Detail publikačního výsledku

Analysis of thin films by TOF LEIS

PRŮŠA, S., KOLÍBAL, M., BÁBOR, P., MACH, J., JURKOVIČ, P., ŠIKOLA, T.

Original Title

Analysis of thin films by TOF LEIS

English Title

Analysis of thin films by TOF LEIS

Type

Paper in proceedings (conference paper)

Original Abstract

Structural analysis using TOF LEIS.

English abstract

Structural analysis using TOF LEIS.

Key words in English

TOF LEIS, Ga, thin films

Authors

PRŮŠA, S., KOLÍBAL, M., BÁBOR, P., MACH, J., JURKOVIČ, P., ŠIKOLA, T.

Released

23.06.2003

Publisher

EVC

Location

Berlin

Book

EVC'03 Abstracts

Pages from

133

Pages count

2

Full text in the Digital Library

http://hdl.handle.net/

BibTex

@inproceedings{BUT11057,
  author="Stanislav {Průša} and Miroslav {Kolíbal} and Petr {Bábor} and Jindřich {Mach} and Patrik {Jurkovič} and Tomáš {Šikola}",
  title="Analysis of thin films by TOF LEIS",
  booktitle="EVC'03 Abstracts",
  year="2003",
  pages="2",
  publisher="EVC",
  address="Berlin"
}