Detail publikačního výsledku

NOISE AND POLARIZATION STUDY OF DEFECT STRUCTURE OF CDTE RADIATION DETECTORS

ELHADIDY, H.; ŠIK, O.; DĚDIČ, V.; ŠIKULA, J.; FRANC, J.

Originální název

NOISE AND POLARIZATION STUDY OF DEFECT STRUCTURE OF CDTE RADIATION DETECTORS

Anglický název

NOISE AND POLARIZATION STUDY OF DEFECT STRUCTURE OF CDTE RADIATION DETECTORS

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

Polarization phenomena in a metal-semiconductor-metal (M-S-M) structure of two metallic Schottky contacts fabricated to CdTe radiation detectors were studied. We evaluate the distribution of the electric field along the biased M-S-M structure by Pockels measurements. The noise measurements of studied CdTe detectors show that the dominant noise is 1/f noise type.

Anglický abstrakt

Polarization phenomena in a metal-semiconductor-metal (M-S-M) structure of two metallic Schottky contacts fabricated to CdTe radiation detectors were studied. We evaluate the distribution of the electric field along the biased M-S-M structure by Pockels measurements. The noise measurements of studied CdTe detectors show that the dominant noise is 1/f noise type.

Klíčová slova

CdTe detector, Polarization, Pockels measurements, Noise

Klíčová slova v angličtině

CdTe detector, Polarization, Pockels measurements, Noise

Autoři

ELHADIDY, H.; ŠIK, O.; DĚDIČ, V.; ŠIKULA, J.; FRANC, J.

Rok RIV

2013

Vydáno

28.06.2012

Nakladatel

Vysoké učení technické v Brně

Místo

Brno, Antonínská 548/1

ISBN

978-80-214-4539-0

Kniha

Proc. of EDS IMAPS CS 2012. Brno

Edice

1

Strany od

314

Strany do

312

Strany počet

7

BibTex

@inproceedings{BUT92920,
  author="Hassan {Elhadidy} and Ondřej {Šik} and Václav {Dědič} and Josef {Šikula} and Jan {Franc}",
  title="NOISE AND POLARIZATION STUDY OF DEFECT STRUCTURE OF CDTE RADIATION DETECTORS",
  booktitle="Proc. of EDS IMAPS CS 2012. Brno",
  year="2012",
  series="1",
  number="17",
  pages="314--312",
  publisher="Vysoké učení technické v Brně",
  address="Brno, Antonínská 548/1",
  isbn="978-80-214-4539-0"
}