Detail publikačního výsledku

NDT of thick film resistors by noise spectroscopy

SEDLÁKOVÁ, V.

Originální název

NDT of thick film resistors by noise spectroscopy

Anglický název

NDT of thick film resistors by noise spectroscopy

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

The noise spectroscopy measurements of thick-film resistors are proposed as a non-destructive testing method for the quality and reliability prediction and possible types of failure evaluation. The thick-film layer structure consists of metallic grains and inter-grain glass layers. Junctions between the metallic grains and glass layers are sources of noise and non-linearity. Important sources of noise are in the vicinity of defects and in the contact region. The main advantages of a noise testing are higher sensitivity than DC measurements during life tests. The kinds of noise spectra in view of reliability diagnostic are mainly the typical poor-device indicators like burst noise, generation-recombination noise, 1/f noise, and the 1/fa noise. The non-linearity of the thick-film layer structure is proportional to the distortion of the pure harmonic signal applied to the sample, and is connected with physical anomalies. The noise spectroscopy and non-linearity NDT can be used to adjust technology, and to select the components.

Anglický abstrakt

The noise spectroscopy measurements of thick-film resistors are proposed as a non-destructive testing method for the quality and reliability prediction and possible types of failure evaluation. The thick-film layer structure consists of metallic grains and inter-grain glass layers. Junctions between the metallic grains and glass layers are sources of noise and non-linearity. Important sources of noise are in the vicinity of defects and in the contact region. The main advantages of a noise testing are higher sensitivity than DC measurements during life tests. The kinds of noise spectra in view of reliability diagnostic are mainly the typical poor-device indicators like burst noise, generation-recombination noise, 1/f noise, and the 1/fa noise. The non-linearity of the thick-film layer structure is proportional to the distortion of the pure harmonic signal applied to the sample, and is connected with physical anomalies. The noise spectroscopy and non-linearity NDT can be used to adjust technology, and to select the components.

Klíčová slova

Noise, Non-linearity, Thick-film, Non-destructive testing

Klíčová slova v angličtině

Noise, Non-linearity, Thick-film, Non-destructive testing

Autoři

SEDLÁKOVÁ, V.

Vydáno

01.01.2002

Nakladatel

Spanish Society for NDT AEND

Místo

Leganes, Madrid

ISBN

84-699-8573-6

Kniha

Proceedings of 8th ECNDT

Strany od

215

Strany počet

6

BibTex

@inproceedings{BUT5739,
  author="Vlasta {Sedláková}",
  title="NDT of thick film resistors by noise spectroscopy",
  booktitle="Proceedings of 8th ECNDT",
  year="2002",
  pages="6",
  publisher="Spanish Society for NDT AEND",
  address="Leganes, Madrid",
  isbn="84-699-8573-6"
}