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Detail publikačního výsledku
ŠKARVADA, P.; TOMÁNEK, P.; KOKTAVÝ, P.; MACKŮ, R.
Originální název
Light emission from silicon solar cells as characterization technique
Anglický název
Druh
Stať ve sborníku v databázi WoS či Scopus
Originální abstrakt
The paper describes local photoelectric measurement results obtained with monocrystalline silicon solar cell in visible light. The measurement allows localize, with high spatial resolution, a weak light emission from defects at reverse bias voltage as low as 3 V, which does not exhibit any relation to current-voltage characteristics (no local breakdowns). Other types of defects observed under forward bias using electroluminescence (EL) and light induced beam current (LBIC) techniques are also visualized. The measurements should contribute to find a correlation between EL and modified LBIC results.
Anglický abstrakt
Klíčová slova
silicon solar cell; characterization; light emission; defects
Klíčová slova v angličtině
Autoři
Rok RIV
2011
Vydáno
19.05.2010
Nakladatel
Reprotechnika Wroclaw
Místo
Wroclaw
ISBN
978-1-4244-5371-9
Kniha
2010 9th International Conference on Environment and Electrical Engineering
Strany od
97
Strany do
100
Strany počet
4
BibTex
@inproceedings{BUT35588, author="Pavel {Škarvada} and Pavel {Tománek} and Pavel {Koktavý} and Robert {Macků}", title="Light emission from silicon solar cells as characterization technique", booktitle="2010 9th International Conference on Environment and Electrical Engineering", year="2010", pages="97--100", publisher="Reprotechnika Wroclaw", address="Wroclaw", isbn="978-1-4244-5371-9" }