Detail publikace

Optical and Thermal Activities of Micro-Sized Local Defects on the Edges of Silicon Solar Cells

ŠICNER, J.

Originální název

Optical and Thermal Activities of Micro-Sized Local Defects on the Edges of Silicon Solar Cells

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The article deals with the diagnostics application to local defects on the edge in silicon solar cells by monitoring their optical and thermal activities during electrical excitation. During the measurement is solar cell connected to a voltage source in the reverse direction. Radiation generated from reverse-biased pn junction defects is used to study local properties. It proves to be useful to measure surface radiation and to make light spots (defects) localization. By the same way is possible to measure the radiation intensity and optical spectrum.

Klíčová slova

Solar cell, local defect, nondestructive testing

Autoři

ŠICNER, J.

Rok RIV

2012

Vydáno

26. 4. 2012

Nakladatel

LITERA Brno

Místo

Brno

ISBN

978-80-214-4462-1

Kniha

proceedings of the 16th conference student eeict 2012 vol. 3

Číslo edice

3

Strany od

288

Strany do

292

Strany počet

5

BibTex

@inproceedings{BUT92570,
  author="Jiří {Šicner}",
  title="Optical and Thermal Activities of Micro-Sized Local Defects on the Edges of Silicon Solar Cells",
  booktitle="proceedings of the 16th conference student eeict 2012 vol. 3",
  year="2012",
  number="3",
  pages="288--292",
  publisher="LITERA Brno",
  address="Brno",
  isbn="978-80-214-4462-1"
}