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doc. Ing.
Ph.D.
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2026
FAWAEER, S.; AL-QAISI, W.; SEDLÁKOVÁ, V.; MOUSA, M.; KNÁPEK, A.; SOBOLA, D. Role of Buffer Layers in Defect Chemistry and Parasitic Phase Formation of BiFeO3 Films on Silicon. ACS Omega, 2026, vol. 11, iss. 5, p. 7782-7795.
Článek WoS
FAWAEER, S.; AL-QAISI, W.; SEDLÁKOVÁ, V.; MOUSA, M.; KNÁPEK, A.; SOBOLA, D. Non-epitaxial integration of strain-tuned polycrystalline BiFeO3 thin films for silicon-based optoelectronics. Optical materials, 2026, vol. 169, iss. 1, p. 1-9.
2025
FAWAEER, S.; AL-QAISI, W.; SEDLÁKOVÁ, V.; MOUSA, M.; KNÁPEK, A.; SOBOLA, D. Substrate-temperature-driven phase stabilization and strain modulation in BiFeO3/Ti/Si heterostructures for scalable silicon integration. Journal of Alloys and Compounds, 2025, vol. 1047, iss. 12, p. 1-11.
MOUSA, M.; TULBURE, I.; SHATNAWI, M.; FAWAEER, S.; KNÁPEK, A.; SEDLÁKOVÁ, V.; AL-AKHRAS, M.; ALABTH, M.; ALLAHAM, M.; ALSOUD, A.; DARADKEH, S.; RONOH, K.; AL-QAISI, W.; SOBOLA, D. Comparative Analysis of the Effect of Polystyrene Coating on the Field Emission Characteristic of Tungsten and Carbon Fiber Emitters. Jordan journal of physics, 2025, vol. 18, iss. 3, p. 349-363.
2024
FAWAEER, S.; AL-QAISI, W.; SEDLÁKOVÁ, V.; MOUSA, M.; KNÁPEK, A.; TRUNEC, M.; SOBOLA, D. Nanometer - Thick titanium film as a silicon migration barrier. Materials Today Communications, 2024, vol. 40, iss. August 2024, p. 1-17. ISSN: 2352-4928.
2022
SEDLÁK, P.; KASPAR, P.; SOBOLA, D.; GAJDOŠ, A.; MAJZNER, J.; SEDLÁKOVÁ, V.; KUBERSKÝ, P. Solvent Evaporation Rate as a Tool for Tuning the Performance of a Solid Polymer Electrolyte Gas Sensor. Polymers, 2022, vol. 14, iss. 21, p. 1-17. ISSN: 2073-4360.
2020
SEDLÁK, P.; KUBERSKÝ, P.; GAJDOŠ, A.; MAJZNER, J.; SEDLÁKOVÁ, V.; MACKŮ, R.; HOLCMAN, V. Effect of the Different Crystallinity of Ionic Liquid Based Solid Polymer Electrolyte on the Performance of Amperometric Gas Sensor. Engineering Proceedings, 2020, vol. 2, iss. 1, p. 1-5. ISSN: 2673-4591.
Článek Scopus
SEDLÁK, P.; GAJDOŠ, A.; MACKŮ, R.; MAJZNER, J.; HOLCMAN, V.; SEDLÁKOVÁ, V.; KUBERSKÝ, P. The effect of thermal treatment on ac/dc conductivity and current fluctuations of PVDF/NMP/[EMIM][TFSI] solid polymer electrolyte. Scientific Reports, 2020, vol. 10, iss. 1, p. 1-12. ISSN: 2045-2322.
2019
SEDLÁKOVÁ, V.; ŠIKULA, J.; SEDLÁK, P.; ČECH, O. Cycle life and degradation sources in Li-S cells. In Technical Digest of 13th Conference „Electron Technology” ELTE and 43rd International Microelectronics and Packaging IMAPS Poland Conference. Kraków, Poland: International Microelectronics and Packaging Society Poland Chapter, 2019. p. 83-84. ISBN: 978-83-932464-3-4.
Stať ve sborníku v databázi WoS či Scopus
SEDLÁKOVÁ, V.; ŠIKULA, J.; SEDLÁK, P.; ČECH, O.; URRUTIA, L. A Simple Analytical Model of Capacity Fading for Lithium–Sulfur Cells. IEEE TRANSACTIONS ON POWER ELECTRONICS, 2019, vol. 34, iss. 6, p. 5779-5786. ISSN: 0885-8993.
SEDLÁKOVÁ, V.; ŠIKULA, J.; MAJZNER, J.; SEDLÁK, P. Supercapacitor Degradation and Life-time. In Proceedings of 2nd Passive Components Networking Symposium. Brno: European Passive Components Institute s.r.o., 2019. p. 90-97. ISBN: 978-80-907447-0-7.
2018
SEDLÁKOVÁ, V.; ŠIKULA, J.; SEDLÁK, P.; ČECH, O. SOURCES OF DEGRADATION IN LI-S CELLS. In 39. Nekonvenční zdroje elektrické energie. 2018. p. 95-97. ISBN: 978-80-02-02786-7.
2017
SEDLÁKOVÁ, V.; ŠIKULA, J.; KUPAROWITZ, M. Temperature Dependence of Leakage Current Degradation of Tantalum Capacitors at High Electric Field. In PCSN 2017 Proceedings. Česká republika: Ing. Vladislav Pokorný - LITERA BRNO, Tábor 43a, 612 00 Brno, 2017. p. 128-136. ISBN: 978-80-905768-8-9.
KUPAROWITZ, T.; SEDLÁKOVÁ, V.; SEDLÁK, P.; ŠIKULA, J. Low frequency noise of electrochemical power sources. In 2017 International Conference on Noise and Fluctuations (ICNF). Vilnius, Lithuania: IEEE, 2017. p. 1-4. ISBN: 978-1-5090-2760-6.
KUPAROWITZ, T.; SEDLÁKOVÁ, V.; ŠIKULA, J.; MAJZNER, J.; SEDLÁK, P. Supercapacitor Degradation and Reliability. In Passive Components Networking days EPCI Passive Components Networking Symposium 2017. 2017. p. 63-68. ISBN: 978-80-905768-8-9.
KUPAROWITZ, M.; SEDLÁKOVÁ, V.; GRMELA, L. LEAKAGE CURRENT DEGRADATION DUE TO ION DRIFT AND DIFFUSION IN TANTALUM AND NIOBIUM OXIDE CAPACITORS. Metrology and Measurement Systems, 2017, vol. 24, iss. 2, p. 255-264. ISSN: 0860-8229.
2016
SZEWCZYK, A.; ŠIKULA, J.; SEDLÁKOVÁ, V.; MAJZNER, J.; SEDLÁK, P.; KUPAROWITZ, T. Voltage dependence of supercapacitor capacitance. Metrology and Measurement Systems, 2016, vol. 23, iss. 3, p. 403-411. ISSN: 0860-8229.
SEDLÁKOVÁ, V.; ŠIKULA, J.; SEDLÁK, P.; MAJZNER, J.; KUPAROWITZ, T.; MÍVALT, F.; LANG, M. Supercapacitor Parameters Degradation Analysis by Energy Cycling and Calendar Life Tests. Space Passive Component Days. European Space Agency, 2016. p. 1.
Stať ve sborníku mimo WoS a Scopus
SEDLÁK, P.; KUBERSKÝ, P.; ŠKARVADA, P.; HAMÁČEK, A.; SEDLÁKOVÁ, V.; MAJZNER, J.; NEŠPŮREK, S.; ŠIKULA, J. Current-fluctuation measurements of amperometric gas sensors prepared by three different technology procedures. Metrology and Measurement Systems, 2016, vol. 23, iss. 4, p. 531-543. ISSN: 2300-1941.
SEDLÁKOVÁ, V.; ŠIKULA, J.; MAJZNER, J.; SEDLÁK, P.; KUPAROWITZ, T.; BUERGLER, B.; VAŠINA, P. Supercapacitor degradation assesment by power cycling and calendar life tests. Metrology and Measurement Systems, 2016, vol. 23, iss. 3, p. 345-358. ISSN: 0860-8229.
2015
KUBERSKÝ, P.; SEDLÁK, P.; HAMÁČEK, A.; NEŠPŮREK, S.; KUPAROWITZ, T.; ŠIKULA, J.; MAJZNER, J.; SEDLÁKOVÁ, V.; GRMELA, L.; SYROVÝ, T. Quantitative fluctuation-enhanced sensing in amperometric NO2 sensors. CHEMICAL PHYSICS, 2015, vol. 456, iss. 1, p. 111-117. ISSN: 0301-0104.
SEDLÁKOVÁ, V.; ŠIKULA, J.; MAJZNER, J.; SEDLÁK, P.; KUPAROWITZ, T.; BUERGLER, B.; VAŠINA, P. Supercapacitor equivalent electrical circuit model based on charges redistribution by diffusion. Journal of power sources, 2015, vol. 2015, iss. 286, p. 58-65. ISSN: 0378-7753.
SEDLÁKOVÁ, V.; ŠIKULA, J.; VRBA, R.; MAJZNER, J.; SEDLÁK, P.; SANTO-ZARNIK, M.; BELAVIC, D. Noise in piezoresistive pressure sensors. In Noise and Fluctuation (ICNF). IEEE, 2015. p. 1-4. ISBN: 978-1-4673-8335-6.
SEDLÁK, P.; KUBERSKÝ, P.; MAJZNER, J.; NEŠPŮREK, S.; ŠIKULA, J.; MACKŮ, R.; ŠKARVADA, P.; SEDLÁKOVÁ, V.; HAMÁČEK, A. Investigation of adsorption-desorption phenomenon by using current fluctuations of amperometric NO2 gas sensor. In Noise and Fluctuations (ICNF). IEEE, 2015. p. 1-4. ISBN: 978-1-4673-8335-6.
2014
KUPAROWITZ, T.; SEDLÁKOVÁ, V.; SZEWCZYK, A.; HASSE, L.; SMULKO, J.; MAJZNER, J.; SEDLÁK, P.; ŠIKULA, J. Charge Redistribution and Restoring voltage of Supercapacitors. ElectroScope, 2014, vol. 2014, iss. 3, p. 1-7. ISSN: 1802-4564.
Článek recenzovaný mimo WoS a Scopus
HASSE, L.; BABICZ, S.; KACZMAREK, L.; SMULKO, J.; SEDLÁKOVÁ, V. Quality assessment of ZnO-based varistors by 1/f noise. MICROELECTRONICS RELIABILITY, 2014, vol. 54 (2014), iss. 1, p. 192-199. ISSN: 0026-2714.
KUPAROWITZ, T.; SEDLÁKOVÁ, V.; SZEWCZYK, A.; HASSE, L.; SMULKO, J.; MAJZNER, J.; SEDLÁK, P.; ŠIKULA, J. Supercapacitors – Charge Redistribution and Restoring Voltage. In Proceedings. Brno: Vysoké učení technické v Brně, 2014. p. 145-150. ISBN: 978-80-214-4985-5.
2013
SITA, Z.; SEDLÁKOVÁ, V.; MAJZNER, J.; SEDLÁK, P.; ŠIKULA, J.; GRMELA, L. Analysis of noise and non-linearity of I-V characteristics of positive temperature coefficient chip thermistors. Metrology and Measurement Systems, 2013, vol. XX, iss. 4, p. 635-644. ISSN: 0860-8229.
VONDRA, M.; SEDLÁK, P.; ŠIKULA, J.; SEDLÁKOVÁ, V.; MAJZNER, J.; SMULKO, J.; HASSE, L. A FPGA-Based Measurement System with QCM. In A FPGA-Based Measurement System with QCM. Žilina: EDIS - Publishing Institution of the University of Zilina, 2013. p. 13-15. ISBN: 978-80-554-0807-1.
SANTO-ZARNIK, M.; SEDLÁKOVÁ, V.; BELAVIC, D.; ŠIKULA, J.; MAJZNER, J.; SEDLÁK, P. Estimation of the long-term stability of piezoresistive LTCC pressure sensors by means of low-frequency noise measurements. SENSORS AND ACTUATORS A-PHYSICAL, 2013, vol. 199, iss. 1, p. 334-343. ISSN: 0924-4247.
SANTO-ZARNIK, M.; BELAVIC, D.; SEDLÁKOVÁ, V.; ŠIKULA, J.; KOPECKÝ, M.; SEDLÁK, P.; MAJZNER, J. Comparison of the Intrinsic Characteristics of LTCC and Silicon Pressure Sensors by Means of 1/f Noise Measurements. Radioengineering, 2013, vol. 22, iss. 1, p. 227-232. ISSN: 1210-2512.
SEDLÁK, P.; ŠIKULA, J.; SEDLÁKOVÁ, V.; CHVÁTAL, M.; MAJZNER, J.; VONDRA, M.; KUBERSKÝ, P.; NEŠPŮREK, S.; HAMÁČEK, A. Noise in Amperometric NO2 Sensor. In Proceedings of 22nd International Conference on Noise and Fluctuations. Montpelier, France: IEEE, 2013. p. 1-4. ISBN: 978-1-4799-0670-3.
2012
SEDLÁK, P.; ŠIKULA, J.; MAJZNER, J.; SEDLÁKOVÁ, V. Model of Adsorpce-Desorption Noise in QCM Gas Sensors. In Proceedings of the conference New Trends in Physics. Brno: Ústav fyziky, FEKT, Vysoké učení technické v Brně, 2012. p. 187-190. ISBN: 978-80-214-4594-9.
VONDRA, M.; SEDLÁK, P.; SEDLÁKOVÁ, V.; MAJZNER, J.; ŠIKULA, J.; HOLCMAN, V. Equivalent circuit of polypyrrole-based QCM. In MIDEM Society for Microelectronic, Electronic Components and Materials - Conference 2012 Proceedings. Lubljana Slovenia: 2012. p. 405-409. ISBN: 978-961-92933-2-4.
SEDLÁKOVÁ, V.; MAJZNER, J.; SEDLÁK, P.; KOPECKÝ, M.; ŠIKULA, J.; SANTO-ZARNIK, M.; BELAVIC, D.; HROVAT, M. Evaluation of piezoresistive ceramic pressure sensors using noise measurements. INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS, 2012, vol. 42, iss. 2, p. 109-114. ISSN: 0352-9045.
SEDLÁK, P.; ŠIKULA, J.; VONDRA, M.; SEDLÁKOVÁ, V.; MAJZNER, J.; HOLCMAN, V. Fluctuation-enhanced gas sensing using polypyrrole-based QCM and its adsorption-desorption kinetics. In Proceedings MIDEM 2012. Ljubljana: MIDEM, 2012. p. 399-404. ISBN: 978-961-92933-2-4.
CICHOSZ, J.; HASSE, L.; SZEWCZYK, A.; SEDLÁK, P.; SEDLÁKOVÁ, V.; ŠIKULA, J. Non-linear electro-ultrasonic spectroscopy of high-voltage varistors. In XI Krajowa Konferencja Elektroniki. Warszawa: Sigma-Not, 2012. p. 115-120. ISBN: 978-83-934712-0-1.
SEDLÁKOVÁ, V.; MAJZNER, J.; ŠIKULA, J.; TEVEROVSKY, D.; ZEDNÍČEK, T. IONS ELECTROMIGRATION IN TANTALUM CAPACITORS. In EDS 2012 Proceedings. IMAPS CZ&SK, 2012. p. 343-348. ISBN: 978-80-214-4539-0.
KOPECKÝ, M.; SEDLÁKOVÁ, V.; HOLCMAN, V.; PETTERSSON, H. Analysis of transport mechanisms for the Ta2O5 layers for low temperature range 80 K to 300 K. In MIDEM Society for Microelectronic, Electronic Components and Materials - Conference 2012 Proceedings. Slovinsko: MIDEM, 2012. p. 145-150. ISBN: 978-961-92933-2-4.
SEDLÁKOVÁ, V.; MAJZNER, J.; SEDLÁK, P.; HOLCMAN, V.; ŠIKULA, J.; SANTO-ZARNIK, M.; BELAVIC, D.; HROVAT, M. Influence of Functional Resistors on Offset Voltage Noise in Thick-Film Pressure Sensors. In MIDEM Society for Microelectronic, Electronic Components and Materials - Conference 2012 Proceedings. Slovinsko: MIDEM, 2012. p. 393-398. ISBN: 978-961-92933-2-4.
SANTO-ZARNIK, M.; BELAVIČ, D.; SEDLÁKOVÁ, V.; ŠIKULA, J.; KOPECKÝ, M.; SEDLÁK, P.; MAJZNER, J. INTRINSIC RESOLUTION OF A PIEZORESISTIVE CERAMIC PRESSURE SENSOR. In EDS 2012 Proceedings. IMAPS CZ&SK, 2012. p. 251-256. ISBN: 978-80-214-4539-0.
SEDLÁKOVÁ, V.; ŠIKULA, J.; CHVÁTAL, M.; PAVELKA, J.; TACANO, M.; TOITA, M. Noise in Submicron Metal-Oxide-Semiconductor Field Effect Transistors: Lateral Electron Density Distribution and Active Trap Position. JAPANESE JOURNAL OF APPLIED PHYSICS, 2012, vol. 2012 (51), iss. 1, p. 024105-1 (024105-5 p.)ISSN: 0021-4922.
2011
SEDLÁK, P.; TOFEL, P.; SEDLÁKOVÁ, V.; MAJZNER, J.; ŠIKULA, J.; HASSE, L. Ultrasonics spectroscopy of silicon single crystal. Metrology and Measurement Systems, 2011, vol. 18, iss. 4, p. 621-630. ISSN: 0860-8229.
KOPECKÝ, M.; CHVÁTAL, M.; SEDLÁKOVÁ, V. Electron Transport in Ta Nanolayers: Application to Tantalum Capacitors. In Polymer Electronics and Nanotechnologies: towards System Integration. first. Koszykowa 75 00 662 Warsaw Poland: Piotr Firek, Ryszard Kisiel, 2011. p. 137-139. ISBN: 978-83-7207-874-2.
2010
SEDLÁKOVÁ, V. Non-destructive testing of passive electronic components. Brno: Vysoké učení technické v Brně, 2010. p. 1.
Habilitační práce
TOFEL, P.; ŠIKULA, J.; SEDLÁKOVÁ, V.; TRČKA, T. Electro Ultrasonic Spectroscopy of Magnesium Composites. Jemná mechanika a optika, 2010, vol. 55, iss. 5/2010, p. 142-144. ISSN: 0447-6441.
KOPECKÝ, M.; CHVÁTAL, M.; SEDLÁKOVÁ, V. Charge Carrier Transport in Ta2O5 Oxide Nanolayers. ElectroScope, 2010, vol. 2010, iss. 3, p. 1-4. ISSN: 1802-4564.
SEDLÁKOVÁ, V. NON-DESTRUCTIVE TESTING OF PASSIVE ELECTRONIC COMPONENTS. Vědecké spisy vysokého učení technického v Brně, 2010. p. 1.
2009
CHVÁTAL, M.; ŠIKULA, J.; SEDLÁKOVÁ, V.; KNÁPEK, A. Measurements and Theoretical Approximations of VA Characteristics MOSFETs. Jemná mechanika a optika, 2009, vol. 54, iss. 10, p. 278-279. ISSN: 0447-6441.
ŠIKULA, J.; SEDLÁKOVÁ, V.; CHVÁTAL, M.; PAVELKA, J.; TACANO, M.; TOITA, M. RTS in Submicron MOSFETs: Lateral Field Effect and Active Trap Position. AIP conference proceedings, 2009, vol. 1129, iss. 1, p. 205-208. ISSN: 0094-243X.
2008
ŠIKULA, J.; HÁJEK, K.; SEDLÁKOVÁ, V.; TOFEL, P.; MAJZNER, J. Improved Signal to Noise Ratio of Electro-ultrasonic Spectroscopy. ElectroScope, 2008, vol. 2008, iss. 6, p. 1-4. ISSN: 1802-4564.
SEDLÁKOVÁ, V.; ŠIKULA, J.; TOFEL, P.; MAJZNER, J. Electro-ultrasonic spectroscopy of polymer-based thick film layers. MICROELECTRONICS RELIABILITY, 2008, vol. 48, iss. 6, p. 886-889. ISSN: 0026-2714.
TOFEL, P.; SEDLÁKOVÁ, V.; ŠIKULA, J. Thick Film Resistor Testing by Electro - Ultrasonic Spectroscopy with DC Electric Signal. In Reliability and Life-time Prediction ISSE2008. 1. Hungary: 2008. p. 56-57. ISBN: 978-963-06-4915-5.
2007
ŠIKULA, J.; SEDLÁKOVÁ, V.; NAVAROVÁ, H.; HLÁVKA, J.; TACANO, M.; SITA, Z. Niobium Oxide and Tantalum Capacitors: Leakage Current and M-I-S Model Parameters. In Proceedings of CARTS USA 2007. USA: Electronic Components, Assemblies&Materials Association, 2007. p. 337-345. ISBN: 0-7908-0114-0.
SEDLÁKOVÁ, V.; ŠIKULA, J.; NAVAROVÁ, H.; PAVELKA, J.; HLÁVKA, J.; SITA, Z. Leakage Current, Noise and Reliability of NbO and Ta Capacitors. In Proceedings EMPC 2007. Finsko: IMAPS Nordic, 2007. p. 436-441.
ŠIKULA, J.; PAVELKA, J.; SEDLÁKOVÁ, V.; HLÁVKA, J.; TACANO, M.; TOITA, M. RTS Noise and quantum transitions in submicron MOSFETs. In New Trends in Physics. Brno: VUT, 2007. p. 138-141. ISBN: 978-80-7355-078-3.
SEDLÁKOVÁ, V. Electro-ultrasonic Spectroscopy of Polymer Based and Cermet Thick Film Resistors. In Proceedings EMPC 2007. Finsko: IMAPS Nordic, 2007. p. 450-455.
SEDLÁKOVÁ, V.; ŠIKULA, J.; MAJZNER, J. Electro-Ultrasonic Spectroscopy - New Method for Ppolymer Based Conducting Layers Characterisation. In Proceedings of the conference New Trends in Physics. Brno, ČR: Ústav fyziky FEKT VUT v Brně, 2007. p. 130-133. ISBN: 978-80-7355-078-3.
MAJZNER, J.; SEDLÁKOVÁ, V.; TOFEL, P.; SEDLÁK, P. NOISE IN ULTRASONIC TRANSDUCER. In New Trends in Physics. Brno: Ing. Zdeněk Novotný, 2007. p. 94-97. ISBN: 978-80-7355-078-3.
SEDLÁKOVÁ, V.; ŠIKULA, J. Thick Film Resistors Testing by Electro-Ultrasonic Spectroscopy. 2007, vol. 2007, iss. Nov/Dec, p. 16-20.
SEDLÁKOVÁ, V.; MAJZNER, J.; ŠIKULA, J. Noise and Electro-Ultrasonic Spectroscopy of Polymer Based Conducting Layers. In Noise and Fluctuations. USA: American Institute of Physics, 2007. p. 277-280. ISBN: 978-0-7354-0432-8.
SEDLÁKOVÁ, V.; ŠIKULA, J. Thick Film Resistors Testing by Electro-Ultrasonic Spectroscopy. In Proceedings of CARTS USA 2007. USA: Electronic Components, Assemblies&Materials Association, 2007. p. 321-328. ISBN: 0-7908-0114-0.
2006
ŠIKULA, J.; SEDLÁKOVÁ, V.; HLÁVKA, J.; SITA, Z. Charge Carrier Transport in NbO and Ta Capacitors in Temperature Range 100 to 300 K. In Proceeding of CARTS Europe 2006 - 20th annual passive components symposium. Bad Homburg, Německo: Electronic Components, Assemblies and Materials Association, 2006. p. 1-10. ISBN: 0-7908-0110-8.
ŠIKULA, J.; SEDLÁKOVÁ, V.; SITA, Z. Charge Carriers Transport and Noise in Niobium Oxide and Tantalum Capacitors. In EDS '06 IMAPS CS International Conference Proceedings. Brno, ČR: Ing. Zdeněk Novotný CSc., 2006. p. 1-10. ISBN: 80-214-3246-2.
SEDLÁKOVÁ, V.; ŠIKULA, J.; SPIRALSKI, L. Polymer Based Thick Films - Material Quality and Interface Resistance Evaluation. In XXX International Conference of IMAPS Poland Chapter Proceedings. Krakow, Poland: Institute of Electron Technology - Cracow Division, 2006. p. 1-8. ISBN: 83-917701-3-3.
ŠIKULA, J.; SEDLÁKOVÁ, V.; HLÁVKA, J.; SITA, Z.; HÖSCHEL, P.; TACANO, M. Niobium Oxide and Tantalum Capacitors: Quantum Effects in Charge Carrier Transport. In Proceedings CARTS USA 2006 - The 26th Symposium for Passive Components. Orlando, Florida: Electronic Components, Assemblies and Materials Association, 2006. s. 1-7. ISBN: 0-7908-0108-6.
ŠIKULA, J., HÁJEK, K., SEDLÁKOVÁ, V., HEFNER, Š. ELECTRO-ULTRASONIC SPECTROSCOPY OF CONDUCTING SOLIDS. In 9th European Conference of NDT. Berlín, Německo: DGZIP, 2006. p. 1-8. ISBN: 3-931381.
ŠIKULA, J., HÁJEK, K., SEDLÁKOVÁ, V., HEFNER, Š. ELECTRO-ULTRASONIC SPECTROSCOPY OF CONDUCTING SOLIDS. In Abstracts of 9th European Conference of NDT. Berlin: DGZIP, 2006. p. Fr.1.5.2
P. Sedlak, J. Majzner, J. Sikula and V. Sedlakova. Finite element model of noise in piezoceramic sensor. In Proceedings / EMPS 2006 - 4th European Microelectronics and Packaging Symposium with Table-Top Exhibition. Ljubljana, Slovenia: MIDEM, 2006. p. 1-6. ISBN: 961-91023-4-7.
SEDLÁKOVÁ, V., ŠIKULA, J. Charge carrier transport and noise in polymer based thick films. In 4th European Microelectronics and Packaging Symposium with Table-Top Exhibition - Proceedings. Slovinsko: MIDEM, 2006. p. 1-6. ISBN: 961-91023-4-7.
ŠIKULA, J., HEFNER, Š., SEDLÁKOVÁ, V., HÁJEK, K. Electro-Ultrasonic Spectroscopy of Conducting Solids. In DGZfP Proceedings BB 103-CD. Berlin: DGZfP, 2006. p. 1-8. ISBN: 3-931381.
SEDLÁKOVÁ, V.; SEDLÁK, P.; ŠIKULA, J.; HÁJEK, K. Application of Electro-Ultrasonic Spectroscopy for NDT of Electronic Components. In Defektoskopie 2006 Proceeding. Brno: Czech Society for Nondestructive Testing, 2006. p. 1-6. ISBN: 80-214-3290-X.
2005
GRILL, R. Tantalum and Niobium Capacitors: Technology and Characteristic Parameters Comparison. In 15th European Microelectronics and Packaging Conference Proceedings. Bruggy, Belgie: IMAPS Benelux, 2005. p. 1-6.
SEDLÁKOVÁ, V.; ŠIKULA, J.; GRMELA, L.; HÖSCHEL, P.; SITA, Z.; HASHIGUCHI, S.; TACANO, M. Noise and Carge Storage in Nb2O5 Thin Films. In Noise and Fluctuations. United States of America: American Institute of Physics, 2005. p. 1-4. ISBN: 0-7354-0267-1.
P. Dobis, J. Brüstlová, V.Sedláková. Europhysics Conference Abstracts, Vol. 29G: Learning and Tutorial Supports for Bachelor Physics at Brno University of Technology. Europhysics Conference Abstracts, Vol. 29G. 4th International Conference on Physics Teaching in Engineering Education - PTEE 2005. Europhysics Conference Abstracts, Vol. 29G. Brno: European Physical Society, 2005. 1 p. ISBN: 2-914771-28-2.
Abstrakt
ŠIKULA, J.; HLÁVKA, J.; SEDLÁKOVÁ, V.; HÖSCHEL, P.; GRILL, R.; SITA, Z.; ZEDNÍČEK, T.; TACANO, M. Niobium Oxide and Tantalum Capacitors: M-I-S Model Parameters Comparison. In 25th Capacitor and Resistor Technology Symposium. Capacitor and Resistor Technology. 2005. iss. 3, p. 1-5. ISSN: 0887-7491.
TACANO, M., ŠIKULA, J., HLÁVKA, J., PAVELKA, J., SEDLÁKOVÁ, V. RTS Noise in Submicron MOSFETs: Low and High Field Effects. In Proceedings of EDS'05 Electronic Devices and Systems IMAPS CS Int. Conf. Brno: VUT, 2005. p. 1-8. ISBN: 80-214-2990-9.
ŠIKULA, J.; SEDLÁKOVÁ, V.; HLÁVKA, J.; HÖSCHEL, P.; SITA, Z.; ZEDNÍČEK, T.; TACANO, M.; HASHIGUCHI, S. Transport and Noise Characteristics of Niobium Oxide and Tantalum Capacitors. In 25th Capacitor and Resistor Technology Symposium. Capacitor and Resistor Technology. 2005. iss. 10, p. 1-6. ISSN: 0887-7491.
PAVELKA, J., SEDLÁKOVÁ, V., ŠIKULA, J., HAVRÁNEK, J., TACANO, M., HASHIGUCHI, S., TOITA, M. RTS in Submicron MOSFETs: High Field Effects. In Noise and Fluctuations, 18th International Conference on Noise and Fluctuations - ICNF 2005, AIP Conference Proceedings 780. Salamanka, Španělsko: University of Salamanca, 2005. p. 1-4. ISBN: 0-7354-0267-1.
P. Dobis, J. Brüstlová, V.Sedláková. Learning and Tutorial Supports for Bachelor Physics at Brno University of Technology. In Proceedings of the 4th International Conference on Physics Teaching in Engineering Education - PTEE 2005. Brno: European Physical Society and European Society for Engineering Education, 2005. p. 1-3. ISBN: 80-903063-6-5.
SEDLÁKOVÁ, V., ŠIKULA, J. Charge Carrier Transport in Polymer-Based Thick Resistive Films. In 24th Capacitor and Resistor Technology Symposium. Capacitor and Resistor Technology. 2005. iss. 10, p. 1-6. ISSN: 0887-7491.
2004
ŠIKULA, J.; HLÁVKA, J.; SEDLÁKOVÁ, V.; HÖSCHEL, P.; ZEDNÍČEK, T.; SITA, Z. Charge Carrier Transport and Storage in NbO Capacitors. In Proceedings of 18th European Passive Components Conference. United Kingdom: ECA - Electronic Components, Assemblies & Materials Association, 2004. p. 1-4.
SEDLÁKOVÁ, V., SEDLÁK, P., ŠIKULA, J., ROČAK, D., HROVAT, M., SANTO-ZARNIK, M., BELAVIC, D. Analysis of silver diffusion into thick film resistor layers. In Proceedings of 3rd European Microelectronics and Packaging Symposium with Table-Top Exhibition. Lanskroun: IMAPS CZ&SK Chapter, 2004. p. 1-665. ISBN: 80-239-2835-X.
ŠIKULA, J., PAVELKA, J., SEDLÁKOVÁ, V., TACANO, M., HASHIGUCHI, S., TOITA, M. RTS in submicron MOSFETs and quantum dots. In Proceedings of SPIE - Noise and Information in Nanoelectronics, Sensors, and Standards II. United States of America: The Society of Photo-Optical Instrumentation Engineers, 2004. p. 1-10. ISBN: 0-8194-5394-3.
SEDLÁKOVÁ, V., ŠIKULA, J. Thick film resistor characterisation by non-linearity and resistance change after high voltage stress. In New Trends in Physics - Proceedings of the Conference. Brno: Department of Physics FEEC, Brno University of Technology, 2004. p. 1-4. ISBN: 80-7355-024-5.
ŠIKULA, J., HLÁVKA, J., SEDLÁKOVÁ, V., GRMELA, L. Conductivity mechanisms and breakdown of NbO capacitors. In 24th Capacitor and Resistor Technology Symposium. Capacitor and Resistor Technology. U.S.A.: ECA, 2004. iss. 24, p. 1-6. ISSN: 0887-7491.
ŠIKULA, J., SEDLÁKOVÁ, V., DOBIS, P. Noise and Non-Linearity as Reliability Indicators of Electronic Devices. INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS, 2004, vol. 2003, iss. 4, p. 213-221. ISSN: 0352-9045.
SEDLÁKOVÁ, V., MELKES, F., DOBIS, P., ŠIKULA, J., TACANO, M., HASHIGUCHI, S. Non-lineartiy changes induced by current stress in thick film resistors. In 24th Capacitor and Resistor Technology Symposium. Capacitor and Resistor Technology. U.S.A.: ECA, 2004. iss. 24, p. 1-5. ISSN: 0887-7491.
HÁJEK, K., SEDLÁKOVÁ, V., MAJZNER, J., HEFNER, Š., ŠIKULA, J. Non-linearity and noise characterisation of thick-film resistors after high voltage stress. In Proceedings of the 3rd European Microelectronics and Packaging Symposium with Table Top Exhibition. Lanskroun: IMAPS CZ&SK Chapter, 2004. p. 1-6. ISBN: 80-239-2835-X.
2003
BELAVIC, D., ROCAK, D., SEDLÁKOVÁ, V., HROVAT, M., ŠIKULA, J., PAVELKA, J. An Investigation of Noise, Nonlinearity, and Long-Term Stability of Thick-Film Resistors. In Noise and Non-linearity Testing of Modern Electronic Components. Brno: CNRL, 2003. p. 1-4. ISBN: 80-238-9094-8.
SEDLÁKOVÁ, V., MELKES, F., GRMELA, L., DOBIS, P., ŠIKULA, J., TACANO, M., ROČAK, D., BELAVIČ, D. The effect of silver diffusion from contact electrode into thick film resistors. In CARTS - EUROPE 2003 Proceedings. United Kingdom: Electronic Components Institute Internationale Ltd., 2003. p. 1-4. ISBN: 0887-7491.
ŠIKULA, J., DOBIS, P., SEDLÁKOVÁ, V. Noise and non-linearity as reliability indicators of electronic devices. In MIDEM 2003 Conference Proceedings. Slovenia: MIDEM Slovenia, 2003. p. 1-12. ISBN: 961-91023-1-2.
ŠIKULA, J., SEDLÁKOVÁ, V., GRMELA, L., VRBA, R., MELKES, F., ROCAK, D., BELAVIC, D., TACANO, M., HASHIGUCHI, S. Current density distribution, noise and non-linearity of thick film resistors. In 23rd Capacitor and Resistor Technology Symposium. Capacitor and Resistor Technology. U.S.A.: 2003. iss. 4, p. 1-5. ISSN: 0887-7491.
ŠIKULA, J., HLÁVKA, J., SEDLÁKOVÁ, V., GRMELA, L., HOSCHL, P., ZEDNÍČEK, T. Conductivity mechanisms, breakdown and noise characteristics of niobium oxide capacitors. In CARTS - EUROPE 2003 Proceedings. United Kingdom: Electronic Components Institute Internationale Ltd., 2003. p. 1-5. ISBN: 0887-7491.
SEDLÁKOVÁ, V., DOBIS, P., ŠIKULA, J., HOSCHL, P., SITA, Z., ZEDNÍČEK, T. Low Frequency Noise of Nb2O5 Thin Insulating Films. In Proceedings of the 17th International Nonference Noise and Fluctuations ICNF 2003. Czech Republic: CNRL s.r.o., 2003. p. 1-4. ISBN: 80-239-1005-1.
SEDLÁKOVÁ, V., BRÜSTLOVÁ, J., ŠIKULA, J., HLÁVKA, J., COCKER, J., ADAMS, K., GREENHILL, D. Noise of carbon/graphite thick conducting films. In Noise and Fluctuations. Brno: CNRL, 2003. p. 1-4. ISBN: 80-239-1005-1.
SEDLÁKOVÁ, V., MELKES, F., ŠIKULA, J., DOBIS, P., ROČAK, D., BELAVIČ, D., TACANO, M., HASHIGUCHI, S. Current density distribution, noise and non-linearity of thick film resistors. In Proceedings of 14th European Microelectronics and Packaging Conference. Německo: IMAPS Germany, 2003. p. 1-6.
SEDLÁKOVÁ, V., BRÜSTLOVÁ, J., ŠIKULA, J., HLÁVKA, J., COCKER, J., ADAMS, K., GREENHILL, D. Noise of carbon/graphite thick conducting films. In Proceedings of the 17th International Conference Noise and Fluctuations. Czech Republic: CNRL s.r.o., 2003. p. 1-4. ISBN: 80-239-1005-1.
2002
SEDLÁKOVÁ, V. NDT of thick film resistors by noise spectroscopy. In Proceedings of 8th Conference STUDENT EEICT 2002. Brno: Ing. Zdeněk Novotný, CSc., 2002. p. 1-5. ISBN: 80-214-2115-0.
ROČAK, D.; BELAVIČ, D.; HROVAT, M.; ŠIKULA, J.; KOKTAVÝ, P.; PAVELKA, J.; SEDLÁKOVÁ, V. Low-Frequency Noise of Thick-Film Resistors as Quality and Reliability Indicator. MICROELECTRONICS RELIABILITY, 2002, vol. 41, iss. 4, p. 531-542. ISSN: 0026-2714.
SEDLÁKOVÁ, V., MELKES, F., ŠIKULA, J., DOBIS, P., ROČAK, D., BELAVIČ, D. Influence od Contact Electrode on Thick Film Resistors Noice and Nonlinerity. In Proc. of 38th International Conference on Microelectronics, Devices and Materials. Lipica, Slonenia: 2002. p. 1-7. ISBN: 961-91023-0-4.
SEDLÁKOVÁ, V., PAVELKA, J., GRMELA, L., ŠIKULA, J., ROČAK, D., HROVAT, M., BELAVIČ, D. NOISE AND NON-LINEARITY OF THICK-FILM RESISTORS. In Proceedings of European Microelectronics packaging & interconection Symposium. Krakow, Poland: IMAPS - Poland Chapter, 2002. p. 1-4. ISBN: 83-904462-8-6.
SEDLÁKOVÁ, V. NDT of thick film resistors by noise spectroscopy. In Proceedings of 8th ECNDT. Leganes, Madrid: Spanish Society for NDT AEND, 2002. p. 1-6. ISBN: 84-699-8573-6.
ŠIKULA, J., KOKTAVÝ, P., KOŘENSKÁ, M., PAVELKA, J., SEDLÁKOVÁ, V., LOKAJÍČEK, T. Kinetics of the Cracks Creation in Granite Under Ramp loading. NDT Welding Bulletin, 2002, vol. 2002, iss. 12, p. 1-3. ISSN: 1213-3825.
SEDLÁKOVÁ, V., KOKTAVÝ, P., PAVELKA, J. Partial Discharges and Acoustic Emission in M-I-M Structures. In Noise and Non-linearity Testing of Modern Electronic Components. Brno: Ing. Zdeněk Novotný, CSc., 2002. p. 1-5. ISBN: 80-238-9094-8.
PAVELKA, J.; ŠIKULA, J.; VAŠINA, P.; SEDLÁKOVÁ, V.; TACANO, M.; HASHIGUCHI, S. Noise and transport characterisation of tantalum capacitors. MICROELECTRONICS RELIABILITY, 2002, vol. 42, iss. 6, p. 1-7. ISSN: 0026-2714.
ŠIKULA, J., KOKTAVÝ, P., KOŘENSKÁ, M., PAVELKA, J., SEDLÁKOVÁ, V., LOKAJÍČEK, T. Kinetika vzniku trhlin v žule při rostoucím zatěžování. NDT Welding Bulletin, 2002, roč. 2002, č. 2, s. 1-4. ISSN: 1213-3825.
ŠIKULA, J.; HLÁVKA, J.; PAVELKA, J.; SEDLÁKOVÁ, V.; GRMELA, L.; TACANO, M.; HASHIGUCHI, S. Low Frequency Noise of Tantalum Capacitors. Active and Passive Electronic Components, 2002, vol. 25, iss. 2, p. 1-7. ISSN: 0882-7516.
SEDLÁKOVÁ, V., MELKES, F., ŠIKULA, J., ROČAK, D., BELAVIČ, D., TACANO, M. Effect of Contact Electrode on Noise and Nonlinearity of Thick-Film Resistor. In Proc. of 16th Symp. CARTS Europe 2002. Nice, France: 2002. p. 1-5. ISBN: 0887-7491.
ŠIKULA, J., KOKTAVÝ, P., KOŘENSKÁ, M., PAVELKA, J., SEDLÁKOVÁ, V., LOKAJÍČEK, T. Kinetics of the Cracks Creation in Granite Under Ramp Loading. NDT Welding Bulletin, 2002, vol. 2002, iss. 2, p. 1-4. ISSN: 1213-3825.
2001
ŠIKULA, J., SEDLÁKOVÁ, V., KOKTAVÝ, P., PAVELKA, J., MAJZNER, J. Electromagnetic and acoustic emission in solids. In Sborník příspěvků konference Nové trendy ve fyzice. Brno: ÚFYZ FEI VUT Brno, 2001. p. 1-6. ISBN: 80-214-1992-X.
ŠIKULA, J., HLÁVKA, J., PAVELKA, J., SEDLÁKOVÁ, V., GRMELA, L., TACANO, M., HASHIGUCHI, S. Low Frequency Noise of Tantalum Capacitors. In Proceedings of CARTS-Euro 2001. Kodaň, Dánsko: Electronic Components Institute Internationale Ltd., 2001. p. 1-4.
ŠIKULA, J., PAVELKA, J., HLÁVKA, J., SEDLÁKOVÁ, V., GRMELA, L., TACANO, M., HASHIGUCHI, S. The Tantalum Capacitor as a MIS Structure in Reverse Mode. In Proceedings of 21st Capacitor and Resistor technology Symposium CARTS US 2001. Huntsville, Alabama, USA: Components Technology Institute, Inc., 2001. p. 1-4. ISBN: 0887-7491.
PAVELKA, J., ŠIKULA, J., SEDLÁKOVÁ, V., GRMELA, L., TACANO, M., HASHIGUCHI, S. Low Frequency Noise of Thin Ta2O5 Amorphous Films. In Proceedings of the 16th International Conference Noise in Physical Systems and 1/f Fluctuations ICNF 2001. Gainesville, Florida, USA: World Scientific, 2001. p. 1-4. ISBN: 981-02-4677-3.
SEDLÁKOVÁ, V., KOKTAVÝ, P., PAVELKA, J. Acoustic emission and partial discharges in M-I-M capacitors. In Proceedings of NDT in Progress. Třešť: DGZfP a ČNDT, 2001. p. 1-6. ISBN: 80-238-7263-X.
PAVELKA, J., KOKTAVÝ, P., SEDLÁKOVÁ, V. Acoustic Emission Generated by Partial Discharges in Insulating Materials. In Proceedings of 31st International Conference Defektoskopie 2001. Praha: Česká společnost pro nedestruktivní testování, 2001. p. 1-8. ISBN: 80-214-2002-2.
SEDLÁKOVÁ, V.; PAVELKA, J.; ŠIKULA, J.; ROČAK, D.; HROVAT, M.; BELAVIČ, D. Low Frequency Noise and Third Harmonic Testing of Thick Film Resistors as Reliability Indicators. In Proceedings of the 16th International Conference Noise in Physical Systems and 1/f Fluctuations ICNF 2001. Gainesville, Florida, USA: World Scientific, 2001. p. 1-4. ISBN: 981-02-4677-3.
SEDLÁKOVÁ, V. Noise Spectroscopy of Thick Film Resistors. In Sborník příspěvků konference Nové trendy ve fyzice. Brno: ÚFYZ FEI VUT Brno, 2001. p. 1-6. ISBN: 80-214-1992-X.
2000
ŠIKULA, J.; KOKTAVÝ, B.; PAVELKA, J.; KOKTAVÝ, P.; SEDLÁKOVÁ, V.; LOKAJÍČEK, T.; TACANO, M.; HASHIGUCHI, S. Cracks Detection by Electromagnetic and Acoustic Emission. In Proc. of the 15th World Conf. on Non-Destructive Testing WCNDT, October 15-21, Rome, Italy, (2000). 2000. p. 397-400.
1999
ŠIKULA, J.; KOKTAVÝ, B.; PAVELKA, J.; SEDLÁKOVÁ, V.; ROČAK, D.; BELAVIČ, D.; TACANO, M. Charge transport and noise sources in thick conducting films. In Proceedings of 13th European Passive Components Symposium CARTS-Europe '99. UK: Electronic Components Institute Internationale Ltd., 1999. p. 1-4.
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