Detail publikace

Determination of the yield stress in Al thin film by applying bulge test

Tinoco, H.A. Holzer, J. Pikálek, T. Sobota, J. Fort, T. Matejka, M. Kruml, T. Hutar, P.

Originální název

Determination of the yield stress in Al thin film by applying bulge test

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

In this work, we have applied an improved method to determine the yield stress and residual stress in a freestanding thin aluminum film by analysing experimental data obtained by the bulge test. The Al thin film was deposited by a magnetron sputtering technique. The film was cyclically loaded with increasing maximum gas pressure. The method to determine the plasticity parameters is based on the load-deflection relation that presents a linear behavior in the elastic regime when it is scaled with the displacement parameter. The plastic deformation induces nonlinear effects that allow determining the elastic limit of the film. At that point, the gas pressure value that generates the elastoplastic transition is identified on the scaled curve. For a bulged square film, the curvatures are computed from an approximated spatial deflection equation to calculate the stresses within the proposed model. The analysis enables construction of biaxial stress-strain curve for the studied film and determination of the yield st

Klíčová slova

Plastic deformation; Residual stresses; Stress-strain curves; Thin films

Autoři

Tinoco, H.A.; Holzer, J.; Pikálek, T.; Sobota, J.; Fort, T.; Matejka, M.; Kruml, T.; Hutar, P.

Vydáno

17. 2. 2021

ISSN

1742-6588

Periodikum

Journal of Physics: Conference Series

Ročník

1777

Číslo

1

Stát

Spojené království Velké Británie a Severního Irska

Strany od

1

Strany do

10

Strany počet

10

URL

https://iopscience-iop-org.ezproxy.lib.vutbr.cz/article/10.1088/1742-6596/1777/1/012030

BibTex

@inproceedings{BUT177179,
  author="Hector Andres {Tinoco Navarro} and Jakub {Holzer} and Tomáš {Kruml} and Pavel {Hutař}",
  title="Determination of the yield stress in Al thin film by applying bulge test",
  booktitle="Journal of Physics: Conference Series",
  year="2021",
  journal="Journal of Physics: Conference Series",
  volume="1777",
  number="1",
  pages="1--10",
  doi="10.1088/1742-6596/1777/1/012030",
  issn="1742-6588",
  url="https://iopscience-iop-org.ezproxy.lib.vutbr.cz/article/10.1088/1742-6596/1777/1/012030"
}