Detail publikačního výsledku

Noise diagnostics of local defects in solar cells

KOKTAVÝ, P.; KOKTAVÝ, B.; MACKŮ, R.; SADOVSKÝ, P.

Originální název

Noise diagnostics of local defects in solar cells

Anglický název

Noise diagnostics of local defects in solar cells

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

This study deals with the use of noise for solar cells diagnostic purposes. When a high electric field is applied to a PN junction containing some technological imperfections, local breakdowns arises in micro-sized regions, which in turn can lead to the deterioration in quality or destruction of the PN junction. It is therefore advisable to use methods which can indicate the presence of these regions in the junction and make the quality assessment and quantitative description of the tested cells possible.

Anglický abstrakt

This study deals with the use of noise for solar cells diagnostic purposes. When a high electric field is applied to a PN junction containing some technological imperfections, local breakdowns arises in micro-sized regions, which in turn can lead to the deterioration in quality or destruction of the PN junction. It is therefore advisable to use methods which can indicate the presence of these regions in the junction and make the quality assessment and quantitative description of the tested cells possible.

Klíčová slova

Solar cell, microplasma noise, noise diagnostics

Klíčová slova v angličtině

Solar cell, microplasma noise, noise diagnostics

Autoři

KOKTAVÝ, P.; KOKTAVÝ, B.; MACKŮ, R.; SADOVSKÝ, P.

Vydáno

20.09.2007

Nakladatel

IMAPS CS

Místo

Brno

ISBN

978-80-214-3470-7

Kniha

Proc. of EDS IMAPS CS 2007

Strany od

409

Strany do

413

Strany počet

5

BibTex

@inproceedings{BUT25515,
  author="Pavel {Koktavý} and Bohumil {Koktavý} and Robert {Macků} and Petr {Sadovský}",
  title="Noise diagnostics of local defects in solar cells",
  booktitle="Proc. of EDS IMAPS CS 2007",
  year="2007",
  pages="409--413",
  publisher="IMAPS CS",
  address="Brno",
  isbn="978-80-214-3470-7"
}