Detail publikačního výsledku

Thick Film Resistor Testing by Electro - Ultrasonic Spectroscopy with DC Electric Signal

TOFEL, P.; SEDLÁKOVÁ, V.; ŠIKULA, J.

Originální název

Thick Film Resistor Testing by Electro - Ultrasonic Spectroscopy with DC Electric Signal

Anglický název

Thick Film Resistor Testing by Electro - Ultrasonic Spectroscopy with DC Electric Signal

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

The new method of non-destructive testing of the thick film resistors is presented. There are two phenomena which lead to the resistance modulation: (i) The interaction of the charge carriers with phonons, (ii) The ultrasonic signal changes the contact area between the conducting grains in the resistor structure. Ultrasound-excited resistance change in polymer based thick film structures is about 0.005 to 1 , which corresponds to the relative resistance change of the order from 10-6. We suppose that the resistive structures with defects are more influenced by the ultrasonic vibrations. The intermodulation signal can be used as the quality and reliability indicator

Anglický abstrakt

The new method of non-destructive testing of the thick film resistors is presented. There are two phenomena which lead to the resistance modulation: (i) The interaction of the charge carriers with phonons, (ii) The ultrasonic signal changes the contact area between the conducting grains in the resistor structure. Ultrasound-excited resistance change in polymer based thick film structures is about 0.005 to 1 , which corresponds to the relative resistance change of the order from 10-6. We suppose that the resistive structures with defects are more influenced by the ultrasonic vibrations. The intermodulation signal can be used as the quality and reliability indicator

Klíčová slova

Elektro-Ultrasonic, rezistive change, DC voltage

Klíčová slova v angličtině

Elektro-Ultrasonic, rezistive change, DC voltage

Autoři

TOFEL, P.; SEDLÁKOVÁ, V.; ŠIKULA, J.

Rok RIV

2010

Vydáno

07.05.2008

Místo

Hungary

ISBN

978-963-06-4915-5

Kniha

Reliability and Life-time Prediction ISSE2008

Edice

1

Strany od

56

Strany do

57

Strany počet

2

BibTex

@inproceedings{BUT26554,
  author="Pavel {Tofel} and Vlasta {Sedláková} and Josef {Šikula}",
  title="Thick Film Resistor Testing by Electro - Ultrasonic Spectroscopy with DC Electric Signal",
  booktitle="Reliability and Life-time Prediction ISSE2008",
  year="2008",
  series="1",
  number="1",
  pages="56--57",
  address="Hungary",
  isbn="978-963-06-4915-5"
}