Detail publikačního výsledku

High resolution time-of-flight low energy ion scattering

DRAXLER, M.; MARKIN, S.; KOLÍBAL, M.; PRŮŠA, S.; ŠIKOLA, T.; BAUER, P.

Originální název

High resolution time-of-flight low energy ion scattering

Anglický název

High resolution time-of-flight low energy ion scattering

Druh

Článek recenzovaný mimo WoS a Scopus

Originální abstrakt

Low energy ion scattering (LEIS) is a well known technique for quantitative composition and structure analysis. Two different detection methods can be used in a LEIS experiment, i.e. an electrostatic analyzer or a time-of-flight (TOF) spectrometer. Both techniques have specific advantages. Nevertheless, the time-of-flight technique surpasses usual electrostatic analyzers used in LEIS in terms of energy resolution.The possibility to measure ions and neutrals, and the better energy resolution permit to study neutralization or charge exchange processes in much more detail. Here we present a TOF LEIS setup with an energy resolution of better than 0.4% for 3 keV He ions and report experimental results for 3 keV He ions backscattered from a polycrystalline Cu target. The resulting ion spectrum shows interesting inherent features, which are analyzed. Possible causes for the appearance of these features are discussed.

Anglický abstrakt

Low energy ion scattering (LEIS) is a well known technique for quantitative composition and structure analysis. Two different detection methods can be used in a LEIS experiment, i.e. an electrostatic analyzer or a time-of-flight (TOF) spectrometer. Both techniques have specific advantages. Nevertheless, the time-of-flight technique surpasses usual electrostatic analyzers used in LEIS in terms of energy resolution.The possibility to measure ions and neutrals, and the better energy resolution permit to study neutralization or charge exchange processes in much more detail. Here we present a TOF LEIS setup with an energy resolution of better than 0.4% for 3 keV He ions and report experimental results for 3 keV He ions backscattered from a polycrystalline Cu target. The resulting ion spectrum shows interesting inherent features, which are analyzed. Possible causes for the appearance of these features are discussed.

Klíčová slova

High resolution; TOF; LEIS; He; Cu

Klíčová slova v angličtině

High resolution; TOF; LEIS; He; Cu

Autoři

DRAXLER, M.; MARKIN, S.; KOLÍBAL, M.; PRŮŠA, S.; ŠIKOLA, T.; BAUER, P.

Vydáno

15.04.2005

Nakladatel

Elsevier

ISSN

0168-583X

Periodikum

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS

Svazek

230

Stát

Nizozemsko

Strany od

398

Strany do

401

Strany počet

4

Plný text v Digitální knihovně

http://hdl.handle.net/

BibTex

@article{BUT45588,
  author="M. {Draxler} and S. N. {Markin} and Miroslav {Kolíbal} and Stanislav {Průša} and Tomáš {Šikola} and P. {Bauer}",
  title="High resolution time-of-flight low energy ion scattering",
  journal="NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS",
  year="2005",
  volume="230",
  number="0",
  pages="398--401",
  issn="0168-583X"
}