Detail publikačního výsledku

Low-Frequency Noise of Thick-Film Resistors as Quality and Reliability Indicator

ROČAK, D.; BELAVIČ, D.; HROVAT, M.; ŠIKULA, J.; KOKTAVÝ, P.; PAVELKA, J.; SEDLÁKOVÁ, V.

Originální název

Low-Frequency Noise of Thick-Film Resistors as Quality and Reliability Indicator

Anglický název

Low-Frequency Noise of Thick-Film Resistors as Quality and Reliability Indicator

Druh

Článek recenzovaný mimo WoS a Scopus

Originální abstrakt

The non-linearity and the noise of thick-film resistors are parameters that can be used to make prediction of resistor reliability. The noise spectroscopy measurements of thick-film resistors are proposed as a diagnostic tool for the prediction of possible types of failure. The correlation between noise spectral density datat and the results of accelerated aging of thick-film resistors at high temperature were made for HS80 and 2000 resistor pastes.

Anglický abstrakt

The non-linearity and the noise of thick-film resistors are parameters that can be used to make prediction of resistor reliability. The noise spectroscopy measurements of thick-film resistors are proposed as a diagnostic tool for the prediction of possible types of failure. The correlation between noise spectral density datat and the results of accelerated aging of thick-film resistors at high temperature were made for HS80 and 2000 resistor pastes.

Klíčová slova

noise

Klíčová slova v angličtině

noise

Autoři

ROČAK, D.; BELAVIČ, D.; HROVAT, M.; ŠIKULA, J.; KOKTAVÝ, P.; PAVELKA, J.; SEDLÁKOVÁ, V.

Vydáno

01.01.2002

ISSN

0026-2714

Periodikum

MICROELECTRONICS RELIABILITY

Svazek

41

Číslo

4

Stát

Spojené království Velké Británie a Severního Irska

Strany od

531

Strany do

542

Strany počet

12

BibTex

@article{BUT39801,
  author="Dubravka {Ročak} and Darko {Belavič} and Marko {Hrovat} and Josef {Šikula} and Pavel {Koktavý} and Jan {Pavelka} and Vlasta {Sedláková}",
  title="Low-Frequency Noise of Thick-Film Resistors as Quality and Reliability Indicator",
  journal="MICROELECTRONICS RELIABILITY",
  year="2002",
  volume="41",
  number="4",
  pages="531--542",
  issn="0026-2714"
}