Publication result detail

High resolution time-of-flight low energy ion scattering

DRAXLER, M.; MARKIN, S.; KOLÍBAL, M.; PRŮŠA, S.; ŠIKOLA, T.; BAUER, P.

Original Title

High resolution time-of-flight low energy ion scattering

English Title

High resolution time-of-flight low energy ion scattering

Type

Peer-reviewed article not indexed in WoS or Scopus

Original Abstract

Low energy ion scattering (LEIS) is a well known technique for quantitative composition and structure analysis. Two different detection methods can be used in a LEIS experiment, i.e. an electrostatic analyzer or a time-of-flight (TOF) spectrometer. Both techniques have specific advantages. Nevertheless, the time-of-flight technique surpasses usual electrostatic analyzers used in LEIS in terms of energy resolution.The possibility to measure ions and neutrals, and the better energy resolution permit to study neutralization or charge exchange processes in much more detail. Here we present a TOF LEIS setup with an energy resolution of better than 0.4% for 3 keV He ions and report experimental results for 3 keV He ions backscattered from a polycrystalline Cu target. The resulting ion spectrum shows interesting inherent features, which are analyzed. Possible causes for the appearance of these features are discussed.

English abstract

Low energy ion scattering (LEIS) is a well known technique for quantitative composition and structure analysis. Two different detection methods can be used in a LEIS experiment, i.e. an electrostatic analyzer or a time-of-flight (TOF) spectrometer. Both techniques have specific advantages. Nevertheless, the time-of-flight technique surpasses usual electrostatic analyzers used in LEIS in terms of energy resolution.The possibility to measure ions and neutrals, and the better energy resolution permit to study neutralization or charge exchange processes in much more detail. Here we present a TOF LEIS setup with an energy resolution of better than 0.4% for 3 keV He ions and report experimental results for 3 keV He ions backscattered from a polycrystalline Cu target. The resulting ion spectrum shows interesting inherent features, which are analyzed. Possible causes for the appearance of these features are discussed.

Keywords

High resolution; TOF; LEIS; He; Cu

Key words in English

High resolution; TOF; LEIS; He; Cu

Authors

DRAXLER, M.; MARKIN, S.; KOLÍBAL, M.; PRŮŠA, S.; ŠIKOLA, T.; BAUER, P.

Released

15.04.2005

Publisher

Elsevier

ISBN

0168-583X

Periodical

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS

Volume

230

State

Kingdom of the Netherlands

Pages from

398

Pages to

401

Pages count

4

BibTex

@article{BUT45588,
  author="M. {Draxler} and S. N. {Markin} and Miroslav {Kolíbal} and Stanislav {Průša} and Tomáš {Šikola} and P. {Bauer}",
  title="High resolution time-of-flight low energy ion scattering",
  journal="NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS",
  year="2005",
  volume="230",
  number="0",
  pages="398--401",
  issn="0168-583X"
}