Detail publikačního výsledku

Electric Field Strength in Layered Materials with Varied Parameters

KADLEC, R.; KŘÍŽ, T.

Originální název

Electric Field Strength in Layered Materials with Varied Parameters

Anglický název

Electric Field Strength in Layered Materials with Varied Parameters

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

The authors report on an analysis of conditions on the boundary between layers having varied electromagnetic properties. Wave propagation in a layered material structure is discussed, utilizing analytical formulas for electric field strengths based on Snell's law and employing the Ray-tracing method for calculations associated with the propagation of the electromagnetic field. The analysis-related tasks are solved in the Matlab program. In our previous publications, this approach was compared with the analysis that exploits the FEM applied to the wave equation. The analytical solution includes the time-dependent propagation of electromagnetic waves in a heterogeneous medium and evaluates the distribution of the electromagnetic field on the surfaces of the boundaries at certain moments of time. The main designed algorithm facilitates simple evaluation of all components of the electromagnetic field in relation to the speed of the wave propagation in a heterogeneous medium. Silicon was chosen as a sample material. The material parameters are used with respect to their dependence on the wavelength of the electromagnetic wave; these parameters are obtained from the Refractive index database.

Anglický abstrakt

The authors report on an analysis of conditions on the boundary between layers having varied electromagnetic properties. Wave propagation in a layered material structure is discussed, utilizing analytical formulas for electric field strengths based on Snell's law and employing the Ray-tracing method for calculations associated with the propagation of the electromagnetic field. The analysis-related tasks are solved in the Matlab program. In our previous publications, this approach was compared with the analysis that exploits the FEM applied to the wave equation. The analytical solution includes the time-dependent propagation of electromagnetic waves in a heterogeneous medium and evaluates the distribution of the electromagnetic field on the surfaces of the boundaries at certain moments of time. The main designed algorithm facilitates simple evaluation of all components of the electromagnetic field in relation to the speed of the wave propagation in a heterogeneous medium. Silicon was chosen as a sample material. The material parameters are used with respect to their dependence on the wavelength of the electromagnetic wave; these parameters are obtained from the Refractive index database.

Klíčová slova

Snell's law; Ray-tracing; electromagnetic waves; heterogeneous medium

Klíčová slova v angličtině

Snell's law; Ray-tracing; electromagnetic waves; heterogeneous medium

Autoři

KADLEC, R.; KŘÍŽ, T.

Rok RIV

2019

Vydáno

01.08.2018

Nakladatel

IEEE

Místo

Toyama, Japan

ISBN

978-4-88552-316-8

Kniha

Progress in Electromagnetics Research Symposium (PIERS-Toyama)

ISSN

1559-9450

Periodikum

Progress In Electromagnetics

Stát

Spojené státy americké

Strany od

347

Strany do

351

Strany počet

5

URL

https://ieeexplore.ieee.org/document/8597924

Plný text v Digitální knihovně

http://hdl.handle.net/

BibTex

@inproceedings{BUT153288,
  author="Radim {Kadlec} and Tomáš {Kříž}",
  title="Electric Field Strength in Layered Materials with Varied Parameters",
  booktitle="Progress in Electromagnetics Research Symposium (PIERS-Toyama)",
  year="2018",
  journal="Progress In Electromagnetics",
  pages="347--351",
  publisher="IEEE",
  address="Toyama, Japan",
  doi="10.23919/PIERS.2018.8597924",
  isbn="978-4-88552-316-8",
  issn="1559-9450",
  url="https://ieeexplore.ieee.org/document/8597924"
}