Publication result detail

Application of TOF - LEIS and XPS for Surface Studies.

PRŮŠA, S., ŠIKOLA, T., SPOUSTA, J., VOBORNÝ, S., BÁBOR, P., JURKOVIČ, P., ČECHAL, J.

Original Title

Application of TOF - LEIS and XPS for Surface Studies.

English Title

Application of TOF - LEIS and XPS for Surface Studies.

Type

Paper in proceedings (conference paper)

Original Abstract

In the contribution complementary experiments on analysis of surfaces using time-of-flight low energy ion scattering (TOF-LEIS) and x-ray photoelectron spectroscopy (XPS) will be presented. The attention will be paid both to analysis of surfaces and ultra-thin films (e.g. Ga) prepared in situ under UHV conditions. The advantages of simultaneous application of two complementary techniques to surface analysis will be clearly demonstrated.

English abstract

In the contribution complementary experiments on analysis of surfaces using time-of-flight low energy ion scattering (TOF-LEIS) and x-ray photoelectron spectroscopy (XPS) will be presented. The attention will be paid both to analysis of surfaces and ultra-thin films (e.g. Ga) prepared in situ under UHV conditions. The advantages of simultaneous application of two complementary techniques to surface analysis will be clearly demonstrated.

Key words in English

SIMS, TOF

Authors

PRŮŠA, S., ŠIKOLA, T., SPOUSTA, J., VOBORNÝ, S., BÁBOR, P., JURKOVIČ, P., ČECHAL, J.

RIV year

2011

Released

27.06.2001

Publisher

Vutium

Location

Brno

ISBN

80-214-1892-3

Book

Materials Structure & Micromechanics of Fracture (MSMF-3)

Pages from

486

Pages count

8

BibTex

@inproceedings{BUT6287,
  author="Stanislav {Průša} and Tomáš {Šikola} and Jiří {Spousta} and Stanislav {Voborný} and Petr {Bábor} and Patrik {Jurkovič} and Jan {Čechal}",
  title="Application of TOF - LEIS and XPS for Surface Studies.",
  booktitle="Materials Structure & Micromechanics of Fracture (MSMF-3)",
  year="2001",
  pages="8",
  publisher="Vutium",
  address="Brno",
  isbn="80-214-1892-3"
}