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Detail publikačního výsledku
MACKŮ, R.; KOKTAVÝ, P.
Originální název
Device for statistical characteristics of microplasma noise measurment
Anglický název
Druh
Stať ve sborníku v databázi WoS či Scopus
Originální abstrakt
Random two-level current impulses may occur in electronic devices containing reverse biased p-n junctions in a certain operating mode. These impulses are usually rectangular, featuring constant amplitude, random pulse width and pulse origin time points. Based on experiment results, a two-state model of stochastic generation-recombination process has been elaborated for the two-level impulse noise allowing to derive some statistical characteristics of this process. A device for measurement of statistical characteristics in a wide range of time is described in this paper. Thus obtained results may be used for p-n junction non-destructive diagnostics and quality assessment.
Anglický abstrakt
Klíčová slova
Microplasma noise, Statistical characteristics, A-type noise, Impulse duration, Impulse separation
Klíčová slova v angličtině
Autoři
Vydáno
15.11.2007
Nakladatel
Z. Novotný, Ing., CSc.
Místo
Brno
ISBN
978-80-7355-078-3
Kniha
New trends in physics
Edice
-
Strany od
90
Strany do
93
Strany počet
4
BibTex
@inproceedings{BUT28511, author="Robert {Macků} and Pavel {Koktavý}", title="Device for statistical characteristics of microplasma noise measurment", booktitle="New trends in physics", year="2007", series="-", number="první", pages="90--93", publisher="Z. Novotný, Ing., CSc.", address="Brno", isbn="978-80-7355-078-3" }