Detail publikace

Finite Element Model in LTspice of a Distributed RC-Structure Fractional-Order Capacitor Device

PROKUP, L. KUBÁNEK, D. FREEBORN, T.

Originální název

Finite Element Model in LTspice of a Distributed RC-Structure Fractional-Order Capacitor Device

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Fractional-order capacitors can potentially be fabricated using MOS technologies taking advantage of their distributed resistive-capacitive structure. However, there are limited models to simulate the characteristics of these designs. In this work, an equivalent circuit model to represent a finite-element of a MOS structure is used to assemble a hierarchical model of a complete design in LTspice. This equivalent circuit model is validated (for designs with phases of -77°, -74°, -58°, and -53° with a maximum of ±2° tolerance) against previously established matrix model representations. Using this validated model varying gate length connections (from 100% to 6.25%) caused deviations less than 0.25° supporting that this characteristic of MOS technologies is not likely to have a significant effect on fabricated designs.

Klíčová slova

Circuits and systems;Design methodology;Capacitors;Logic gates;Finite element analysis;Integrated circuit modeling;Equivalent circuits

Autoři

PROKUP, L.; KUBÁNEK, D.; FREEBORN, T.

Vydáno

22. 3. 2025

Nakladatel

IEEE

Místo

Concord, NC, USA

ISBN

979-8-3315-0484-7

Kniha

Proceedings of IEEE SoutheastCon 2025 Conference

Strany od

1494

Strany do

1500

Strany počet

7

URL

https://ieeexplore.ieee.org/document/10971518

BibTex

@inproceedings{BUT197769,
  author="Lauryn {Prokup} and David {Kubánek} and Todd {Freeborn}",
  title="Finite Element Model in LTspice of a Distributed RC-Structure Fractional-Order Capacitor Device",
  booktitle="Proceedings of IEEE SoutheastCon 2025 Conference",
  year="2025",
  pages="1494--1500",
  publisher="IEEE",
  address="Concord, NC, USA",
  doi="10.1109/SoutheastCon56624.2025.10971518",
  isbn="979-8-3315-0484-7",
  url="https://ieeexplore.ieee.org/document/10971518"
}