Detail publikačního výsledku

Study of solar cells defects via noise measurement

MACKŮ, R.; KOKTAVÝ, P.

Originální název

Study of solar cells defects via noise measurement

Anglický název

Study of solar cells defects via noise measurement

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

This article deals with the application of noise measurements for the assessment of the quality of the solar cell itself and production technology alike. The main focus of this study is the random n-level (in most case just two-level) impulse noise, usually referred to as microplasma noise. This noise is a consequence of local breakdowns in micro-sized regions and brings about a reduction of lifetime or a destruction of the PN junction. The method is suitable for non-destructive testing of semiconductor devices. Here we pay attention to very large junctions of the solar cells.

Anglický abstrakt

This article deals with the application of noise measurements for the assessment of the quality of the solar cell itself and production technology alike. The main focus of this study is the random n-level (in most case just two-level) impulse noise, usually referred to as microplasma noise. This noise is a consequence of local breakdowns in micro-sized regions and brings about a reduction of lifetime or a destruction of the PN junction. The method is suitable for non-destructive testing of semiconductor devices. Here we pay attention to very large junctions of the solar cells.

Klíčová slova

Microplasma noise, A-type noise, Impulse duration, Impulse separation, PN junction, Solar cell

Klíčová slova v angličtině

Microplasma noise, A-type noise, Impulse duration, Impulse separation, PN junction, Solar cell

Autoři

MACKŮ, R.; KOKTAVÝ, P.

Rok RIV

2010

Vydáno

05.05.2008

Nakladatel

Mesterprint Printinghouse Ltd.

Místo

Hungary, Budapest

ISBN

978-963-06-4915-5

Kniha

Reliability and Life-time Prediction Conference Proceedings

Strany od

96

Strany do

100

Strany počet

5

BibTex

@inproceedings{BUT14905,
  author="Robert {Macků} and Pavel {Koktavý}",
  title="Study of solar cells defects via noise measurement",
  booktitle="Reliability and Life-time Prediction Conference Proceedings",
  year="2008",
  number="1",
  pages="96--100",
  publisher="Mesterprint Printinghouse Ltd.",
  address="Hungary, Budapest",
  isbn="978-963-06-4915-5"
}