Detail publikačního výsledku

Microplasma noise as a tool for PN junctions diagnostics

KOKTAVÝ, P.; MACKŮ, R.; PARAČKA, P.; KRČÁL, O.

Originální název

Microplasma noise as a tool for PN junctions diagnostics

Anglický název

Microplasma noise as a tool for PN junctions diagnostics

Druh

Článek recenzovaný mimo WoS a Scopus

Originální abstrakt

The present paper deals with noise diagnostics of PN junctions in semiconductor devices. The general tool to be employed here is the microplasma noise, which arises in reverse biased PN junctions containing local defects featuring lower breakdown voltage than the rest PN junction. When a high electric field is applied to this PN junction, local breakdowns arises in micro-sized regions, which in turn can lead to the deterioration in quality or destruction of the PN junction. It is therefore advisable to use methods which can indicate the presence of these regions in the junction and make the quality assessment and quantitative description of the tested devices possible.

Anglický abstrakt

The present paper deals with noise diagnostics of PN junctions in semiconductor devices. The general tool to be employed here is the microplasma noise, which arises in reverse biased PN junctions containing local defects featuring lower breakdown voltage than the rest PN junction. When a high electric field is applied to this PN junction, local breakdowns arises in micro-sized regions, which in turn can lead to the deterioration in quality or destruction of the PN junction. It is therefore advisable to use methods which can indicate the presence of these regions in the junction and make the quality assessment and quantitative description of the tested devices possible.

Klíčová slova

noise diagnostics, quality, PN junction, microplasma, avalanche breakdown, impact ionization

Klíčová slova v angličtině

noise diagnostics, quality, PN junction, microplasma, avalanche breakdown, impact ionization

Autoři

KOKTAVÝ, P.; MACKŮ, R.; PARAČKA, P.; KRČÁL, O.

Rok RIV

2010

Vydáno

10.01.2008

Nakladatel

WSEAS

ISSN

1109-9445

Periodikum

WSEAS Transactions on Electronics

Svazek

4

Číslo

9

Stát

Spojené státy americké

Strany od

186

Strany do

191

Strany počet

6

BibTex

@article{BUT48686,
  author="Pavel {Koktavý} and Robert {Macků} and Petr {Paračka} and Ondřej {Krčál}",
  title="Microplasma noise as a tool for PN junctions diagnostics",
  journal="WSEAS Transactions on Electronics",
  year="2008",
  volume="4",
  number="9",
  pages="186--191",
  issn="1109-9445"
}