Detail publikačního výsledku

Noise and Optical Activities of Local Defects in Solar Cells pn Junctions

KOKTAVÝ, P.; MACKŮ, R.

Originální název

Noise and Optical Activities of Local Defects in Solar Cells pn Junctions

Anglický název

Noise and Optical Activities of Local Defects in Solar Cells pn Junctions

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

This paper deals with the study of monocrystalline silicon solar cells noise and optical characteristics and correlation between them with respect to solar cells diagnostic purposes. The study was focused on finding of local defects in reverse-biased solar cells pn junctions and making their characterization. The next goal was to attribute the individual founded defects behaviour to the physical mechanisms occurring in the reverse-biased pn junction.

Anglický abstrakt

This paper deals with the study of monocrystalline silicon solar cells noise and optical characteristics and correlation between them with respect to solar cells diagnostic purposes. The study was focused on finding of local defects in reverse-biased solar cells pn junctions and making their characterization. The next goal was to attribute the individual founded defects behaviour to the physical mechanisms occurring in the reverse-biased pn junction.

Klíčová slova

solar cell; pn junction; microplasma noise; light emission; silicon; diagnostics

Klíčová slova v angličtině

solar cell; pn junction; microplasma noise; light emission; silicon; diagnostics

Autoři

KOKTAVÝ, P.; MACKŮ, R.

Rok RIV

2012

Vydáno

12.06.2011

Nakladatel

IEEE

Místo

Toronto, Kanada

ISBN

978-1-4577-0191-7

Kniha

ICNF2011: 2011 21st International Conference on Noise and Fluctuations

Edice

1

Strany od

409

Strany do

412

Strany počet

4

BibTex

@inproceedings{BUT73477,
  author="Pavel {Koktavý} and Robert {Macků}",
  title="Noise and Optical Activities of Local Defects in Solar Cells pn Junctions",
  booktitle="ICNF2011: 2011 21st International Conference on Noise and Fluctuations",
  year="2011",
  series="1",
  number="1",
  pages="409--412",
  publisher="IEEE",
  address="Toronto, Kanada",
  isbn="978-1-4577-0191-7"
}