Detail publikačního výsledku

Advanced non-destructive diagnostics of monocrystalline silicon solar cells

MACKŮ, R.; KOKTAVÝ, P.; ŠKARVADA, P.

Originální název

Advanced non-destructive diagnostics of monocrystalline silicon solar cells

Anglický název

Advanced non-destructive diagnostics of monocrystalline silicon solar cells

Druh

Článek recenzovaný mimo WoS a Scopus

Originální abstrakt

Measurements of reverse-biased junctions can provide valuable information on the solar cells and their defects. A number of papers were published in the past concerning the measurement methodology, however, for devices having relatively low pn junction area only. The junction area is much larger in solar cells. Therefore, a new measurement methodology had to be developed for them. In large-area pn junctions, there are some phenomena which are negligible in the smaller-area junction measurements, but are introducing considerable errors in the measurement results of large-area junctions. The barrier capacity is one of the parameters of the solar cells under investigation. We employed the near-field and the electron microscopy to study the solar cell surface texture, which provided us with some information on the pn junction configuration.

Anglický abstrakt

Measurements of reverse-biased junctions can provide valuable information on the solar cells and their defects. A number of papers were published in the past concerning the measurement methodology, however, for devices having relatively low pn junction area only. The junction area is much larger in solar cells. Therefore, a new measurement methodology had to be developed for them. In large-area pn junctions, there are some phenomena which are negligible in the smaller-area junction measurements, but are introducing considerable errors in the measurement results of large-area junctions. The barrier capacity is one of the parameters of the solar cells under investigation. We employed the near-field and the electron microscopy to study the solar cell surface texture, which provided us with some information on the pn junction configuration.

Klíčová slova

solar cell, pn junction, barrier capacitance, scanning near-field optical microscopy (SNOM)

Klíčová slova v angličtině

solar cell, pn junction, barrier capacitance, scanning near-field optical microscopy (SNOM)

Autoři

MACKŮ, R.; KOKTAVÝ, P.; ŠKARVADA, P.

Rok RIV

2010

Vydáno

10.01.2008

Nakladatel

WSEAS

ISSN

1109-9445

Periodikum

WSEAS Transactions on Electronics

Svazek

4

Číslo

9

Stát

Spojené státy americké

Strany od

192

Strany do

197

Strany počet

6

BibTex

@article{BUT48105,
  author="Robert {Macků} and Pavel {Koktavý} and Pavel {Škarvada}",
  title="Advanced non-destructive diagnostics of monocrystalline silicon solar cells",
  journal="WSEAS Transactions on Electronics",
  year="2008",
  volume="4",
  number="9",
  pages="192--197",
  issn="1109-9445"
}