Detail publikačního výsledku

Near electromagnetic field measurement of microprocessor

MARTINÁSEK, Z.; ZEMAN, V.; SYSEL, P.; TRÁSY, K.

Originální název

Near electromagnetic field measurement of microprocessor

Anglický název

Near electromagnetic field measurement of microprocessor

Druh

Článek recenzovaný mimo WoS a Scopus

Originální abstrakt

The article describe systematically the electromagnetic (EM) side channels sources and electromagnetic field of the microprocessor and is focused on the best way how to measure the near electromagnetic field of microprocessor. It was suggested and realized several electromagnetic probes and it was performed the measurement regarded to the theoretical background on the testbed with cryptographic module (microprocessor) performed the Advanced Encryption Standard (AES). On the measured waveforms of the electromagnetic emission was studied the influence of probe construction namely two parameters wire diameter and number of turns. In following measurement was studied how induced voltage depending on the distance of measuring coil to microprocessor and the last measurement dealt with position of probe and microchip.

Anglický abstrakt

The article describe systematically the electromagnetic (EM) side channels sources and electromagnetic field of the microprocessor and is focused on the best way how to measure the near electromagnetic field of microprocessor. It was suggested and realized several electromagnetic probes and it was performed the measurement regarded to the theoretical background on the testbed with cryptographic module (microprocessor) performed the Advanced Encryption Standard (AES). On the measured waveforms of the electromagnetic emission was studied the influence of probe construction namely two parameters wire diameter and number of turns. In following measurement was studied how induced voltage depending on the distance of measuring coil to microprocessor and the last measurement dealt with position of probe and microchip.

Klíčová slova

elektromagnetic analysis, EMA, side channel, electromagnetic field of microprocessor.

Klíčová slova v angličtině

elektromagnetic analysis, EMA, side channel, electromagnetic field of microprocessor.

Autoři

MARTINÁSEK, Z.; ZEMAN, V.; SYSEL, P.; TRÁSY, K.

Rok RIV

2014

Vydáno

08.02.2013

ISSN

0033-2097

Periodikum

Przeglad Elektrotechniczny

Svazek

2013

Číslo

02

Stát

Polská republika

Strany od

203

Strany do

207

Strany počet

5

BibTex

@article{BUT97831,
  author="Zdeněk {Martinásek} and Václav {Zeman} and Petr {Sysel} and Krisztina {Trásy}",
  title="Near electromagnetic field measurement of microprocessor",
  journal="Przeglad Elektrotechniczny",
  year="2013",
  volume="2013",
  number="02",
  pages="203--207",
  issn="0033-2097"
}