Detail publikace

Low-Frequency Noise and Microplasma Analysis for c-Si Solar Cell Characterization

VANĚK, J. DOLENSKÝ, J. CHOBOLA, Z. LUŇÁK, M. PORUBA, A.

Originální název

Low-Frequency Noise and Microplasma Analysis for c-Si Solar Cell Characterization

Anglický název

Low-Frequency Noise and Microplasma Analysis for c-Si Solar Cell Characterization

Jazyk

en

Originální abstrakt

This paper brings the comparison of solar cell conversion efficiency and results from a noise spectroscopy and microplasma presence to evaluate the solar cell technology. Three sets of monocrystalline silicon solar cells (c-Si) varying in front side phosphorus doped emitters were produced by standard screen-printing technique. From the measurements it follows that the noise spectral density related to defects is of 1/f type and its magnitude. It has been established that samples showing low noise feature high-conversion efficiency. The best results were reached for a group solar cells with selective emitter structure prepared by double-phosphorus diffusion process.

Anglický abstrakt

This paper brings the comparison of solar cell conversion efficiency and results from a noise spectroscopy and microplasma presence to evaluate the solar cell technology. Three sets of monocrystalline silicon solar cells (c-Si) varying in front side phosphorus doped emitters were produced by standard screen-printing technique. From the measurements it follows that the noise spectral density related to defects is of 1/f type and its magnitude. It has been established that samples showing low noise feature high-conversion efficiency. The best results were reached for a group solar cells with selective emitter structure prepared by double-phosphorus diffusion process.

Dokumenty

BibTex 


@article{BUT94101,
  author="Jiří {Vaněk} and Jan {Dolenský} and Zdeněk {Chobola} and Miroslav {Luňák} and Aleš {Poruba}",
  title="Low-Frequency Noise and Microplasma Analysis for c-Si Solar Cell Characterization",
  annote="This paper brings the comparison of solar cell conversion efficiency and results from a noise spectroscopy and microplasma presence to evaluate the solar cell technology. Three sets of monocrystalline silicon solar cells (c-Si) varying in front side phosphorus doped emitters were produced by standard screen-printing technique. From the measurements it follows that the noise spectral density related to defects is of 1/f type and its magnitude. It has been established that samples showing low noise feature high-conversion efficiency. The best results were reached for a group solar cells with selective emitter structure prepared by double-phosphorus diffusion process.",
  address="Hindawi",
  chapter="94101",
  institution="Hindawi",
  number="2012",
  volume="2012",
  year="2012",
  month="february",
  pages="1--5",
  publisher="Hindawi",
  type="journal article in Web of Science"
}