Detail publikace

Noise and Non-Linearity Testing of Electronic Components

ŠIKULA, J.

Originální název

Noise and Non-Linearity Testing of Electronic Components

Anglický název

Noise and Non-Linearity Testing of Electronic Components

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

čeština

Originální abstrakt

Nowadays the microelectronics device manufacturers are faced with high requirements on quality and reliability of their products, the required failure intensity ranging form 1 fit (bipolar npn or pnp devices) over 10 fits (bipolar TTL) to 100 fits (bipolar operational amplifiers). Traditional methods to ascertain reliability consisting in ageing tests are in this case no more applicable. This is due to of enormous requirements on the ageing periond and number of specimens. Therefore a search for new non-destructive methods to characterise quality and predict reliability of vast ensembles became a trend in the last two decades. One of the most promising methods to provide a non-destructive active and passive components, i.e., bipolar and MOS structures, on one hand, and resistors and capacitors on the other. As a main diagnostic tool it is proposed to use low frequency noise and third harmonic index and theirs statistical distributions.

Klíčová slova v angličtině

noise, non-linearity testing, electronic components

Autoři

ŠIKULA, J.

Rok RIV

2003

Vydáno

1. 1. 2003

Nakladatel

CNRL

Místo

Brno

ISBN

80-238-9094-8

Kniha

Noise and Non-linearity Testing of Modern Electronic Components

Strany od

18

Strany do

27

Strany počet

10

BibTex

@inproceedings{BUT9251,
  author="Josef {Šikula}",
  title="Noise and Non-Linearity Testing of Electronic Components",
  booktitle="Noise and Non-linearity Testing of Modern Electronic Components",
  year="2003",
  pages="10",
  publisher="CNRL",
  address="Brno",
  isbn="80-238-9094-8"
}