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doc. Ing.
Ph.D.
FME, IPE DPSN – Associate professor
+420 54114 2832prusa@fme.vutbr.cz
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2025
PRAJZLER, V.; GUO, Z.; PRŮŠA, S.; TODD, R. Residual chlorine prevents full densification of 3 mol% yttria-stabilized zirconia ceramics during ultrafast high-temperature sintering (UHS). Journal of the European Ceramic Society, 2025, vol. 45, no. 16, p. 1-6. ISSN: 1873-619X.
WoS Article
PINDER, J.; MALATINOVÁ, M.; KOVAŘÍK, M.; AUSTIN, D.; ŠIKOLA, T.; TOUGAARD, S.; MORGAN, D.; ISAACS, M.; PRŮŠA, S.; LINFORD, M. Much Ado About Nothing? Background Anomalies Without Accompanying Primary Peaks in X-Ray Photoelectron Spectroscopy and Low Energy Ion Scattering. SURFACE AND INTERFACE ANALYSIS, 2025, vol. 57, no. 4, p. 264-274.
DAVID, J.; JEŘÁBEK, F.; PROCHÁZKA, P.; ČERNÝ, M.; CIOBANU, C.; PRŮŠA, S.; ŠIKOLA, T.; KODAMBAKA, S.; KOLÍBAL, M. Direct Observation of Structural Phase Transformations during Phosphorene Formation on Cu(111). ACS Nano, 2025, vol. 19, no. 4, p. 4289-4298. ISSN: 1936-086X.
2024
VANÍČKOVÁ, E.; PRŮŠA, S.; ŠIKOLA, T. Signal oscillations in helium scattering by bismuth atoms in the low energy range. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2024, vol. 553, no. August, 7 p. ISSN: 1872-9584.
PRŮŠA, S.; LINFORD, M.; VANÍČKOVÁ, E.; BÁBÍK, P.; PINDER, J. W:; ŠIKOLA, T.; BRONGERSMA, H. A practical guide to interpreting low energy ion scattering (LEIS) spectra. APPLIED SURFACE SCIENCE, 2024, vol. 657, no. 1, 20 p. ISSN: 0169-4332.
STANĚK, J.; PRŮŠA, S.; STRAPKO, T.; ŠIKOLA, T. Ag polycrystal and monocrystal by high sensitivity-low energy ion scattering. Surface Science Spectra, 2024, vol. 31, no. 2, 14 p. ISSN: 1520-8575.
2023
MOTYČKOVÁ, L.; ARREGI URIBEETXEBARRIA, J.; STAŇO, M.; PRŮŠA, S.; ČÁSTKOVÁ, K.; UHLÍŘ, V. Preserving Metamagnetism in Self-Assembled FeRh Nanomagnets. ACS Applied Materials & Interfaces, 2023, vol. 15, no. 6, p. 8653-8665. ISSN: 1944-8252.
AVVAL, T.; PRŮŠA, S.; ČECHAL, J.; CUSHMAN, C. V.; HODGES, G. T.; FEARN, S.; KIM, S. H.;ČECHAL, J.; VANÍČKOVÁ, E.; BÁBÍK, P.; ŠIKOLA, T.; BRONGERSMA, H. H.; LINFORD, M. R. A tag-and-count approach for quantifying surface silanol densities on fused silica based on atomic layer deposition and high-sensitivity low-energy ion scattering. APPLIED SURFACE SCIENCE, 2023, vol. 607, no. 154551, 9 p. ISSN: 0169-4332.
Moeini, B.; Pinder, JW.; Avval, TG.; Jacobsen, C.; Brongersma, HH.; Prusa, S.; Bábik, P.; Vanicková, E.; Argyle, MD.; Strohmeier, BR.; Jones, B.; Shollenberger, D.; Bell, DS.; Linford, MR. Controlling the surface silanol density in capillary columns and planar silicon via the self-limiting, gas-phase deposition of tris(dimethylamino) methylsilane, and quantification of surface silanols after silanization by low energy ion scattering. JOURNAL OF CHROMATOGRAPHY A, 2023, vol. 1707, no. 464248, 9 p. ISSN: 1873-3778.
Moeini, B.; Avval, TG.; Brongersma, HH.; Prusa, S.; Babik, P.; Vanickova, E.; Strohmeier, BR.; Bell, DS.; Eggett, D.; George, SM.; Linford, MR. Area-Selective Atomic Layer Deposition of ZnO on Si\SiO2 Modified with Tris(dimethylamino)methylsilane. Materials, 2023, vol. 16, no. 13, 13 p. ISSN: 1996-1944.
VANÍČKOVÁ, E.; PRŮŠA, S.; ŠIKOLA, T. Bismuth, by high-sensitivity low energy ion scattering. Surface Science Spectra, 2023, vol. 30, no. 2, p. 1-15. ISSN: 1520-8575.
Major, GH.; Pinder, JW.; Austin, DE.; Baer, DR.; Castle, SL.; Cechal, J. ; Clark, BM.; Cohen, H.; Counsell, J.; Herrera-Gomez, A.; Govindan, P.; Kim, SH.; Morgan, DJ.; Opila, RL.; Powell, CJ.; Prusa, S.; Roberts, A.; Rocca, M.; Shirahata, N.; Sikola, T.; Smith, EF.; So, RC.; Stovall, JE.; Strunk, J.; Teplyakov, A.; Terry, J.; Weber, S.G.; Linford, M.R.;. Perspective on improving the quality of surface and material data analysis in the scientific literature with a focus on x-ray photoelectron spectroscopy (XPS). JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2023, vol. 41, no. 3, 17 p. ISSN: 1520-8559.
2021
AVVAL, T. G.; PRŮŠA, S.; CHAPMAN, S. C.; LINFORD, M. R.; ŠIKOLA, T.; BRONGERSMA, H. H. Zinc and copper, by high sensitivity-low energy ion scattering. Surface Science Spectra, 2021, vol. 28, no. 1, p. 1-8. ISSN: 1055-5269.
2020
FIKÁČEK, J.; PROCHÁZKA, P.; STETSOVYCH, V.; PRŮŠA, S.; VONDRÁČEK, M.; KORMOŠ, L.; SKÁLA, T.; VLAIC, P.; CAHA, O.; CARVA, K.; ČECHAL, J.; SPRINGHOLZ, G.; HONOLKA, J. Step-edge assisted large scale FeSe monolayer growth on epitaxial Bi(2)Se(3)thin films. NEW JOURNAL OF PHYSICS, 2020, vol. 22, no. 7, p. 1-12. ISSN: 1367-2630.
UHLÍŘ, V.; PRESSACCO, F.; ARREGI URIBEETXEBARRIA, J.; PROCHÁZKA, P.; PRŮŠA, S.; POTOČEK, M.; ŠIKOLA, T.; ČECHAL, J.; BENDOUNAN, A.; SIROTTI, F. Single-layer graphene on epitaxial FeRh thin films. APPLIED SURFACE SCIENCE, 2020, vol. 514, no. 1, p. 145923-1 (145923-7 p.)ISSN: 0169-4332.
PRŮŠA, S.; BÁBÍK, P.; ŠIKOLA, T.; BRONGERSMA, H. Quantitative analysis of calcium and fluorine by high-sensitivity low-energy ion scattering: Calcium fluoride. SURFACE AND INTERFACE ANALYSIS, 2020, vol. 52, no. 1, p. 1000-1003. ISSN: 0142-2421.
PRŮŠA, S.; BÁBÍK, P.; MACH, J.; STRAPKO, T.; ŠIKOLA, T.; BRONGERSMA, H. Calcium and fluorine signals in HS-LEIS for CaF2(111) and powder-Quantification of atomic surface concentrations using LiF(001), Ca, and Cu references. Surface Science Spectra, 2020, vol. 27, no. 2, p. 1-13. ISSN: 1055-5269.
2019
REDONDO, J.; LAZAR, P.; PROCHÁZKA, P.; PRŮŠA, S.; MALLADA, B.; CAHLÍK, A.; LACHNITT, J.; BERGER, J.; ŠMÍD, B.; KORMOŠ, L.; JELÍNEK, A.; ČECHAL, J.; ŠVEC, M. Identification of Two-Dimensional FeO2 Termination of Bulk Hematite α‑Fe2O3(0001) Surface. Journal of Physical Chemistry C, 2019, vol. 123, no. 23, p. 14312-14318. ISSN: 1932-7447.
PRAJZLER, V.; PRŮŠA, S.; MACA, K. Rapid pressure-less sintering of fine grained zirconia ceramics: Explanation and elimination of a core-shell structure. Journal of the European Ceramic Society, 2019, vol. 39, no. 16, p. 5309-5319. ISSN: 0955-2219.
2015
BÁBOR, P.; DUDA, R.; POLČÁK, J.; PRŮŠA, S.; POTOČEK, M.; VARGA, P.; ČECHAL, J.; ŠIKOLA, T. Real-time observation of self-limiting SiO2/Si decomposition catalysed by gold silicide droplets. RSC Advances, 2015, vol. 5, no. 123, p. 101726-101731. ISSN: 2046-2069.
PRŮŠA, S.; PROCHÁZKA, P.; BÁBOR, P.; ŠIKOLA, T.; TER VEEN, R.; FARTMANN, M.; GREHL, T.; BRÜNER, P.; ROTH, D.; BAUER, P.; BRONGERSMA, H. Highly Sensitive Detection of Surface and Intercalated Impurities in Graphene by LEIS. Langmuir, 2015, vol. 31, no. 35, p. 9628-9635. ISSN: 0743-7463.
2012
SPOUSTA, J.; PRŮŠA, S.; TROJÁNEK, A.; DUB, P. Kvalitní učebnice fyziky - důležitá opora výuky. Československý časopis pro fyziku, 2012, roč. 62, č. 5-6, s. 421-425. ISSN: 0009-0700.
Peer-reviewed article not indexed in WoS or Scopus
TOPINKA, S.; PRŮŠA, S. Posílení experimentální činnosti žáků při výuce tématického celku - magnetismus. Československý časopis pro fyziku, 2012, roč. 62, č. 5-6, s. 413-415. ISSN: 0009-0700.
2011
JULIŠ, M.; KUSMIČ, D.; ŠMÍD, M.; PRŮŠA, S.; POSPÍŠILOVÁ, S.; OBRTLÍK, K.; PODRÁBSKÝ, T. Surface relief observation in fatigued cast superalloy Inconel 738LC using CSLM, SEM-FEG and AFM. In International Conference on Military Technology ICMT'11. 1. Brno: University of Defence (Univerzita obrany), 2011. p. 1493-1499. ISBN: 978-80-7231-787-5.
Paper in proceedings (conference paper)
JULIŠ, M.; KUSMIČ, D.; POSPÍŠILOVÁ, S.; PRŮŠA, S.; OBRTLÍK, K.; DLUHOŠ, J.; PODRÁBSKÝ, T. Study of Surface Relief Evolution in Cyclically Strained Superalloy IN738LC Using advanced Experimental Techniques. CHEMICKE LISTY, 2011, vol. 105, no. S, p. 814-815. ISSN: 0009-2770.
BÁBOR, P.; DUDA, R.; PRŮŠA, S.; MATLOCHA, T.; KOLÍBAL, M.; ČECHAL, J.; URBÁNEK, M.; ŠIKOLA, T. Depth resolution enhancement by combined DSIMS and TOF-LEIS profiling. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2011, vol. 269, no. 3, p. 369-373. ISSN: 0168-583X.
2010
POLČÁK, J.; ČECHAL, J.; BÁBOR, P.; URBÁNEK, M.; PRŮŠA, S.; ŠIKOLA, T. Angle-resolved XPS depth profiling of modeled structures: testing and improvement of the method. SURFACE AND INTERFACE ANALYSIS, 2010, vol. 42, no. 5-6, p. 649-652. ISSN: 0142-2421.
MATLOCHA, T.; PRŮŠA, S.; KOLÍBAL, M.; BÁBOR, P.; PRIMETZHOFER, D.; MARKIN, S.; BAUER, P.; ŠIKOLA, T. A study of a LEIS azimuthal scan behavior: Classical dynamics simulation. SURFACE SCIENCE, 2010, vol. 604, no. 21-22, p. 1906-1911. ISSN: 0039-6028.
2009
BÁBOR, P.; DUDA, R.; PRŮŠA, S.; MATLOCHA, T.; KOLÍBAL, M.; KALOUSEK, R.; NEUMAN, J.; URBÁNEK, M.; ŠIKOLA, T. Mechanika iontů jako prostředek k analýze nanosvěta. Jemná mechanika a optika, 2009, roč. 54, č. 7-8, s. 209-214. ISSN: 0447-6441.
2008
HOLÁ, M.; -KONEČNÁ, V.; -MIKUŠKA, P.; -KAISER, J.; -PÁLENÍKOVÁ, K.; -PRŮŠA, S.; -HANZLÍKOVÁ, R.; -KANICKÝ, V. Study of aerosols generated by 213 nm laser ablation of cobalt-cemented hard metals. JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 2008, vol. 23, no. 10, p. 1341-1349. ISSN: 0267-9477.
MARKIN, S.; PRIMETZHOFER, D.; PRŮŠA, S.; BRUNMAYR, M.; KOWARIK, G.; AUMAYR, F.; BAUER, P. Electronic interaction of very slow light ions in Au: Electronic stopping and electron emission. PHYSICAL REVIEW B, 2008, vol. 78, no. 19, p. 195122-1 (195122-6 p.)ISSN: 1098-0121.
PRIMETZHOFER, D.; MARKIN, S.; ZEPPENFELD, P.; BAUER, P.; PRŮŠA, S.; KOLÍBAL, M.; ŠIKOLA, T. Quantitative analysis of ultra thin layer growth by time-of-flight low energy ion scattering. Applied Physics Letters, 2008, vol. 92, no. 1, p. 011929-1 (011929-3 p.)ISSN: 0003-6951.
2007
PRŮŠA, S.; KOLÍBAL, M.; BÁBOR, P.; MACH, J.; ŠIKOLA, T. Analysis of thin films by TOF-LEIS. ACTA PHYSICA POLONICA A, 2007, vol. 111, no. 3, p. 335-341. ISSN: 0587-4246.
KOLÍBAL, M.; TOMANEC, O.; PRŮŠA, S.; PLOJHAR, M.; MARKIN, S.; DITTRICHOVÁ, L.; SPOUSTA, J.; BAUER, P.; ŠIKOLA, T. TOF-LEIS spectra of Ga/Si: Peak shape analysis. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2007, vol. 265, no. 2, p. 569-575. ISSN: 0168-583X.
2006
KOLÍBAL, M.; PRŮŠA, S.; PLOJHAR, M.; BÁBOR, P.; POTOČEK, M.; TOMANEC, O.; KOSTELNÍK, P.; MARKIN, S.; BAUER, P.; ŠIKOLA, T. In situ Analysis of Ga-ultra Thin Films by ToF-LEIS. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2006, vol. 249, no. 1-2, p. 318-321. ISSN: 0168-583X.
2005
DRAXLER, M.; MARKIN, S.; KOLÍBAL, M.; PRŮŠA, S.; ŠIKOLA, T.; BAUER, P. High resolution time-of-flight low energy ion scattering. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2005, vol. 230, no. 0, p. 398-401. ISSN: 0168-583X.
2004
KOLÍBAL, M.; PRŮŠA, S.; BÁBOR, P.; ŠIKOLA, T. Low energy ion scattering as a method for surface structure analysis. Jemná mechanika a optika, 2004, vol. 9, no. 9, 4 p. ISSN: 0447-6441.
VOBORNÝ, S.; KOLÍBAL, M.; MACH, J.; ČECHAL, J.; BÁBOR, P.; PRŮŠA, S.; SPOUSTA, J.; ŠIKOLA, T. Deposition and in-situ charakterization of ultra-thin films. Thin Solid Films, 2004, vol. 459, no. 1-2, 5 p. ISSN: 0040-6090.
KOLÍBAL, M.; PRŮŠA, S.; BÁBOR, P.; ŠIKOLA, T. ToF-LEIS Analysis of ultra thin films: Ga and Ga-N layer growth on Si(111). SURFACE SCIENCE, 2004, vol. 566-568, no. 9, 5 p. ISSN: 0039-6028.
KOLÍBAL, M., PRŮŠA, S., BÁBOR, P., BARTOŠÍK, M., TOMANEC, O., ŠIKOLA, T. Growth of gallium on sillicon: A TOF-LEIS and AFM study. In New Trend in Physics. Brno: VUT v Brně, 2004. 4 p. ISBN: 80-7355-024-5.
2003
VOBORNÝ, S., KOLÍBAL, M., MACH, J., ČECHAL, J., BÁBOR, P., PRŮŠA, S., SPOUSTA, J., ŠIKOLA, T. Deposition and in situ characterization of ultra-thin films. In EVC'03 Abstracts. Berlin: EVC, 2003. 2 p.
BÁBOR, P., KOLÍBAL, M., PRŮŠA, S., ŠIKOLA, T. Application of a simple imaging system in SIMS and TOF LEIS. In ECOSS 22 CD. Praha: FÚ AV ČR, 2003. 2 p.
KOLÍBAL, M., PRŮŠA, S., BÁBOR, P., BAUER, P., ŠIKOLA, T. TOF-LEIS analysis of ultra thin films: Ga- and Ga-N layer growth on Si (111). In ECOSS 22 CD. Praha: FÚ AV ČR, 2003. 2 p.
PRŮŠA, S., KOLÍBAL, M., BÁBOR, P., MACH, J., JURKOVIČ, P., ŠIKOLA, T. Analysis of thin films by TOF LEIS. In EVC'03 Abstracts. Berlin: EVC, 2003. 2 p.
2001
PRŮŠA, S., ŠIKOLA, T., BÁBOR, P. Application of ToF - LEIS for Analysis of Surfaces and Ultra Thin Films. In Sborník příspěvků konference Nové trendy ve fyzice. Brno: FEI VUT v Brně, 2001. 6 p. ISBN: 80-214-1992-X.
PRŮŠA, S., ŠIKOLA, T., SPOUSTA, J., VOBORNÝ, S., BÁBOR, P., JURKOVIČ, P., ČECHAL, J. Application of TOF - LEIS and XPS for Surface Studies. In Materials Structure & Micromechanics of Fracture (MSMF-3). Brno: Vutium, 2001. 8 p. ISBN: 80-214-1892-3.
PRŮŠA, S., ŠIKOLA, T., VOBORNÝ, S., BÁBOR, P. Ion Scattering Spectrosopy - A Tool for Surface Analysis. In Juniormat '01 sborník. Brno: Fakulta strojního inženýrství VUT v Brně, 2001. 5 p.
VOBORNÝ, S., ŠIKOLA, T., PRŮŠA, S., ZLÁMAL, J., BÁBOR, P. Diagnostics and optimization of ion source parameters. In Sborník příspěvků konference Nové trendy ve fyzice. Brno: FEI VUT v Brně, 2001. 6 p. ISBN: 80-214-1992-X.
2000
PRŮŠA, S. Monitorování povrchů pevných vzorků a ultratenkých vrstev pomocí ToF spektroskopie. In II. sborník příspěvků doktorandů, konference u příležitosti 100. výročí založení FSI. Brno: Vutium, 2000. 4 s.
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