Detection of microstructural defects in chalcopyrite Cu(In,Ga)Se2 solar cells by spectrally-filtered electroluminescence

ŠKVARENINA, Ľ.; GAJDOŠ, A.; MACKŮ, R.; ŠKARVADA, P.

Originální název

Detection of microstructural defects in chalcopyrite Cu(In,Ga)Se2 solar cells by spectrally-filtered electroluminescence

Anglický název

Detection of microstructural defects in chalcopyrite Cu(In,Ga)Se2 solar cells by spectrally-filtered electroluminescence

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

The aim of this research is to detect and localize microstructural defects by using an electrically excited light emission from a forward/reverse-bias stressed pn-junction in thin-film Cu(In; Ga)Se2 solar cells with metal wrap through architecture. A different origin of the local light emission from intrinsic/extrinsic imperfections in these chalcopyrite-based solar cells can be distinguished by a spectrally-filtered electroluminescence mapping. After a light emission mapping and localization of the defects in a macro scale is performed a micro scale exploration of the solar cell surface by a scanning electron microscope which follows the particular defects obtained by an electroluminescence. In particular, these macroscopic/microscopic examinations are performed independently, then the searching of the corresponding defects in the micro scale is rather difficult due to a diffused light emission obtained from the macro scale localization. Some of the defects accompanied by a highly intense light emission very often lead to a strong local overheating. Therefore, the lock-in infrared thermography is also performed along with an electroluminescence mapping

Anglický abstrakt

The aim of this research is to detect and localize microstructural defects by using an electrically excited light emission from a forward/reverse-bias stressed pn-junction in thin-film Cu(In; Ga)Se2 solar cells with metal wrap through architecture. A different origin of the local light emission from intrinsic/extrinsic imperfections in these chalcopyrite-based solar cells can be distinguished by a spectrally-filtered electroluminescence mapping. After a light emission mapping and localization of the defects in a macro scale is performed a micro scale exploration of the solar cell surface by a scanning electron microscope which follows the particular defects obtained by an electroluminescence. In particular, these macroscopic/microscopic examinations are performed independently, then the searching of the corresponding defects in the micro scale is rather difficult due to a diffused light emission obtained from the macro scale localization. Some of the defects accompanied by a highly intense light emission very often lead to a strong local overheating. Therefore, the lock-in infrared thermography is also performed along with an electroluminescence mapping

Klíčová slova

CIGS; chalcopyrite; thin-film; solar cell; microstructural defects; electroluminescence mapping; scanning electron microscope; lock-in infrared thermography

Klíčová slova v angličtině

CIGS; chalcopyrite; thin-film; solar cell; microstructural defects; electroluminescence mapping; scanning electron microscope; lock-in infrared thermography

Autoři

ŠKVARENINA, Ľ.; GAJDOŠ, A.; MACKŮ, R.; ŠKARVADA, P.

Rok RIV

2018

Vydáno

01.12.2017

Nakladatel

SPIE

Místo

Bellingham, Washington 98227-0010 USA

ISBN

9781510617025

Kniha

Photonics, Devices, and Systems VII

ISSN

0277-786X

Periodikum

Proceedings of SPIE

Svazek

10603

Stát

Spojené státy americké

Strany od

1

Strany do

7

Strany počet

7

URL

http://dx.doi.org/10.1117/12.2286841

BibTex

@inproceedings{BUT138627,
  author="Ľubomír {Škvarenina} and Adam {Gajdoš} and Robert {Macků} and Pavel {Škarvada}",
  title="Detection of microstructural defects in chalcopyrite Cu(In,Ga)Se2 solar cells by spectrally-filtered electroluminescence",
  booktitle="Photonics, Devices, and Systems VII",
  year="2017",
  journal="Proceedings of SPIE",
  volume="10603",
  pages="1--7",
  publisher="SPIE",
  address="Bellingham, Washington 98227-0010 USA",
  doi="10.1117/12.2286841",
  isbn="9781510617025",
  issn="0277-786X",
  url="http://dx.doi.org/10.1117/12.2286841"
}