Detail publikačního výsledku

Testing of Substrate and Conduct Layers of the Thick Film Structures

KHATIB, S.

Originální název

Testing of Substrate and Conduct Layers of the Thick Film Structures

Anglický název

Testing of Substrate and Conduct Layers of the Thick Film Structures

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

This paper shows an overview of description of the methods which is used for testing the structure of the substrate and the conduct layers of the thick film technology. This is apart of a thesis that belong to the Thick Film Technology used for producing the biosensor.

Anglický abstrakt

This paper shows an overview of description of the methods which is used for testing the structure of the substrate and the conduct layers of the thick film technology. This is apart of a thesis that belong to the Thick Film Technology used for producing the biosensor.

Klíčová slova v angličtině

substrate, conduct layers, thick film technology, biosensors

Autoři

KHATIB, S.

Vydáno

22.09.2003

Nakladatel

Technological Institute of Crete

Místo

Chania, Greece

ISBN

80-214-2461-3

Kniha

Proceedings of the Socrates Workshop 2003. Intensive Training Programme in Electronic System Design.

Strany od

120

Strany počet

9

BibTex

@inproceedings{BUT9560,
  author="Sameh {Khatib}",
  title="Testing of Substrate and Conduct Layers of the Thick Film Structures",
  booktitle="Proceedings of the Socrates Workshop 2003. Intensive Training Programme in Electronic System Design.",
  year="2003",
  pages="9",
  publisher="Technological Institute of Crete",
  address="Chania, Greece",
  isbn="80-214-2461-3"
}