Detail publikačního výsledku

Characterization of Si Solar Cells Imperfections in the Near-Field

ŠKARVADA, P.; TOMANEK, P.; MACKŮ, R.

Originální název

Characterization of Si Solar Cells Imperfections in the Near-Field

Anglický název

Characterization of Si Solar Cells Imperfections in the Near-Field

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

This paper deals with microscale localization of solar cell imperfections. Imperfections are areas on the solar cell that emits light in visible range when the cell is reverse-biased. Samples under investigation are monocrystalline silicon solar cells. Local topography, near-field optical beam induced current, local optical properties and local visible light emission using high resolution and high sensitive techniques together with light emission thermal dependence have been measured. Generally light emission occurs in places where the near-field optical beam induced current has its local minima. The results when there is no evident correlation between light emission and near-field optical beam induced current are presented in this paper. It was found that one light emission macroscopic spot can consist of several small light emission spots which diameters are less than 8 ?m.

Anglický abstrakt

This paper deals with microscale localization of solar cell imperfections. Imperfections are areas on the solar cell that emits light in visible range when the cell is reverse-biased. Samples under investigation are monocrystalline silicon solar cells. Local topography, near-field optical beam induced current, local optical properties and local visible light emission using high resolution and high sensitive techniques together with light emission thermal dependence have been measured. Generally light emission occurs in places where the near-field optical beam induced current has its local minima. The results when there is no evident correlation between light emission and near-field optical beam induced current are presented in this paper. It was found that one light emission macroscopic spot can consist of several small light emission spots which diameters are less than 8 ?m.

Klíčová slova

silicon solar cell, defects, reverse-bias electroluminescence

Klíčová slova v angličtině

silicon solar cell, defects, reverse-bias electroluminescence

Autoři

ŠKARVADA, P.; TOMANEK, P.; MACKŮ, R.

Rok RIV

2011

Vydáno

10.09.2010

Nakladatel

WIP - Renewable Energies

Místo

Valencia

ISBN

3-936338-26-4

Kniha

25th European Photovoltaic Solar Energy Conference (id 18618)

Strany od

351

Strany do

354

Strany počet

4

BibTex

@inproceedings{BUT35590,
  author="Pavel {Škarvada} and Pavel {Tomanek} and Robert {Macků}",
  title="Characterization of Si Solar Cells Imperfections in the Near-Field",
  booktitle="25th European Photovoltaic Solar Energy Conference (id 18618)",
  year="2010",
  pages="351--354",
  publisher="WIP - Renewable Energies",
  address="Valencia",
  isbn="3-936338-26-4"
}