Detail publikačního výsledku

Determining Effective Testability Degree of Analog Circuits

KINCL, Z.; KOLKA, Z.

Originální název

Determining Effective Testability Degree of Analog Circuits

Anglický název

Determining Effective Testability Degree of Analog Circuits

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

The paper deals with the parametric fault diagnosis of linear analog circuits in the frequency domain. The testability degree, which is referred to as the total number of testable network parameters, is theoretically independent of nominal values of network parameters, the set of test frequencies and the fault detection method. However, practical results show that the effective testability determined numerically using the Singular Value Decomposition of sensitivity matrix (Jacobian) depends on the normalization of network parameters, frequency response measurement methods and a selected set of test frequencies. The differences between the theoretical and the practical testability degree will be discussed on a practical example of RC phase shifter filter.

Anglický abstrakt

The paper deals with the parametric fault diagnosis of linear analog circuits in the frequency domain. The testability degree, which is referred to as the total number of testable network parameters, is theoretically independent of nominal values of network parameters, the set of test frequencies and the fault detection method. However, practical results show that the effective testability determined numerically using the Singular Value Decomposition of sensitivity matrix (Jacobian) depends on the normalization of network parameters, frequency response measurement methods and a selected set of test frequencies. The differences between the theoretical and the practical testability degree will be discussed on a practical example of RC phase shifter filter.

Klíčová slova

Parametric fault diagnosis, testability degree, test point selection, analog circuit testing.

Klíčová slova v angličtině

Parametric fault diagnosis, testability degree, test point selection, analog circuit testing.

Autoři

KINCL, Z.; KOLKA, Z.

Rok RIV

2013

Vydáno

24.05.2012

Nakladatel

Technical University of Lodz

Místo

Warsaw

ISBN

978-1-4577-2092-5

Kniha

Proceedings of the 19th International Conference Mixed Design of Integrated Circuits and Systems

Strany od

427

Strany do

430

Strany počet

4

BibTex

@inproceedings{BUT92191,
  author="Zdeněk {Kincl} and Zdeněk {Kolka}",
  title="Determining Effective Testability Degree of Analog Circuits",
  booktitle="Proceedings of the 19th International Conference Mixed Design of Integrated Circuits and Systems",
  year="2012",
  pages="427--430",
  publisher="Technical University of Lodz",
  address="Warsaw",
  isbn="978-1-4577-2092-5"
}