Detail publikačního výsledku

Scanning near-field optical microscopy

ŠKARVADA, P.

Originální název

Scanning near-field optical microscopy

Anglický název

Scanning near-field optical microscopy

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

Optical microscopy with local probe in the near field has several advantages against other microscopy types. Main advantages are: easy use, minimal preparation of sample and possibility to get some extra information about sample. There are two basic modes: reflection mode and transmission mode. For sample surface topography measuring fiber quartz system based on shear forces between the tip and sample is used. Topography of sample is important because it allows to keep the distance between the tip and the sample surface constant and this is necessary for increasing the signal to noise ratio. As a probe is being used a metal coated optical fiber taper. During the scanning it is possible to get some extra information. In the case of reflection mode microscope configuration it is local reflection of sample. This characteristic of sample allows specifying some defects of the structure.

Anglický abstrakt

Optical microscopy with local probe in the near field has several advantages against other microscopy types. Main advantages are: easy use, minimal preparation of sample and possibility to get some extra information about sample. There are two basic modes: reflection mode and transmission mode. For sample surface topography measuring fiber quartz system based on shear forces between the tip and sample is used. Topography of sample is important because it allows to keep the distance between the tip and the sample surface constant and this is necessary for increasing the signal to noise ratio. As a probe is being used a metal coated optical fiber taper. During the scanning it is possible to get some extra information. In the case of reflection mode microscope configuration it is local reflection of sample. This characteristic of sample allows specifying some defects of the structure.

Klíčová slova

Near-field optical microscopy, SNOM, Shear forces, Topography, Reflectivity

Klíčová slova v angličtině

Near-field optical microscopy, SNOM, Shear forces, Topography, Reflectivity

Autoři

ŠKARVADA, P.

Vydáno

14.11.2007

Nakladatel

Ing. Zdeněk Novotný Csc.

Místo

Brno

ISBN

978-80-7355-078-3

Kniha

New Trends in Physics

Strany od

274

Strany do

277

Strany počet

4

Plný text v Digitální knihovně

http://hdl.handle.net/

BibTex

@inproceedings{BUT28526,
  author="Pavel {Škarvada}",
  title="Scanning near-field optical microscopy",
  booktitle="New Trends in Physics",
  year="2007",
  number="první",
  pages="274--277",
  publisher="Ing. Zdeněk Novotný Csc.",
  address="Brno",
  isbn="978-80-7355-078-3"
}