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Detail publikačního výsledku
ŠIKULA, J., SEDLÁKOVÁ, V., DOBIS, P.
Originální název
Noise and Non-Linearity as Reliability Indicators of Electronic Devices
Anglický název
Druh
Článek recenzovaný mimo WoS a Scopus
Originální abstrakt
An application of noise and non-linearity measurements in analysis, diagnostics and prediction of reliability of electronic devices is discussed. The sensitivity of noise and non-linearity to the device defects and other irregularities is typical feature of these methods. The principles of noise and non-linearity measuring set-up are shown. Conceptions of 1/f noise, burst or RTS noise, thermal noise and third harmonic voltage are described and theirs explanation is done. Possible reliability indicators for conducting film resistors, MOSFETs and quantum dots are presented.
Anglický abstrakt
Klíčová slova
Noise, non-linearity, reliability indicators.
Klíčová slova v angličtině
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Vydáno
01.01.2004
ISSN
0352-9045
Periodikum
INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS
Svazek
2003
Číslo
4
Stát
Slovinská republika
Strany od
213
Strany do
221
Strany počet
9
BibTex
@article{BUT42097, author="Josef {Šikula} and Vlasta {Sedláková} and Pavel {Dobis}", title="Noise and Non-Linearity as Reliability Indicators of Electronic Devices", journal="INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS", year="2004", volume="2003", number="4", pages="213--221", issn="0352-9045" }