Detail publikačního výsledku

ABSOLUTE DISTANCE MEASUREMENTS WITH TUNABLE SEMICONDUCTOR LASER

MIKEL, B., ČÍP, O.

Originální název

ABSOLUTE DISTANCE MEASUREMENTS WITH TUNABLE SEMICONDUCTOR LASER

Anglický název

ABSOLUTE DISTANCE MEASUREMENTS WITH TUNABLE SEMICONDUCTOR LASER

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

High-precise industrial distance measurements by means of laser interferometer with a single-frequency He-Ne laser are used very often. Main disadvantage of that method is necessity to travel with a measuring retroreflector of Michelson interferometer across the measurement distance. On the other hand a narrow linewidth, frequency stability and beam shape of He-Ne laser lead to an ultra-high resolution below 1 nm [1]. In contrast to this conventional interferometry, the other one based on a tunable laser source allows to detect distances in a static way without moving the reflector. In this case, the moving process is replaced by tuning of the wavelength of laser source at front of Michelson interferometer. Then the synthetic wavelength, which is limited by a continuous tunable range of the laser, determines the scale resolution of the absolute distance interferometer.

Anglický abstrakt

High-precise industrial distance measurements by means of laser interferometer with a single-frequency He-Ne laser are used very often. Main disadvantage of that method is necessity to travel with a measuring retroreflector of Michelson interferometer across the measurement distance. On the other hand a narrow linewidth, frequency stability and beam shape of He-Ne laser lead to an ultra-high resolution below 1 nm [1]. In contrast to this conventional interferometry, the other one based on a tunable laser source allows to detect distances in a static way without moving the reflector. In this case, the moving process is replaced by tuning of the wavelength of laser source at front of Michelson interferometer. Then the synthetic wavelength, which is limited by a continuous tunable range of the laser, determines the scale resolution of the absolute distance interferometer.

Klíčová slova

Laser interferometry, semiconductor laser, temperature stability.

Klíčová slova v angličtině

Laser interferometry, semiconductor laser, temperature stability.

Autoři

MIKEL, B., ČÍP, O.

Vydáno

10.10.2003

Nakladatel

Formatex

Místo

Španělsko

Kniha

1st International Meeting on Applied Physics

Strany od

979

Strany počet

1

BibTex

@inproceedings{BUT9275,
  author="Břetislav {Mikel} and Ondřej {Číp}",
  title="ABSOLUTE DISTANCE MEASUREMENTS WITH TUNABLE SEMICONDUCTOR LASER",
  booktitle="1st International Meeting on Applied Physics",
  year="2003",
  pages="1",
  publisher="Formatex",
  address="Španělsko"
}