Detail publikačního výsledku

Surface Examination of Ultra-sharp Cold Field-Emission Cathode

KNÁPEK, A.; MIKMEKOVÁ, Š.; BRÜSTLOVÁ, J.; TRČKA, T.; KLAMPÁR, M.

Originální název

Surface Examination of Ultra-sharp Cold Field-Emission Cathode

Anglický název

Surface Examination of Ultra-sharp Cold Field-Emission Cathode

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

An experimental cold field-emission cathode, based on metal-oxide-insulator structure has been analyzed by several non-destructive evaluation methods in order to describe the material properties and electrical behaviour of the sample. Owing to the fact that the tip of the cathode reaches nanoscopic-scale, several different evaluation methods have been incorporated. Firstly, the scanning electron microscopy (SEM), along with the electron dispersive spectroscopy (EDS) was performed to describe general proportions of the shape and the abundance of elements present in the surface layer. Secondly, the scanning low-energy electron microscopy (SLEEM) was applied in order to visualize the crystalline microstructure of the cathode surface. Finally, the epoxy coating covering the cathode tip was characterised using the dielectric relaxation spectroscopy (DRS) method.

Anglický abstrakt

An experimental cold field-emission cathode, based on metal-oxide-insulator structure has been analyzed by several non-destructive evaluation methods in order to describe the material properties and electrical behaviour of the sample. Owing to the fact that the tip of the cathode reaches nanoscopic-scale, several different evaluation methods have been incorporated. Firstly, the scanning electron microscopy (SEM), along with the electron dispersive spectroscopy (EDS) was performed to describe general proportions of the shape and the abundance of elements present in the surface layer. Secondly, the scanning low-energy electron microscopy (SLEEM) was applied in order to visualize the crystalline microstructure of the cathode surface. Finally, the epoxy coating covering the cathode tip was characterised using the dielectric relaxation spectroscopy (DRS) method.

Klíčová slova

ultra-sharp field-emission cathode, SLEEM, DRS

Klíčová slova v angličtině

ultra-sharp field-emission cathode, SLEEM, DRS

Autoři

KNÁPEK, A.; MIKMEKOVÁ, Š.; BRÜSTLOVÁ, J.; TRČKA, T.; KLAMPÁR, M.

Rok RIV

2013

Vydáno

11.10.2012

Místo

Brno

ISBN

978-80-214-4594-9

Kniha

New Trends in Physics, NTF2012, Proceedings of the conference

Edice

první

Strany od

51

Strany do

56

Strany počet

6

BibTex

@inproceedings{BUT94351,
  author="Alexandr {Knápek} and Šárka {Mikmeková} and Jitka {Brüstlová} and Tomáš {Trčka} and Marián {Klampár}",
  title="Surface Examination of Ultra-sharp Cold Field-Emission Cathode",
  booktitle="New Trends in Physics, NTF2012, Proceedings of the conference",
  year="2012",
  series="první",
  number="1",
  pages="51--56",
  address="Brno",
  isbn="978-80-214-4594-9"
}