Transmission Holographic Microscope - Image Characteristics

Transmission Holographic Microscope - Image Characteristics

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The intensity of the reconstructed image in the transmission holographic microscope is depth discriminated as it is in a transmission confocal microscope. The effect is the consequence of the limited coherence of the illumination - hence no scanning system is needed. As the technique is based on the incoherent holography, the phase image component may be reconstructed in addition to the intensity one. The overall imaging process is coherent. Its three-dimensional coherent transfer function is derived using the first Born approximation of the scattering theory. In order to understand clearly the imaging process of the microscope, two-dimensional imaging characteristics are derived in this paper in addition to the three-dimensional one, and images of a rectilinear slit as a model two-dimensional structure are calculated for various amounts of defocus. Theoretical axial distributions of the intensity integral are compared with the experimental ones.

The intensity of the reconstructed image in the transmission holographic microscope is depth discriminated as it is in a transmission confocal microscope. The effect is the consequence of the limited coherence of the illumination - hence no scanning system is needed. As the technique is based on the incoherent holography, the phase image component may be reconstructed in addition to the intensity one. The overall imaging process is coherent. Its three-dimensional coherent transfer function is derived using the first Born approximation of the scattering theory. In order to understand clearly the imaging process of the microscope, two-dimensional imaging characteristics are derived in this paper in addition to the three-dimensional one, and images of a rectilinear slit as a model two-dimensional structure are calculated for various amounts of defocus. Theoretical axial distributions of the intensity integral are compared with the experimental ones.

holographic applications; confocal microscopy; interference microscopy; three-dimensional microscopy

holographic applications; confocal microscopy; interference microscopy; three-dimensional microscopy

CHMELÍK, R.; KOLMAN, P.; LOVICAR, L.; SUCHOMEL, F.

01.01.2005

SPIE-The International Society for Optical Engineering

Bellingham, USA

0-8194-5951-8

14th Slovak-Czech-Polish Conference on Wave and Quantum Aspects of Contemporary optics

Proceedings of SPIE

59450V-1

59450V-6

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