Publication result detail

Low energy ion scattering as a method for surface structure analysis

KOLÍBAL, M.; PRŮŠA, S.; BÁBOR, P.; ŠIKOLA, T.

Original Title

Low energy ion scattering as a method for surface structure analysis

English Title

Low energy ion scattering as a method for surface structure analysis

Type

Peer-reviewed article not indexed in WoS or Scopus

Original Abstract

Paper dals with a low energy ion scattering as a method for surface structure analysis. The ToF LEIS instrumentation is presented.

English abstract

Paper dals with a low energy ion scattering as a method for surface structure analysis. The ToF LEIS instrumentation is presented.

Key words in English

Ga, ToF, LEIS, structural analysis

Authors

KOLÍBAL, M.; PRŮŠA, S.; BÁBOR, P.; ŠIKOLA, T.

RIV year

2011

Released

01.01.2004

ISBN

0447-6441

Periodical

Jemná mechanika a optika

Volume

9

Number

9

State

Czech Republic

Pages from

262

Pages count

4

BibTex

@article{BUT42365,
  author="Miroslav {Kolíbal} and Stanislav {Průša} and Petr {Bábor} and Tomáš {Šikola}",
  title="Low energy ion scattering as a method for surface structure analysis",
  journal="Jemná mechanika a optika",
  year="2004",
  volume="9",
  number="9",
  pages="4",
  issn="0447-6441"
}