Detail publikačního výsledku

Noise Spectroscopy of Thick Film Resistors

SEDLÁKOVÁ, V.

Originální název

Noise Spectroscopy of Thick Film Resistors

Anglický název

Noise Spectroscopy of Thick Film Resistors

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

The noise spectroscopy and non-linearity measurements of thick film layers are proposed as a diagnostic tool for prediction of possible types of failure. The characteristic measured using two resistor pastas were compared and resistor termination influence evaluated with contact noise found negligible. Correlation between long-term stability, current noise and third harmonic index was investigated.

Anglický abstrakt

The noise spectroscopy and non-linearity measurements of thick film layers are proposed as a diagnostic tool for prediction of possible types of failure. The characteristic measured using two resistor pastas were compared and resistor termination influence evaluated with contact noise found negligible. Correlation between long-term stability, current noise and third harmonic index was investigated.

Klíčová slova v angličtině

noise, non-linearity, thick film resistors

Autoři

SEDLÁKOVÁ, V.

Vydáno

01.01.2001

Nakladatel

ÚFYZ FEI VUT Brno

Místo

Brno

ISBN

80-214-1992-X

Kniha

Sborník příspěvků konference Nové trendy ve fyzice

Strany od

117

Strany počet

6

BibTex

@inproceedings{BUT6838,
  author="Vlasta {Sedláková}",
  title="Noise Spectroscopy of Thick Film Resistors",
  booktitle="Sborník příspěvků konference Nové trendy ve fyzice",
  year="2001",
  pages="6",
  publisher="ÚFYZ FEI VUT Brno",
  address="Brno",
  isbn="80-214-1992-X"
}