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Detail publikačního výsledku
MACKŮ, R.; ŠICNER, J.; HOLCMAN, V.; KOKTAVÝ, P.
Originální název
Mechanical Induced Defects and Fractures in the Silicon Solar Cell Structure
Anglický název
Druh
Článek Scopus
Originální abstrakt
Presented research is involved in excess electrical currents created when the silicon material contains cracks and fractures. We performed transport characteristics measurements and electrical noise measurement as well as sample visible and deep infrared imaging. It turns out that mechanical induced defects are followed by specific electric characteristics. We observe crackrelated local breakdowns and local overheating. It is also followed by the electrical current fluctuation in the 1/f form. All regions are thermally but also electrically stressed and the irreversible sample degradation originates. It could be pointed out that our detection methods are very sensitive and they could be used for analyses of different materials.
Anglický abstrakt
Klíčová slova
Solar cell, local defects, fractures, electrical noise, light emission
Klíčová slova v angličtině
Autoři
Rok RIV
2017
Vydáno
01.01.2014
Nakladatel
Trans tech publication
Místo
Switzerland
ISSN
1013-9826
Periodikum
Key Engineering Materials (print)
Svazek
592-593
Číslo
1
Stát
Švýcarská konfederace
Strany od
533
Strany do
536
Strany počet
4
BibTex
@article{BUT105452, author="Robert {Macků} and Jiří {Šicner} and Vladimír {Holcman} and Pavel {Koktavý}", title="Mechanical Induced Defects and Fractures in the Silicon Solar Cell Structure", journal="Key Engineering Materials (print)", year="2014", volume="592-593", number="1", pages="533--536", doi="10.4028/www.scientific.net/KEM.592-593.533", issn="1013-9826" }